D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Materials Science D-index 73 Citations 17,132 480 World Ranking 2153 National Ranking 694

Research.com Recognitions

Awards & Achievements

2007 - Semiconductor Industry Association University Researcher Award

Best Publications

Electromigration in metals

Paul S Ho;Thomas Kwok.
Reports on Progress in Physics (1989)

932 Citations

Low Dielectric Constant Materials for ULSI Interconnects

Michael Morgen;E. Todd Ryan;Jie-Hua Zhao;Chuan Hu.
Annual Review of Materials Science (2000)

505 Citations

Electromigration reliability issues in dual-damascene Cu interconnections

E.T. Ogawa;Ki-Don Lee;V.A. Blaschke;P.S. Ho.
IEEE Transactions on Reliability (2002)

344 Citations

Low-Dielectric-Constant Materials for ULSI Interlayer-Dielectric Applications

Wei William Lee;Paul S. Ho.
Mrs Bulletin (1997)

336 Citations

Diffusion Phenomena in Thin Films and Microelectronic Materials

Davendra Gupta;Paul S. Ho.
(1989)

330 Citations

Plasma processing of low-k dielectrics

Mikhail R. Baklanov;Jean-Francois de Marneffe;Denis Shamiryan;Adam M. Urbanowicz.
Journal of Applied Physics (2013)

315 Citations

Chemical bonding and reaction at metal/polymer interfaces

Paul S Ho;P. O. Hahn;J. W. Bartha;G. W. Rubloff.
Journal of Vacuum Science and Technology (1985)

293 Citations

Auger study of preferred sputtering on binary alloy surfaces

P.S Ho;J.E Lewis;H.S Wildman;J.K Howard.
Surface Science (1976)

266 Citations

Impact of Near-Surface Thermal Stresses on Interfacial Reliability of Through-Silicon Vias for 3-D Interconnects

Suk-Kyu Ryu;Kuan-Hsun Lu;Xuefeng Zhang;Jang-Hi Im.
IEEE Transactions on Device and Materials Reliability (2011)

261 Citations

Thermo-mechanical reliability of 3-D ICs containing through silicon vias

Kuan H. Lu;Xuefeng Zhang;Suk-Kyu Ryu;Jay Im.
electronic components and technology conference (2009)

247 Citations

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Best Scientists Citing Paul S. Ho

King-Ning Tu

King-Ning Tu

University of California, Los Angeles

Publications: 89

Mikhail R. Baklanov

Mikhail R. Baklanov

North China University of Technology

Publications: 67

Eduard Arzt

Eduard Arzt

Saarland University

Publications: 40

Ehrenfried Zschech

Ehrenfried Zschech

Fraunhofer Society

Publications: 36

Chih Chen

Chih Chen

National Yang Ming Chiao Tung University

Publications: 35

Zhigang Suo

Zhigang Suo

Harvard University

Publications: 33

Carl V. Thompson

Carl V. Thompson

MIT

Publications: 31

Guoqi Zhang

Guoqi Zhang

Delft University of Technology

Publications: 31

Toh-Ming Lu

Toh-Ming Lu

Rensselaer Polytechnic Institute

Publications: 27

Nobumichi Tamura

Nobumichi Tamura

Lawrence Berkeley National Laboratory

Publications: 26

Subodh G. Mhaisalkar

Subodh G. Mhaisalkar

Nanyang Technological University

Publications: 25

Sung Kyu Lim

Sung Kyu Lim

Georgia Institute of Technology

Publications: 24

Eric Beyne

Eric Beyne

Imec

Publications: 24

Siegfried Selberherr

Siegfried Selberherr

TU Wien

Publications: 24

Franz Faupel

Franz Faupel

Kiel University

Publications: 23

Siegfried Hofmann

Siegfried Hofmann

Max Planck Society

Publications: 22

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Zhengqi Li

Zhengqi Li

Harbin Institute of Technology

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Boston Biomedical Research Institute

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Yoshihisa Takaishi

University of Tokushima

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