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Pradeep Lall

D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 55 2175 2087 849 795 863 11951

Pradeep Lall publications per year

The chart shows the history of publications by Pradeep Lall between 1970 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Pradeep Lall published across 56 years, from 1970 to 2025, averaging 18.3 papers a year. Output peaked at 101 publications in 2021. 134 of the 1,022 publications appeared in the last two years.

No. of publications
25 50 75 100
Bar chart. Horizontal axis: year, 1970 to 2025. Vertical axis: number of publications, 0 to 101. Peak 101 publications in 2021. 1970: 1 publication 1971: 0 publications 1972: 0 publications 1973: 0 publications 1974: 0 publications 1975: 0 publications 1976: 0 publications 1977: 0 publications 1978: 0 publications 1979: 0 publications 1980: 0 publications 1981: 0 publications 1982: 0 publications 1983: 0 publications 1984: 0 publications 1985: 0 publications 1986: 0 publications 1987: 0 publications 1988: 0 publications 1989: 0 publications 1990: 1 publication 1991: 0 publications 1992: 2 publications 1993: 1 publication 1994: 2 publications 1995: 3 publications 1996: 3 publications 1997: 4 publications 1998: 4 publications 1999: 2 publications 2000: 1 publication 2001: 1 publication 2002: 0 publications 2003: 12 publications 2004: 15 publications 2005: 18 publications 2006: 21 publications 2007: 21 publications 2008: 28 publications 2009: 34 publications 2010: 18 publications 2011: 29 publications 2012: 40 publications 2013: 29 publications 2014: 29 publications 2015: 36 publications 2016: 34 publications 2017: 41 publications 2018: 56 publications 2019: 56 publications 2020: 80 publications 2021: 101 publications 2022: 85 publications 2023: 80 publications 2024: 77 publications 2025: 57 publications
1970 2025

1,022 publications in total across all disciplines

View publications per year as a table
Pradeep Lall: publications per year, 1970 to 2025
Year Publications
1970 1
1971 0
1972 0
1973 0
1974 0
1975 0
1976 0
1977 0
1978 0
1979 0
1980 0
1981 0
1982 0
1983 0
1984 0
1985 0
1986 0
1987 0
1988 0
1989 0
1990 1
1991 0
1992 2
1993 1
1994 2
1995 3
1996 3
1997 4
1998 4
1999 2
2000 1
2001 1
2002 0
2003 12
2004 15
2005 18
2006 21
2007 21
2008 28
2009 34
2010 18
2011 29
2012 40
2013 29
2014 29
2015 36
2016 34
2017 41
2018 56
2019 56
2020 80
2021 101
2022 85
2023 80
2024 77
2025 57
Total 1,022
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Pradeep Lall publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Pradeep Lall sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 854–873 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 863 publications — 97th percentile

97% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20 863
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Pradeep Lall D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Pradeep Lall sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 55 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 55 D-Index — 69th percentile

69% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97 55
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
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Overview

Pradeep Lall is affiliated with Auburn University in the United States and has contributed extensively to the field of engineering, with a focus on electrical and electronic engineering as well as mechanical and automotive engineering subfields. Their research encompasses over 214 publications within engineering, including 115 specifically in electrical and electronic engineering and 28 in mechanical engineering. The research work also touches on mechanics of materials and biomedical engineering.

Significant topics of their research include:

  • Electronic Packaging and Soldering Technologies
  • 3D IC and TSV technologies
  • Additive Manufacturing and 3D Printing Technologies
  • Nanomaterials and Printing Technologies
  • Aluminum Alloys Composites Properties
  • Mechanical Behavior of Composites
  • Advanced Sensor and Energy Harvesting Materials

Pradeep Lall has published their work regularly in notable venues. Frequent publication venues associated with their research are:

  • 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm)
  • IEEE Transactions on Components Packaging and Manufacturing Technology
  • Journal of Electronic Packaging
  • 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
  • IEEE Journal of Photovoltaics

Among recent papers authored or co-authored by Pradeep Lall are:

  • High Strain Rate Mechanical Properties of SAC-Q Solder for Extreme Temperatures After Exposure to Isothermal Aging Up to 90 Days, 2021, Journal of Electronic Packaging
  • Evolution of Anand Parameters for Thermally Aged Sn-Ag-Cu Lead-Free Alloys at Low Operating Temperature, 2022, Journal of Electronic Packaging
  • Effect of Underfill Property Evolution on Solder Joint Reliability in Automotive Applications, 2022, 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)

