World's Best Scientists 2026 revealed!
Richard C. Jaeger

Richard C. Jaeger

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
42
Citations
8662
World Ranking
4050
National Ranking
1446

Richard C. Jaeger publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Richard C. Jaeger sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 291 publications — 55th percentile

55% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Richard C. Jaeger D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Richard C. Jaeger sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 42 D-Index — 42nd percentile

42% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 1986 - IEEE Fellow For contributions to devices technology for high-performance analog and digital computer systems.

Overview

What is he best known for?

The fields of study he is best known for:

  • Electrical engineering
  • Integrated circuit
  • Thermodynamics

Richard C. Jaeger focuses on Electronic engineering, Piezoresistive effect, Electrical engineering, Integrated circuit and Optoelectronics. His CMOS study in the realm of Electronic engineering connects with subjects such as Integrated injection logic. His work carried out in the field of Piezoresistive effect brings together such families of science as Die, Silicon, Stress, MOSFET and Resistor.

His study looks at the relationship between Electrical engineering and fields such as Low-power electronics, as well as how they intersect with chemical problems. His Integrated circuit research is multidisciplinary, incorporating perspectives in Mechanical engineering, Wafer and Voltage. The study incorporates disciplines such as Heterojunction bipolar transistor, Transistor and Nanotechnology in addition to Optoelectronics.

His most cited work include:

  • Introduction to microelectronic fabrication (488 citations)
  • Heat sink optimization with application to microchannels (342 citations)
  • Silicon piezoresistive stress sensors and their application in electronic packaging (265 citations)

What are the main themes of his work throughout his whole career to date?

Electronic engineering, Electrical engineering, Stress, Die and Piezoresistive effect are his primary areas of study. His Electronic engineering research is multidisciplinary, relying on both Direct digital synthesizer, Silicon-germanium, Amplifier and Integrated circuit. His Electrical engineering study frequently draws connections to other fields, such as Low-power electronics.

The concepts of his Stress study are interwoven with issues in Moisture, Electronic packaging and Shear stress. His study in Piezoresistive effect is interdisciplinary in nature, drawing from both Resistor, Wafer, Integrated circuit packaging and Silicon. His Silicon study introduces a deeper knowledge of Optoelectronics.

He most often published in these fields:

  • Electronic engineering (44.03%)
  • Electrical engineering (31.72%)
  • Stress (29.85%)

What were the highlights of his more recent work (between 2010-2020)?

  • Stress (29.85%)
  • Composite material (25.00%)
  • Piezoresistive effect (25.75%)

In recent papers he was focusing on the following fields of study:

His primary scientific interests are in Stress, Composite material, Piezoresistive effect, Die and Electrical engineering. He has included themes like Optoelectronics, Silicon, Shear stress, Silicon carbide and Electronic engineering in his Stress study. Richard C. Jaeger studies Optoelectronics, focusing on Integrated circuit in particular.

His studies in Piezoresistive effect integrate themes in fields like Condensed matter physics, CMOS and NMOS logic. As part of the same scientific family, Richard C. Jaeger usually focuses on Die, concentrating on Ball grid array and intersecting with Temperature cycling. Many of his research projects under Electrical engineering are closely connected to Chirp with Chirp, tying the diverse disciplines of science together.

Between 2010 and 2020, his most popular works were:

  • CMOS Sensor Arrays for High Resolution Die Stress Mapping in Packaged Integrated Circuits (31 citations)
  • Low frequency noise sources in bipolar junction transistors (28 citations)
  • An X- and Ku-Band Wideband Recursive Receiver MMIC With Gain-Reuse (18 citations)

In his most recent research, the most cited papers focused on:

  • Electrical engineering
  • Thermodynamics
  • Integrated circuit

Richard C. Jaeger mainly investigates Stress, Electronic engineering, Electrical engineering, Composite material and Die. His Stress research incorporates elements of Bridge, Structural engineering, Van der Pauw method and Shear stress. He focuses mostly in the field of Electronic engineering, narrowing it down to topics relating to Transistor and, in certain cases, High impedance.

