World's Best Scientists 2026 revealed!

D-Index & Metrics

Materials Science

D-Index
56
Citations
12029
World Ranking
8219
National Ranking
2026

Engineering and Technology

D-Index
58
Citations
12483
World Ranking
2492
National Ranking
764

John H. Lau publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where John H. Lau sits on this spectrum.

38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 135 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 118 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 60 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38 publications 804+

This scientist: 419 publications — 91st percentile

91% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

John H. Lau D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where John H. Lau sits on this spectrum.

30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 129 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 348 scientists 41 D-Index: 362 scientists 42 D-Index: 426 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 95 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 25 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 58 D-Index — 75th percentile

75% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

Research.com Recognitions

  • 1999 - Fellow of the American Society of Mechanical Engineers

Overview

John H. Lau is affiliated with ASM International in the United States and has a research focus primarily in engineering, with significant contributions to electrical and electronic engineering. Their work extends into subfields including automotive engineering, biomedical engineering, mechanical engineering, and aerospace engineering.

The scientist's main research topics cover several aspects of electronic and manufacturing technologies. Key areas include:

  • Electronic Packaging and Soldering Technologies
  • 3D IC and TSV technologies
  • Additive Manufacturing and 3D Printing Technologies
  • Nanofabrication and Lithography Techniques
  • Electromagnetic Compatibility and Noise Suppression
  • Advanced Antenna and Metasurface Technologies
  • Material Properties and Processing

John H. Lau has published extensively in several journals and proceedings. Frequent publication venues include:

  • IEEE Transactions on Components Packaging and Manufacturing Technology
  • Journal of Microelectronics and Electronic Packaging
  • IMAPSource Proceedings
  • Journal of Electronic Packaging
  • International Symposium on Microelectronics

Some of the recent papers by John H. Lau are:

  • Recent Advances and Trends in Advanced Packaging, 2022, IEEE Transactions on Components Packaging and Manufacturing Technology
  • Recent Advances and Trends in Cu-Cu Hybrid Bonding, 2023, IEEE Transactions on Components Packaging and Manufacturing Technology
  • State of the Art of Lead-Free Solder Joint Reliability, 2020, Journal of Electronic Packaging
  • Recent Advances and Trends in Multiple System and Heterogeneous Integration With TSV Interposers, 2023, IEEE Transactions on Components Packaging and Manufacturing Technology
  • Recent Advances and Trends in Multiple System and Heterogeneous Integration With TSV-Less Interposers, 2022, IEEE Transactions on Components Packaging and Manufacturing Technology

The scientist frequently collaborates with other researchers, including:

  • Tzyy-Jang Tseng
  • Cheng-Ta Ko
  • Kai-Ming Yang
  • Tim Xia
  • Puru Bruce Lin

John H. Lau was awarded the title Fellow of the American Society of Mechanical Engineers in 1999.

Best Publications

  • Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies

    John H. Lau;Yi-Hsin Pao

  • Ball Grid Array Technology

    John H. Lau

  • Overview and outlook of through‐silicon via (TSV) and 3D integrations

    John H. Lau

  • Solder Joint Reliability

    John H. Lau

  • Solder Joint Reliability: Theory and Applications

    John H. Lau;Peter A. Engel

  • Chip scale package (CSP) : design, materials, processes, reliability, and applications

    John H. Lau;Shi-Wei Ricky Lee

  • Thermal Stress and Strain in Microelectronics Packaging

    John H. Lau;Peter A. Engel

  • Evolution, challenge, and outlook of TSV, 3D IC integration and 3d silicon integration

    John H. Lau

  • TSV manufacturing yield and hidden costs for 3D IC integration

    John H. Lau

  • Thermal management of 3D IC integration with TSV (through silicon via)

    Unknown

  • Development of 3-D Silicon Module With TSV for System in Packaging

    N. Khan;V.S. Rao;S. Lim;Ho Soon We

  • Warpage and Thermal Characterization of Fan-Out Wafer-Level Packaging

    John H. Lau;Ming Li;Dewen Tian;Nelson Fan

  • Recent Advances and New Trends in Flip Chip Technology

    John H. Lau

  • Chip on Board: Technologies for Multichip Modules

    John H. Lau;Richard J. Prosman

  • High RF performance TSV silicon carrier for high frequency application

    Unknown

  • Development of through silicon via (TSV) interposer technology for large die (21×21mm) fine-pitch Cu/low-k FCBGA package

    Xiaowu Zhang;T.C. Chai;John H. Lau;C. S. Selvanayagam

  • Overview and Outlook of Three-Dimensional Integrated Circuit Packaging, Three-Dimensional Si Integration, and Three-Dimensional Integrated Circuit Integration

    John H. Lau

  • Solder joint reliability of flip chip and plastic ball grid array assemblies under thermal, mechanical, and vibrational conditions

    Unknown

  • Fan-Out Wafer-Level Packaging

    John H. Lau

  • Acceleration models, constitutive equations, and reliability of lead-free solders and joints

    J. Lau;W. Danksher;P. Vianco

  • Effects of TSVs (through-silicon vias) on thermal performances of 3D IC integration system-in-package (SiP)

    John H. Lau;Tang Gong Yue

  • Thermal fatigue life prediction of flip chip solder joints by fracture mechanics method

    John H. Lau

  • Recent Advances and Trends in Fan-Out Wafer/Panel-Level Packaging

    John H. Lau

  • Effects of underfill material properties on the reliability of solder bumped flip chip on board with imperfect underfill encapsulants

    J.H. Lau;S.-W.R. Lee;C. Chang

  • Single-core two-side substrate with u-strip and co-planar signal traces, and power and ground planes through split-wrap-around (SWA) or split-via-connections (SVC) for packaging IC devices

    John H. Lau;Yung Shih Chen;Tai-Yu Chou;Frank H. Wu

Frequent Co-Authors

Aditya Kumar
Aditya Kumar Missouri University of Science and Technology
Chengkuo Lee
Chengkuo Lee National University of Singapore
Dim-Lee Kwong
Dim-Lee Kwong National University of Singapore
Gaurav Sharma
Gaurav Sharma University of Rochester
Ming Li
Ming Li Shanghai Jiao Tong University
John Hock Lye Pang
John Hock Lye Pang Nanyang Technological University

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