Fernanda Lima Kastensmidt

Best Publications

• On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs

  F.L. Kastensmidt;L. Sterpone;L. Carro;M.S. Reorda

  315
  Citations

• Physical design methodologies for performance predictability and manufacturability

  Ricardo Reis;Fernanda Lima Kastensmidt;José Luís Güntzel

  213
  Citations

• Designing fault-tolerant techniques for SRAM-based FPGAs

  F.G. de Lima Kastensmidt;G. Neuberger;R.F. Hentschke;L. Carro

  174
  Citations

• Using Bulk Built-in Current Sensors to Detect Soft Errors

  E.H. Neto;I. Ribeiro;M. Vieira;G. Wirth

  147
  Citations

• Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

  Heather Quinn;William H. Robinson;Paolo Rech;Miguel Aguirre

  116
  Citations

• A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip

  E. Cota;F.L. Kastensmidt;M. Cassel;M. Herve

  102
  Citations

• Dependable Network-on-Chip Router Able to Simultaneously Tolerate Soft Errors and Crosstalk

  Arthur Frantz;Fernanda Kastensmidt;Luigi Carro;Erika Cota

  88
  Citations

• Fault-Tolerance Techniques for SRAM-Based FPGAs (Frontiers in Electronic Testing)

  Fernanda Lima Kastensmidt;Luigi Carro;Ricardo Reis

  72
  Citations

• Synchronizing triple modular redundant designs in dynamic partial reconfiguration applications

  Conrado Pilotto;José Rodrigo Azambuja;Fernanda Lima Kastensmidt

  66
  Citations

• Designing and testing fault-tolerant techniques for SRAM-based FPGAs

  Fernanda Lima Kastensmidt;Gustavo Neuberger;Luigi Carro;Ricardo Reis

  64
  Citations

• Crosstalk- and SEU-Aware Networks on Chips

  A.P. Frantz;M. Cassel;F.L. Kastensmidt;E. Cota

  62
  Citations

• An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs

  L. Sterpone;N. Battezzati;F. L. Kastensmidt;R. Chipana

  60
  Citations

• Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits

  S. Pagliarini;F. Kastensmidt;L. Entrena;A. Lindoso

  56
  Citations

• Detecting SEEs in Microprocessors Through a Non-Intrusive Hybrid Technique

  J R Azambuja;A Lapolli;L Rosa;F L Kastensmidt

  49
  Citations

• Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC

  Lucas Antunes Tambara;Fernanda Lima Kastensmidt;Nilberto H. Medina;Nemitala Added

  46
  Citations

• Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors

  Adria Barros de Oliveira;Gennaro Severino Rodrigues;Fernanda Lima Kastensmidt;Nemitala Added

  46
  Citations

• A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability

  Felipe Rosa;Fernanda Kastensmidt;Ricardo Reis;Luciano Ost

  41
  Citations

• Analyzing the Impact of Radiation-Induced Failures in Programmable SoCs

  Lucas Antunes Tambara;Paolo Rech;Eduardo Chielle;Jorge Tonfat

  40
  Citations

• Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects

  Adria B. de Oliveira;Lucas A. Tambara;Fabio Benevenuti;Luis A. C. Benites

  40
  Citations

• Exploring the use of approximate TMR to mask transient faults in logic with low area overhead

  Iuri A. C. Gomes;Mayler G. A. Martins;André Inácio Reis;Fernanda Lima Kastensmidt

  38
  Citations