His scientific interests lie mostly in Electronic engineering, Electronic circuit, CMOS, Sequential logic and Embedded system. His Electronic engineering research includes themes of Voltage, Fault detection and isolation, Fault model and Integrated circuit. He combines subjects such as Transfer function, Block, Authentication, Circuit design and Reliability with his study of Electronic circuit.
His CMOS study combines topics in areas such as Design for testing and Antenna. The Sequential logic study combines topics in areas such as Fault free, Real-time computing and Logic optimization. His research in Embedded system focuses on subjects like Chip, which are connected to Semiconductor device fabrication, Sensitivity and Photolithography.
His primary areas of investigation include Electronic engineering, Embedded system, Electronic circuit, CMOS and Automatic test pattern generation. Sandip Kundu does research in Electronic engineering, focusing on Logic gate specifically. While the research belongs to areas of Embedded system, Sandip Kundu spends his time largely on the problem of Multi-core processor, intersecting his research to questions surrounding Electrical efficiency.
His research links Very-large-scale integration with Electronic circuit. CMOS is the subject of his research, which falls under Electrical engineering. His Automatic test pattern generation research focuses on Algorithm and how it connects with Stuck-at fault.
Computer security, Embedded system, Physical unclonable function, Artificial neural network and Reliability engineering are his primary areas of study. His Embedded system research is multidisciplinary, relying on both Trojan, Software bug, Frequency scaling, Logic gate and Multi-core processor. His study in Physical unclonable function is interdisciplinary in nature, drawing from both Software and Hardware security module.
His Reliability engineering research integrates issues from Negative-bias temperature instability, Electromigration, Word error rate, Residual and Integrated circuit. Sandip Kundu has included themes like Burn-in, Electronic engineering, Fuzzy logic and Key in his Word error rate study. His work carried out in the field of Electronic engineering brings together such families of science as Transient noise, Overhead, Random access, Probabilistic logic and Code coverage.
Sandip Kundu focuses on Computer security, Physical unclonable function, Noise, Static random-access memory and Blockchain. In general Computer security study, his work on Hardware security module and Threat model often relates to the realm of Covert channel, thereby connecting several areas of interest. His Hardware security module research incorporates elements of Physical design, Very-large-scale integration, Function and Obfuscation.
Sandip Kundu focuses mostly in the field of Physical unclonable function, narrowing it down to matters related to Software and, in some cases, Embedded system and Smart card. His Noise research is multidisciplinary, incorporating elements of Reliability, Electronic engineering and Word error rate. Sandip Kundu has researched Electronic engineering in several fields, including Key and Fuzzy logic.
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The potential of cropping systems and soil amendments for carbon sequestration in soils under long‐term experiments in subtropical India
B. Mandal;B. Majumder;P. K. Bandyopadhyay;G. C. Hazra.
Global Change Biology (2007)
Statistical Yield Modeling for Sub-wavelength Lithography
A. Sreedhar;S. Kundu.
international test conference (2008)
Fast statistical timing analysis by probabilistic event propagation
Jing-Jia Liou;Kwang-Ting Cheng;Sandip Kundu;Angela Krstic.
design automation conference (2001)
Potential of double-cropped rice ecology to conserve organic carbon under subtropical climate
Biswapati Mandal;Bidisha Majumder;T. K. Adhya;P. K. Bandyopadhyay.
Global Change Biology (2008)
Incremental synthesis
Daniel Brand;Anthony Drumm;Sandip Kundu;Prakash Narain.
international conference on computer aided design (1994)
On diagnosis of faults in a scan-chain
S. Kundu.
vlsi test symposium (1993)
On-chip compression of output responses with unknown values using lfsr reseeding
M. Naruse;I. Porneranz;S.M. Reddy;S. Kundu.
international test conference (2003)
Testing and Reliable Design of CMOS Circuits
Niraj K. Jha;Sandip Kundu.
(2011)
On output response compression in the presence of unknown output values
Irith Pomeranz;Sandip Kundu;Sudhakar M. Reddy.
design automation conference (2002)
On the design of robust testable CMOS combinational logic circuits
S. Kundu;S.M. Reddy.
ieee international symposium on fault tolerant computing (1988)
Profile was last updated on December 6th, 2021.
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