World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
39
Citations
5960
World Ranking
4719
National Ranking
84

Research.com Recognitions

  • 2020 - Fellow, National Academy of Inventors
  • 2018 - IEEE Fellow For contributions to 3D integrated circuit and packaging technologies

Overview

Kuan-Neng Chen is affiliated with National Yang Ming Chiao Tung University in Taiwan. Their research focuses primarily within the engineering discipline, with a strong specialization in electrical and electronic engineering.

The subfields of study covered by their work include:

  • Electrical and Electronic Engineering
  • Automotive Engineering
  • Electronic, Optical and Magnetic Materials
  • Biomedical Engineering
  • Polymers and Plastics

The main research topics include:

  • 3D IC and TSV technologies
  • Electronic Packaging and Soldering Technologies
  • Additive Manufacturing and 3D Printing Technologies
  • Semiconductor materials and devices
  • Copper Interconnects and Reliability
  • Thin-Film Transistor Technologies
  • Integrated Circuits and Semiconductor Failure Analysis

Chen has published extensively in several venues related to electronics and device packaging, including:

  • IEEE Electron Device Letters
  • IEEE Transactions on Components Packaging and Manufacturing Technology
  • Applied Surface Science
  • IEEE Journal of the Electron Devices Society
  • IEEE Transactions on Electron Devices

Significant recent papers authored or co-authored by Chen include:

  • Development of low temperature Cu Cu bonding and hybrid bonding for three-dimensional integrated circuits (3D IC), 2021, Microelectronics Reliability
  • Investigation of bonding mechanism for low-temperature Cu Cu bonding with passivation layer, 2022, Applied Surface Science
  • Electrical and Reliability Investigation of Cu-to-Cu Bonding With Silver Passivation Layer in 3-D Integration, 2020, IEEE Transactions on Components Packaging and Manufacturing Technology
  • Demonstration of Low-Temperature Fine-Pitch Cu/SiO₂ Hybrid Bonding by Au Passivation, 2021, IEEE Journal of the Electron Devices Society
  • Investigation of Low-Temperature Cu-Cu Direct Bonding With Pt Passivation Layer in 3-D Integration, 2021, IEEE Transactions on Components Packaging and Manufacturing Technology

Frequent co-authors collaborating with Chen have included:

  • Hanwen Hu
  • Zhong-Jie Hong
  • Po-Tsang Huang
  • Chih-Chao Yang
  • Yuan-Chiu Huang

Chen has received recognition within the professional community, having been awarded Fellow status by the National Academy of Inventors in 2020 and IEEE Fellow in 2018 for contributions to 3D integrated circuit and packaging technologies.

Best Publications

  • Wafer-level bonding/stacking technology for 3D integration

    Cheng Ta Ko;Kuan-Neng Chen

  • Wafer-level 3D integration technology

    S. J. Koester;A. M. Young;R. R. Yu;S. Purushothaman

  • Three-Dimensional Integrated Circuit (3D IC) Key Technology: Through-Silicon Via (TSV)

    Wen Wei Shen;Kuan-Neng Chen

  • Technology, performance, and computer-aided design of three-dimensional integrated circuits

    Shamik Das;Andy Fan;Kuan-Neng Chen;Chuan Seng Tan

  • Morphology and Bond Strength of Copper Wafer Bonding

    Kuan-Neng Chen;C. S. Tan;A. Fan;R. Reif

  • Low temperature bonding technology for 3D integration

    Cheng Ta Ko;Kuan-Neng Chen

  • Fabrication technologies for three-dimensional integrated circuits

    R. Reif;A. Fan;Kuan-Neng Chen;S. Das

  • Evidence for segregation of Te in Ge2Sb2Te5 films: Effect on the “phase-change” stress

    L. Krusin-Elbaum;C. Cabral;Kuan-Neng Chen;M. Copel

  • Wafer-level Cu-Cu bonding technology

    Ya Sheng Tang;Yao Jen Chang;Kuan-Neng Chen

  • A 300-mm wafer-level three-dimensional integration scheme using tungsten through-silicon via and hybrid Cu-adhesive bonding

    F. Liu;R.R. Yu;A.M. Young;J.P. Doyle

  • Novel Cu-to-Cu Bonding With Ti Passivation at 180 $^{\circ}{ m C}$ in 3-D Integration

    Yan-Pin Huang;Yu-San Chien;Ruoh-Ning Tzeng;Ming-Shaw Shy

  • Irreversible modification of Ge2Sb2Te5 phase change material by nanometer-thin Ti adhesion layers in a device-compatible stack

    C. Cabral;Kuan-Neng Chen;L. Krusin-Elbaum;V. Deline

  • Low Temperature Cu–Cu Bonding Technology in Three-Dimensional Integration: An Extensive Review

    Asisa Kumar Panigrahy;Kuan-Neng Chen

  • Vertical interconnects of microbumps in 3D integration

    Chih Chen;Doug Yu;Kuan-Neng Chen

  • Wafer-to-Wafer Alignment for Three-Dimensional Integration: A Review

    Sang Hwui Lee;Kuan-Neng Chen;James Jian-Qiang Lu

  • Microstructure examination of copper wafer bonding

    Kuan-Neng Chen;Andy Fan;Rafael Reif

  • Development of low temperature CuCu bonding and hybrid bonding for three-dimensional integrated circuits (3D IC)

    Han-Wen Hu;Kuan-Neng Chen

  • Bonding parameters of blanket copper wafer bonding

    Kuan-Neng Chen;A. Fan;C. S. Tan;R. Reif

  • Contact resistance measurement of bonded copper interconnects for three-dimensional integration technology

    K.N. Chen;A. Fan;C.S. Tan;R. Reif

  • Copper bonded layers analysis and effects of copper surface conditions on bonding quality for three-dimensional integration

    Kuan-Neng Chen;C. S. Tan;A. Fan;R. Reif

  • Demonstration and Electrical Performance of Cu–Cu Bonding at 150 °C With Pd Passivation

    Yan-Pin Huang;Yu-San Chien;Ruoh-Ning Tzeng;Kuan-Neng Chen

  • Structure, Design and Process Control for Cu Bonded Interconnects in 3D Integrated Circuits

    Kuan-Neng Chen;Sang Hwui Lee;P.S. Andry;C.K. Tsang

  • Comparisons of conventional, 3-D, optical, and RF interconnects for on-chip clock distribution

    Kuan-Neng Chen;M.J. Kobrinsky;B.C. Barnett;R. Reif

Frequent Co-Authors

Chuan Seng Tan
Chuan Seng Tan Nanyang Technological University
Steven J. Koester
Steven J. Koester University of Minnesota
Cyril Cabral
Cyril Cabral IBM (United States)
King-Ning Tu
King-Ning Tu City University of Hong Kong
Ching-Te Chuang
Ching-Te Chuang National Yang Ming Chiao Tung University
Sampath Purushothaman
Sampath Purushothaman IBM (United States)
Chih Chen
Chih Chen National Yang Ming Chiao Tung University
Chenming Hu
Chenming Hu University of California, Berkeley
Wen-Wei Wu
Wen-Wei Wu National Yang Ming Chiao Tung University
Cornelia K. Tsang
Cornelia K. Tsang IBM Thomas J. Watson Research Center

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