World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
40
Citations
6447
World Ranking
4508
National Ranking
1595

Michael Wirthlin publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Michael Wirthlin sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 178 publications — 22nd percentile

22% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Michael Wirthlin D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Michael Wirthlin sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 40 D-Index — 36th percentile

36% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Michael Wirthlin is affiliated with Brigham Young University in the United States, with a research focus primarily in the fields of Engineering and Computer Science. Their work spans several subfields, including Electrical and Electronic Engineering, Hardware and Architecture, Safety, Risk, Reliability and Quality, Artificial Intelligence, and Computer Vision and Pattern Recognition.

The central themes in Michael Wirthlin's research revolve around Radiation Effects in Electronics, VLSI and Analog Circuit Testing, and Integrated Circuits and Semiconductor Failure Analysis. Additional topics include Reliability and Maintenance Optimization, Low-power high-performance VLSI design, Adversarial Robustness in Machine Learning, and Physical Unclonable Functions (PUFs) and Hardware Security.

Michael Wirthlin has contributed extensively to publications in well-known scientific venues. The most frequent publication venues include:

  • IEEE Transactions on Nuclear Science
  • ACM Transactions on Reconfigurable Technology and Systems
  • IEEE Transactions on Circuits and Systems I Regular Papers
  • Proceedings of the Python in Science Conferences

Their recent research output consists of several papers addressing topics such as the reliability of convolutional neural networks on FPGAs and radiation testing of soft processors. Selected recent papers include:

  • "Understanding the Impact of Quantization, Accuracy, and Radiation on the Reliability of Convolutional Neural Networks on FPGAs" (2020, IEEE Transactions on Nuclear Science)
  • "How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs" (2021, IEEE Transactions on Nuclear Science)
  • "Neutron Radiation Testing of a TMR VexRiscv Soft Processor on SRAM-Based FPGAs" (2021, IEEE Transactions on Nuclear Science)
  • "Low Latency SEU Detection in FPGA CRAM With In-Memory ECC Checking" (2023, IEEE Transactions on Circuits and Systems I Regular Papers)
  • "Partial TMR for Improving the Soft Error Reliability of SRAM-Based FPGA Designs" (2021, IEEE Transactions on Nuclear Science)

Michael Wirthlin has collaborated frequently with several coauthors in their research, including:

  • Andrew Elbert Wilson
  • Corbin Thurlow
  • Andrew M. Keller
  • Nathan Baker
  • F. Libano

Best Publications

  • A dynamic instruction set computer

    M.J. Wirthlin;B.L. Hutchings

  • ACTOR-ORIENTED DESIGN OF EMBEDDED HARDWARE AND SOFTWARE SYSTEMS

    Edward A. Lee;Stephen Neuendorffer;Michael J. Wirthlin

  • Improving FPGA Design Robustness with Partial TMR

    B. Pratt;M. Caffrey;P. Graham;K. Morgan

  • A Comparison of TMR With Alternative Fault-Tolerant Design Techniques for FPGAs

    K.S. Morgan;D.L. McMurtrey;B.H. Pratt;M.J. Wirthlin

  • The Nano Processor: a low resource reconfigurable processor

    M.J. Wirthlin;B.L. Hutchings;K.L. Gilson

  • FPGA partial reconfiguration via configuration scrubbing

    Jonathan Heiner;Benjamin Sellers;Michael Wirthlin;Jeff Kalb

  • High-Reliability FPGA-Based Systems: Space, High-Energy Physics, and Beyond

    Michael Wirthlin

  • SRAM FPGA Reliability Analysis for Harsh Radiation Environments

    P.S. Ostler;M.P. Caffrey;D.S. Gibelyou;P.S. Graham

  • Implementation Approaches for Reconfigurable Logic Applications

    Brad Hutchings;Michael J. Wirthlin

  • The reliability of FPGA circuit designs in the presence of radiation induced configuration upsets

    M. Wirthlin;E. Johnson;N. Rollins;M. Caffrey

  • Improving functional density using run-time circuit reconfiguration [FPGAs]

    M.J. Wirthlin;B.L. Hutchings

  • DISC: the dynamic instruction set computer

    Michael J. Wirthlin;Brad L. Hutchings

  • SEU-induced persistent error propagation in FPGAs

    K. Morgan;M. Caffrey;P. Graham;E. Johnson

  • Fault Tolerant ICAP Controller for High-Reliable Internal Scrubbing

    J. Heiner;N. Collins;M. Wirthlin

  • Evaluating TMR Techniques in the Presence of Single Event Upsets

    Paul S. Graham;Nathaniel Rollins;Michael J. Wirthlin;Michael P. Caffrey

  • Accelerator validation of an FPGA SEU simulator

    E. Johnson;M. Caffrey;P. Graham;N. Rollins

  • Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

    Heather Quinn;William H. Robinson;Paolo Rech;Miguel Aguirre

  • Dynamically-configurable digital processor using method for relocating logic array modules

    Michael J. Wirthlin;Brad L. Hutchings

  • Selective Hardening for Neural Networks in FPGAs

    F. Libano;B. Wilson;J. Anderson;M. J. Wirthlin

  • Sequencing Run-Time Reconfigured Hardware with Software

    Michael J. Wirthlin;Brad L. Hutchings

  • Dynamic reconfiguration for management of radiation-induced faults in FPGAs

    Maya Gokhale;Paul Graham;Michael Wirthlin;D. Eric Johnson

  • Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation

    David S. Lee;Gregory R. Allen;Gary Swift;Matthew Cannon

  • FPGA Pipeline Synthesis Design Exploration Using Module Selection and Resource Sharing

    W. Sun;M.J. Wirthlin;S. Neuendorffer

  • Fine-Grain SEU Mitigation for FPGAs Using Partial TMR

    B. Pratt;M. Caffrey;J.F. Carroll;P. Graham

Frequent Co-Authors

Brad Hutchings
Brad Hutchings Brigham Young University
Lloyd W. Massengill
Lloyd W. Massengill Vanderbilt University
David Kaeli
David Kaeli Northeastern University
Robert A. Weller
Robert A. Weller Woods Hole Oceanographic Institution
Matteo Sonza Reorda
Matteo Sonza Reorda Polytechnic University of Turin
Robert A. Reed
Robert A. Reed Vanderbilt University
Bharat L. Bhuva
Bharat L. Bhuva Vanderbilt University
Paul E. Dodd
Paul E. Dodd Sandia National Laboratories
Marty R. Shaneyfelt
Marty R. Shaneyfelt Sandia National Laboratories
Maya Gokhale
Maya Gokhale Lawrence Livermore National Laboratory

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