World's Best Scientists 2026 revealed!

D-Index & Metrics

Discipline name D-Index World Ranking National Ranking Publications Citations
Electronics and Electrical Engineering 106 136 66 216 27102
Materials Science 108 769 260 212 28188

Kie Y. Ahn publications per year

The chart shows the history of publications by Kie Y. Ahn between 1997 and 2015, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Kie Y. Ahn published across 19 years, from 1997 to 2015, averaging 12.9 papers a year. Output peaked at 34 publications in 2002. 3 of the 246 publications appeared in the last two years.

No. of publications
10 20 30
Bar chart. Horizontal axis: year, 1997 to 2015. Vertical axis: number of publications, 0 to 34. Peak 34 publications in 2002. 1997: 2 publications 1998: 9 publications 1999: 8 publications 2000: 16 publications 2001: 29 publications 2002: 34 publications 2003: 20 publications 2004: 25 publications 2005: 22 publications 2006: 27 publications 2007: 17 publications 2008: 5 publications 2009: 5 publications 2010: 2 publications 2011: 12 publications 2012: 6 publications 2013: 4 publications 2014: 1 publication 2015: 2 publications
1997 2015

246 publications in total across all disciplines

View publications per year as a table
Kie Y. Ahn: publications per year, 1997 to 2015
Year Publications
1997 2
1998 9
1999 8
2000 16
2001 29
2002 34
2003 20
2004 25
2005 22
2006 27
2007 17
2008 5
2009 5
2010 2
2011 12
2012 6
2013 4
2014 1
2015 2
Total 246
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Kie Y. Ahn publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Kie Y. Ahn sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 214–233 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 216 publications — 34th percentile

34% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431 216
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Kie Y. Ahn D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Kie Y. Ahn sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 106 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 106 D-Index — 98th percentile

98% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13 106
107 4
108 5
109 10
110 8
111+ 96
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Overview

What is he best known for?

The fields of study he is best known for:

  • Integrated circuit
  • Semiconductor
  • Transistor

The scientist’s investigation covers issues in Optoelectronics, Gate oxide, Dielectric, Atomic layer deposition and Electrical engineering. His Gate oxide study integrates concerns from other disciplines, such as Oxide, Gate dielectric and Oxide thin-film transistor. In his study, which falls under the umbrella issue of Gate dielectric, Cerium oxide is strongly linked to Electronic engineering.

His Dielectric research is multidisciplinary, incorporating perspectives in Equivalent oxide thickness and Capacitor. He interconnects Inorganic chemistry and Hafnium in the investigation of issues within Atomic layer deposition. His research in Layer intersects with topics in Hafnium oxide and Zirconium.

His most cited work include:

  • Atomic layer-deposited laaio3 films for gate dielectrics (361 citations)
  • Lanthanide oxide / hafnium oxide dielectric layers (297 citations)
  • Structure and method for a high performance electronic packaging assembly (287 citations)

What are the main themes of his work throughout his whole career to date?

Kie Y. Ahn mainly investigates Optoelectronics, Dielectric, Layer, Substrate and Atomic layer deposition. His research integrates issues of Oxide, Transistor, Gate oxide, Electronic engineering and Electrical engineering in his study of Optoelectronics. His study looks at the relationship between Gate oxide and fields such as Gate dielectric, as well as how they intersect with chemical problems.

His study in Dielectric is interdisciplinary in nature, drawing from both Inorganic chemistry, Lanthanum, Equivalent oxide thickness and Capacitor. Kie Y. Ahn has researched Layer in several fields, including Electrical conductor, Dopant and Line. His Atomic layer deposition research integrates issues from Titanium oxide, Aluminum oxide and Zirconium.

He most often published in these fields:

  • Optoelectronics (62.47%)
  • Dielectric (34.52%)
  • Layer (31.51%)

What were the highlights of his more recent work (between 2006-2015)?

  • Optoelectronics (62.47%)
  • Dielectric (34.52%)
  • Inorganic chemistry (25.21%)

In recent papers he was focusing on the following fields of study:

Kie Y. Ahn mainly focuses on Optoelectronics, Dielectric, Inorganic chemistry, Atomic layer deposition and Oxide. His Optoelectronics research is multidisciplinary, relying on both Layer and Transistor, Equivalent oxide thickness, Gate oxide. His Equivalent oxide thickness research incorporates themes from Silicon oxide and Oxide thin-film transistor.

