World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
35
Citations
5395
World Ranking
5542
National Ranking
1903

Sandip Kundu publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Sandip Kundu sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 293 publications — 56th percentile

56% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Sandip Kundu D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Sandip Kundu sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 35 D-Index — 21st percentile

21% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Sandip Kundu is affiliated with the University of Massachusetts Amherst in the United States. Their research spans several fields within computer science and engineering, with a strong emphasis on artificial intelligence, electrical and electronic engineering, hardware and architecture, computer networks and communications, and information systems.

Their recent publications cover a range of topics related to hardware security, machine learning, and integrated circuits. Notable papers include:

  • Preventing DNN Model IP Theft via Hardware Obfuscation, 2021, IEEE Journal on Emerging and Selected Topics in Circuits and Systems
  • Weightless Neural Networks as Memory Segmented Bloom Filters, 2020, Neurocomputing
  • Remote Device Management via Smart Contracts, 2021, IEEE Transactions on Consumer Electronics
  • NN-Lock: A Lightweight Authorization to Prevent IP Threats of Deep Learning Models, 2022, ACM Journal on Emerging Technologies in Computing Systems
  • Realizing Robust, Lightweight Strong PUFs for Securing Smart Grids, 2021, IEEE Transactions on Consumer Electronics

The main topics of their work reflect a concentration on areas such as adversarial robustness in machine learning, physical unclonable functions (PUFs) and hardware security, integrated circuits and semiconductor failure analysis, advanced memory and neural computing, cryptographic implementations and security, radiation effects in electronics, and security and verification in computing.

  • Adversarial Robustness in Machine Learning
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Integrated Circuits and Semiconductor Failure Analysis
  • Advanced Memory and Neural Computing
  • Cryptographic Implementations and Security
  • Radiation Effects in Electronics
  • Security and Verification in Computing

Kundu has frequently published in venues such as arXiv (Cornell University), IEEE Journal on Emerging and Selected Topics in Circuits and Systems, IEEE Transactions on Consumer Electronics, ACM Transactions on Architecture and Code Optimization, and Neurocomputing.

  • arXiv (Cornell University)
  • IEEE Journal on Emerging and Selected Topics in Circuits and Systems
  • IEEE Transactions on Consumer Electronics
  • ACM Transactions on Architecture and Code Optimization
  • Neurocomputing

Frequent collaborators include Chandra Sekhar Mummidi, Jonah O'Brien Weiss, Victor C. Ferreira, Felipe M. G. França, and Brunno F. Goldstein. These coauthors have contributed with Kundu on multiple publications, indicating ongoing research partnerships in these specialized areas.

Best Publications

  • A case study of ir-drop in structured at-speed testing

    Unknown

  • Statistical Yield Modeling for Sub-wavelength Lithography

    A. Sreedhar;S. Kundu

  • Fast statistical timing analysis by probabilistic event propagation

    Jing-Jia Liou;Kwang-Ting Cheng;Sandip Kundu;Angela Krstic

  • Incremental synthesis

    Daniel Brand;Anthony Drumm;Sandip Kundu;Prakash Narain

  • On diagnosis of faults in a scan-chain

    S. Kundu

  • On-chip compression of output responses with unknown values using lfsr reseeding

    M. Naruse;I. Porneranz;S.M. Reddy;S. Kundu

  • Testing and Reliable Design of CMOS Circuits

    Niraj K. Jha;Sandip Kundu

  • Machine learning resistant strong PUF: Possible or a pipe dream?

    Arunkumar Vijayakumar;Vinay C. Patil;Charles B. Prado;Sandip Kundu

  • On the design of robust testable CMOS combinational logic circuits

    S. Kundu;S.M. Reddy

  • Power Droop Testing

    I. Polian;A. Czutro;S. Kundu;B. Becker

  • On output response compression in the presence of unknown output values

    Irith Pomeranz;Sandip Kundu;Sudhakar M. Reddy

  • A modeling approach for addressing power supply switching noise related failures of integrated circuits

    Chandra Tirumurti;Sandip Kundu;Susmita Sur-Kolay;Yi-Shing Chang

  • A Study of Tapered 3-D TSVs for Power and Thermal Integrity

    A. Todri;S. Kundu;P. Girard;A. Bosio

  • A Study on the Use of Performance Counters to Estimate Power in Microprocessors

    Rance Rodrigues;Arunachalam Annamalai;Israel Koren;Sandip Kundu

  • Diagnosing scan chain faults

    S. Kundu

  • Scan design for double-edge-triggered flip-flops

    Sandip Kundu

  • Physical Design Obfuscation of Hardware: A Comprehensive Investigation of Device and Logic-Level Techniques

    Arunkumar Vijayakumar;Vinay C. Patil;Daniel E. Holcomb;Christof Paar

  • A novel modeling attack resistant PUF design based on non-linear voltage transfer characteristics

    Arunkumar Vijayakumar;Sandip Kundu

  • On modeling crosstalk faults

    S. Kundu;S.T. Zachariah;Yi-Shing Chang;C. Tirumurti

  • A small test generator for large designs

    S. Kundu;L.M. Huisman;I. Nair;V. Ivenaar

  • A Novel Modeling Attack Resistant PUF Design based on Non-linear Voltage Transfer Characteristics

    Unknown

  • On the design of robust multiple fault testable CMOS combinational logic circuits

    S. Kundu;S.M. Reddy;N.K. Jha

  • Trends in manufacturing test methods and their implications

    S. Kundu;T.M. Mak;R. Galivanche

  • Testing integrated circuits using high bandwidth wireless technology

    Rajeshwar Galivanche;Tak Mak;Sandip Kundu

  • Enabling IC Traceability via Blockchain Pegged to Embedded PUF

    Nazmul Islam;Sandip Kundu

  • Performance sensitivity analysis using statistical method and its applications to delay

    Jing-Jia Liou;Angela Krstic;Kwang-Ting Cheng;Deb Aditya Mukherjee

Frequent Co-Authors

Israel Koren
Israel Koren University of Massachusetts Amherst
Sudhakar M. Reddy
Sudhakar M. Reddy University of Iowa
Bernd Becker
Bernd Becker University of Freiburg
Ilia Polian
Ilia Polian University of Stuttgart
Irith Pomeranz
Irith Pomeranz Purdue University West Lafayette
Niraj K. Jha
Niraj K. Jha Princeton University
Raghavan Kumar
Raghavan Kumar Intel (United States)
Ranjan Bhattacharyya
Ranjan Bhattacharyya Indian Agricultural Research Institute
Hari Shankar Gupta
Hari Shankar Gupta Indian Agricultural Research Institute
Anirudh Devgan
Anirudh Devgan Cadence Design Systems

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