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Robert Aitken

Robert Aitken

Research.com Recognitions

  • 1918 - Member of the National Academy of Sciences

Overview

Robert Aitken is affiliated with Arm Ltd. in the United Kingdom. Their academic profile reflects a focus on scientific research without specific details on recent publications or collaboration patterns currently available.

Aitken's recognized contribution to their field is marked by the award of membership in the National Academy of Sciences, received in 1918.

Although concrete information regarding their fields of study, subfields, and main research topics is not provided, the association with Arm Ltd. suggests involvement in technology and engineering sectors linked to this organization.

With no listed recent papers, co-authors, publication venues, or book publications, the documented record primarily highlights the acknowledgment received through their award, which signifies professional recognition within the scientific community.

Best Publications

  • Low Power Methodology Manual: For System-on-Chip Design

    Michael Keating;David Flynn;Rob Aitken;Alan Gibbons

  • Current ratios: a self-scaling technique for production I/sub DDQ/ testing

    P. Maxwell;P. O'Neill;R. Aitken;R. Dudley

  • Biased voting: A method for simulating CMOS bridging faults in the presence of variable gate logic thresholds

    P.C. Maxwell;R.C. Aitken

  • Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS

    V. Chandra;R. Aitken

  • IDDQ and AC scan: the war against unmodelled defects

    P.C. Maxwell;R.C. Aitken;K.R. Kollitz;A.C. Brown

  • So what is an optimal test mix? A discussion of the SEMATECH methods experiment

    P. Nigh;W. Needham;K. Butler;P. Maxwell

  • Nanometer technology effects on fault models for IC testing

    R.C. Aitken

  • Modular embedded test system for use in integrated circuits

    Fidel Muradali;Robert C. Aitken

  • Fault Location with Current Monitoring

    R.C. Aitken

  • A comparison of defect models for fault location with Iddq measurements

    R.C. Aitken

  • Method, system and device for complementary non-volatile memory device operation

    Azeez Bhavnagarwala;Robert Campbell Aitken;Lucian Shifren

  • Apparatuses and methods for generating programmable voltage reference

    Sandhu Bal S;Lattimore George Mcneil;Aitken Robert Campbell

  • I DDQ testing as a component of a test suite: the need for several fault coverage metrics

    Peter C. Maxwell;Robert C. Aitken

  • A diagnosis method using pseudo-random vectors without intermediate signatures

    R.C. Aitken;V.K. Agarwal

  • Device and technology implications of the Internet of Things

    Robert Aitken;Vikas Chandra;James Myers;Bal Sandhu

  • Workload dependent NBTI and PBTI analysis for a sub-45nm commercial microprocessor

    E. Mintarno;V. Chandra;D. Pietromonaco;R. Aitken

  • Method, system and device for non-volatile memory device operation

    Robert Campbell Aitken;Lucian Shifren

  • On the efficacy of write-assist techniques in low voltage nanoscale SRAMs

    Vikas Chandra;Cezary Pietrzyk;Robert Aitken

  • Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic

    Peter C. Maxwell;Robert C. Aitken

  • TIMBER: time borrowing and error relaying for online timing error resilience

    Mihir Choudhury;Vikas Chandra;Kartik Mohanram;Robert Aitken

Frequent Co-Authors

Asen Asenov
Asen Asenov University of Glasgow
Benton H. Calhoun
Benton H. Calhoun University of Virginia
Mehdi B. Tahoori
Mehdi B. Tahoori Karlsruhe Institute of Technology
Kartik Mohanram
Kartik Mohanram University of Pittsburgh
Weidong Zhang
Weidong Zhang Shanghai Jiao Tong University
Puneet Gupta
Puneet Gupta University of California, Los Angeles
Andre Ivanov
Andre Ivanov University of British Columbia
Dennis Sylvester
Dennis Sylvester University of Michigan–Ann Arbor
David Blaauw
David Blaauw University of Michigan–Ann Arbor

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