His research on Electrical engineering frequently connects to adjacent areas such as Optoelectronics. His Die research integrates issues from Piezoresistive effect and Integrated circuit packaging. Richard C. Jaeger has researched Piezoresistive effect in several fields, including Bipolar junction transistor and Silicon.

Best Publications

  • Introduction to microelectronic fabrication

    Richard C. Jaeger

  • Microelectronic Circuit Design

    Richard C. Jaeger;Travis Blalock

  • Heat sink optimization with application to microchannels

    R.W. Knight;D.J. Hall;J.S. Goodling;R.C. Jaeger

  • Silicon piezoresistive stress sensors and their application in electronic packaging

    J.C. Suhling;R.C. Jaeger

  • A high-speed clamped bit-line current-mode sense amplifier

    T.N. Blalock;R.C. Jaeger

  • Piezoresistive Stress Sensors for Structural Analysis of Electronic Packages

    D. A. Bittle;J. C. Suhling;R. E. Beaty;R. C. Jaeger

  • A 12-Bit Vernier Ring Time-to-Digital Converter in 0.13 $\mu{\hbox {m}}$ CMOS Technology

    Jianjun Yu;F.F. Dai;R.C. Jaeger

  • CMOS stress sensors on [100] silicon

    R.C. Jaeger;J.C. Suhling;R. Ramani;A.T. Bradley

  • Piezoresistive characteristics of short-channel MOSFETs on (100) silicon

    A.T. Bradley;R.C. Jaeger;J.C. Suhling;K.J. O'Connor

  • A high-speed sensing scheme for 1T dynamic RAMs utilizing the clamped bit-line sense amplifier

    T.N. Blalock;R.C. Jaeger

  • Evaluation of piezoresistive coefficient variation in silicon stress sensors using a four-point bending test fixture

    R.E. Beaty;R.C. Jaeger;J.C. Suhling;R.W. Johnson

  • Errors associated with the design, calibration and application of piezoresistive stress sensors in (100) silicon

    R.C. Jaeger;J.C. Suhling;R. Ramani

  • Comments on "An optimized output stage for MOS integrated circuits" [with reply]

    R.C. Jaeger;L.W. Linholm

  • Temperature dependent threshold behavior of depletion mode MOSFETs. Characterization and simulation

    F.H. Gaensslen;R.C. Jaeger

  • Simulation of impurity freezeout through numerical solution of Poisson's equation with application to MOS device behavior

    R.C. Jaeger;F.H. Gaensslen

  • The van der Pauw stress sensor

    A. Mian;J.C. Suhling;R.C. Jaeger

  • Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From ${-}150\,^{\circ}$ C to ${+}125\,^{\circ}$ C

    Chun-Hyung Cho;R.C. Jaeger;J.C. Suhling

  • Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors

    L.S. Vempati;J.D. Cressler;J.A. Babcock;R.C. Jaeger

  • Ionizing radiation tolerance of high-performance SiGe HBT's grown by UHV/CVD

    J.A. Babcock;J.D. Cressler;L.S. Vempati;S.D. Clark

  • A 12-bit vernier ring time-to-digital converter in 0.13μm CMOS technology

    Jianjun Yu;Fa Foster Dai;Richard C. Jaeger

Frequent Co-Authors

Jeffrey C. Suhling
Jeffrey C. Suhling Auburn University
Pradeep Lall
Pradeep Lall Auburn University
John D. Cressler
John D. Cressler Georgia Institute of Technology
Bogdan M. Wilamowski
Bogdan M. Wilamowski Auburn University
David L. Harame
David L. Harame IBM (United States)
Alvin J. Joseph
Alvin J. Joseph GlobalFoundries (United States)
Guofu Niu
Guofu Niu Auburn University
Charles E. Stroud
Charles E. Stroud Auburn University
Herbert Reichl
Herbert Reichl Fraunhofer Society
Johannes M. C. Stork
Johannes M. C. Stork ON Semiconductor (United States)

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