They have collaborated extensively with several researchers. Frequent co-authors include:

  • Jeffrey C. Suhling
  • Ravi Mahajan
  • Alan Huffman
  • K Yokouchi
  • Karlheinz Bock

Best Publications

  • Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

    Pradeep Lall;Michael G. Pecht;Edward B. Hakim

  • The Influence of Elevated Temperature Aging on Reliability of Lead Free Solder Joints

    Hongtao Ma;J.C. Suhling;Yifei Zhang;P. Lall

  • Reliability of the aging lead free solder joint

    Hongtao Ma;J.C. Suhling;P. Lall;M.J. Bozack

  • Determination of Anand constants for SAC solders using stress-strain or creep data

    Mohammad Motalab;Zijie Cai;Jeffrey C. Suhling;Pradeep Lall

  • Models for Reliability Prediction of Fine-Pitch BGAs and CSPs in Shock and Drop-Impact

    P. Lall;D.R. Panchagade;Yueli Liu;R.W. Johnson

  • The effects of aging temperature on SAC solder joint material behavior and reliability

    Yifei Zhang;Zijie Cai;J.C. Suhling;P. Lall

  • Model for BGA and CSP reliability in automotive underhood applications

    P. Lall;M.N. Islam;N. Singh;J.C. Suhling

  • Models for reliability prediction of fine-pitch BGAs and CSPs in shock and drop-impact

    P. Lall;D. Panchagade;Yueli Liu;W. Johnson

  • Reduction of lead free solder aging effects using doped SAC alloys

    Zijie Cai;Yifei Zhang;Jeffrey C. Suhling;Pradeep Lall

  • Solder-joint reliability in electronics under shock and vibration using explicit finite-element sub-modeling

    P. Lall;S. Gupte;P. Choudhary;J. Suhling

  • Health monitoring for damage initiation & progression during mechanical shock in electronic assemblies

    P. Lall;P. Choudhary;S. Gupte;J. Suhling

  • Failure-Envelope Approach to Modeling Shock and Vibration Survivability of Electronic and MEMS Packaging

    P. Lall;D.R. Panchagade;P. Choudhary;S. Gupte

  • Flexible connector for circuit boards

    Joseph G. Gillette;Scott G. Potter;Pradeep Lall

  • Prognostics and Health Management of Electronic Packaging

    P. Lall;M.N. Islam;M.K. Rahim;J.C. Suhling

  • Improved predictions of lead free solder joint reliability that include aging effects

    Mohammad Motalab;Zijie Cai;Jeffrey C. Suhling;Jiawei Zhang

  • Failure-Envelope Approach to Modeling Shock and Vibration Survivability of Electronic and MEMS Packaging

    P. Lall;D. Panchagade;P. Choudhary;J. Suhling

  • The effects of aging on the cyclic stress-strain behavior and hysteresis loop evolution of lead free solders

    Muhannad Mustafa;Zijie Cai;Jeffrey C. Suhling;Pradeep Lall

  • Statistical Pattern Recognition and Built-in Reliability Test for Feature Extraction and Health Monitoring of Electronics under Shock Loads

    P. Lall;P. Choudhary;S. Gupte;J. Suhling

  • Correlation of reliability models including aging effects with thermal cycling reliability data

    Mohammad Motalab;Muhannad Mustafa;Jeffrey C. Suhling;Jiawei Zhang

  • Statistical Pattern Recognition and Built-in Reliability Test for Feature Extraction and Health Monitoring of Electronics Under Shock Loads

    P. Lall;P. Choudhary;S. Gupte;J. Hofmeister

  • Prognostics and Health Management of Electronics

    P. Lall;M. Hande;C. Bhat;J. Suhling

Frequent Co-Authors

Jeffrey C. Suhling
Jeffrey C. Suhling Auburn University
Kai Goebel
Kai Goebel Palo Alto Research Center
Richard C. Jaeger
Richard C. Jaeger Auburn University
Ryan J. Lowe
Ryan J. Lowe University of Western Australia
Michael Pecht
Michael Pecht University of Maryland, College Park
Robert L. Jackson
Robert L. Jackson Auburn University
Herbert Reichl
Herbert Reichl Fraunhofer Society
John W. Fowler
John W. Fowler Arizona State University

External Links

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