His High-κ dielectric study in the realm of Dielectric interacts with subjects such as Lanthanide. His biological study spans a wide range of topics, including Monolayer, Substrate and Chemical engineering. His Atomic layer deposition research is within the category of Composite material.

Between 2006 and 2015, his most popular works were:

  • Hafnium tantalum titanium oxide films (239 citations)
  • Hafnium tantalum oxide dielectrics (44 citations)
  • Zirconium-doped zinc oxide structures and methods (41 citations)

In his most recent research, the most cited papers focused on:

  • Integrated circuit
  • Semiconductor
  • Transistor

Kie Y. Ahn focuses on Optoelectronics, Inorganic chemistry, Oxide, Dielectric and Monolayer. His work carried out in the field of Optoelectronics brings together such families of science as Electrical engineering, Gate oxide and Atomic layer deposition. The Inorganic chemistry study combines topics in areas such as Equivalent oxide thickness and Dielectric layer.

Kie Y. Ahn works mostly in the field of Equivalent oxide thickness, limiting it down to topics relating to Electronics and, in certain cases, Integrated circuit. His Dielectric study incorporates themes from Layer, Electronic engineering, Lanthanum and Gate dielectric. As a member of one scientific family, Kie Y. Ahn mostly works in the field of High-κ dielectric, focusing on Transistor and, on occasion, Capacitor.

Best Publications

  • Atomic layer-deposited laaio3 films for gate dielectrics

    Kie Y. Ahn;Leonard Forbes

  • Electronic apparatus with deposited dielectric layers

    Kie Y. Ahn;Leonard Forbes

  • Lanthanide oxide / hafnium oxide dielectric layers

    Kie Y. Ahn;Leonard Forbes

  • Structure and method for a high performance electronic packaging assembly

    Kie Y. Ahn;Leonard Forbes;Eugene H. Cloud

  • Atomic layer deposition of metal oxynitride layers as gate dielectrics

    Kie Ahn;Leonard Forbes

  • Dielectric stack containing lanthanum and hafnium

    Kie Y. Ahn;Leonard Forbes

  • Zirconium titanium oxide films

    Kie Y. Ahn;Leonard Forbes

  • Memory cell having a vertical transistor with buried source/drain and dual gates

    Wendell P. Noble;Leonard Forbes;Kie Y. Ahn

  • Memory cell with vertical transistor and buried word and body lines

    Leonard Forbes;Wendell P. Noble;Kie Y. Ahn

  • ZrXHfYSn1-X-YO2 FILMS AS HIGH K GATE DIELECTRICS

    Kie Y. Ahn;Leonard Forbes

  • Atomic layer deposition of CMOS gates with variable work functions

    Leonard Forbes;Kie Y. Ahn

  • 4 F2 folded bit line dram cell structure having buried bit and word lines

    Wendell P. Noble;Leonard Forbes;Kie Y. Ahn

  • Hafnium aluminium oxynitride high-K dielectric and metal gates

    Leonard Forbes;Kie Y. Ahn;Arup Bhattacharyya

  • Hafnium tantalum titanium oxide films

    Kie Y. Ahn;Leonard Forbes

  • Nanolaminates of hafnium oxide and zirconium oxide

    Kie Y. Ahn;Leonard Forbes

  • HfAlO3 films for gate dielectrics

    Kie Y. Ahn;Leonard Forbes

  • Hafnium tantalum oxide dielectrics

    Kie Y. Ahn;Leonard Forbes

  • Silicon on germanium

    Kie Y. Ahn;Leonard Forbes

  • Methods for atomic-layer deposition

    Kie Y. Ahn;Leonard Forbes

  • Hafnium tantalum oxynitride dielectric

    Leonard Forbes;Kie Y. Ahn;Arup Bhattacharyya

Frequent Co-Authors

Leonard Forbes
Leonard Forbes L. Forbes and Associates LLC
Arup Bhattacharyya
Arup Bhattacharyya Micron (United States)
Salman Akram
Salman Akram Micron (United States)
Wendell P. Noble
Wendell P. Noble Micron (United States)

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