World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
106
Citations
27102
World Ranking
136
National Ranking
66

Materials Science

D-Index
108
Citations
28188
World Ranking
769
National Ranking
260

Kie Y. Ahn publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Kie Y. Ahn sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 216 publications — 34th percentile

34% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Kie Y. Ahn D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Kie Y. Ahn sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 106 D-Index — 98th percentile

98% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Integrated circuit
  • Semiconductor
  • Transistor

The scientist’s investigation covers issues in Optoelectronics, Gate oxide, Dielectric, Atomic layer deposition and Electrical engineering. His Gate oxide study integrates concerns from other disciplines, such as Oxide, Gate dielectric and Oxide thin-film transistor. In his study, which falls under the umbrella issue of Gate dielectric, Cerium oxide is strongly linked to Electronic engineering.

His Dielectric research is multidisciplinary, incorporating perspectives in Equivalent oxide thickness and Capacitor. He interconnects Inorganic chemistry and Hafnium in the investigation of issues within Atomic layer deposition. His research in Layer intersects with topics in Hafnium oxide and Zirconium.

His most cited work include:

  • Atomic layer-deposited laaio3 films for gate dielectrics (361 citations)
  • Lanthanide oxide / hafnium oxide dielectric layers (297 citations)
  • Structure and method for a high performance electronic packaging assembly (287 citations)

What are the main themes of his work throughout his whole career to date?

Kie Y. Ahn mainly investigates Optoelectronics, Dielectric, Layer, Substrate and Atomic layer deposition. His research integrates issues of Oxide, Transistor, Gate oxide, Electronic engineering and Electrical engineering in his study of Optoelectronics. His study looks at the relationship between Gate oxide and fields such as Gate dielectric, as well as how they intersect with chemical problems.

His study in Dielectric is interdisciplinary in nature, drawing from both Inorganic chemistry, Lanthanum, Equivalent oxide thickness and Capacitor. Kie Y. Ahn has researched Layer in several fields, including Electrical conductor, Dopant and Line. His Atomic layer deposition research integrates issues from Titanium oxide, Aluminum oxide and Zirconium.

He most often published in these fields:

  • Optoelectronics (62.47%)
  • Dielectric (34.52%)
  • Layer (31.51%)

What were the highlights of his more recent work (between 2006-2015)?

  • Optoelectronics (62.47%)
  • Dielectric (34.52%)
  • Inorganic chemistry (25.21%)

In recent papers he was focusing on the following fields of study:

Kie Y. Ahn mainly focuses on Optoelectronics, Dielectric, Inorganic chemistry, Atomic layer deposition and Oxide. His Optoelectronics research is multidisciplinary, relying on both Layer and Transistor, Equivalent oxide thickness, Gate oxide. His Equivalent oxide thickness research incorporates themes from Silicon oxide and Oxide thin-film transistor.

His High-κ dielectric study in the realm of Dielectric interacts with subjects such as Lanthanide. His biological study spans a wide range of topics, including Monolayer, Substrate and Chemical engineering. His Atomic layer deposition research is within the category of Composite material.

Between 2006 and 2015, his most popular works were:

  • Hafnium tantalum titanium oxide films (239 citations)
  • Hafnium tantalum oxide dielectrics (44 citations)
  • Zirconium-doped zinc oxide structures and methods (41 citations)

In his most recent research, the most cited papers focused on:

  • Integrated circuit
  • Semiconductor
  • Transistor

Kie Y. Ahn focuses on Optoelectronics, Inorganic chemistry, Oxide, Dielectric and Monolayer. His work carried out in the field of Optoelectronics brings together such families of science as Electrical engineering, Gate oxide and Atomic layer deposition. The Inorganic chemistry study combines topics in areas such as Equivalent oxide thickness and Dielectric layer.

Kie Y. Ahn works mostly in the field of Equivalent oxide thickness, limiting it down to topics relating to Electronics and, in certain cases, Integrated circuit. His Dielectric study incorporates themes from Layer, Electronic engineering, Lanthanum and Gate dielectric. As a member of one scientific family, Kie Y. Ahn mostly works in the field of High-κ dielectric, focusing on Transistor and, on occasion, Capacitor.

Best Publications

  • Atomic layer-deposited laaio3 films for gate dielectrics

    Kie Y. Ahn;Leonard Forbes

  • Electronic apparatus with deposited dielectric layers

    Kie Y. Ahn;Leonard Forbes

  • Lanthanide oxide / hafnium oxide dielectric layers

    Kie Y. Ahn;Leonard Forbes

  • Structure and method for a high performance electronic packaging assembly

    Kie Y. Ahn;Leonard Forbes;Eugene H. Cloud

  • Atomic layer deposition of metal oxynitride layers as gate dielectrics

    Kie Ahn;Leonard Forbes

  • Dielectric stack containing lanthanum and hafnium

    Kie Y. Ahn;Leonard Forbes

  • Zirconium titanium oxide films

    Kie Y. Ahn;Leonard Forbes

  • Memory cell having a vertical transistor with buried source/drain and dual gates

    Wendell P. Noble;Leonard Forbes;Kie Y. Ahn

  • Memory cell with vertical transistor and buried word and body lines

    Leonard Forbes;Wendell P. Noble;Kie Y. Ahn

  • ZrXHfYSn1-X-YO2 FILMS AS HIGH K GATE DIELECTRICS

    Kie Y. Ahn;Leonard Forbes

  • Atomic layer deposition of CMOS gates with variable work functions

    Leonard Forbes;Kie Y. Ahn

  • 4 F2 folded bit line dram cell structure having buried bit and word lines

    Wendell P. Noble;Leonard Forbes;Kie Y. Ahn

  • Hafnium aluminium oxynitride high-K dielectric and metal gates

    Leonard Forbes;Kie Y. Ahn;Arup Bhattacharyya

  • Hafnium tantalum titanium oxide films

    Kie Y. Ahn;Leonard Forbes

  • Nanolaminates of hafnium oxide and zirconium oxide

    Kie Y. Ahn;Leonard Forbes

  • HfAlO3 films for gate dielectrics

    Kie Y. Ahn;Leonard Forbes

  • Hafnium tantalum oxide dielectrics

    Kie Y. Ahn;Leonard Forbes

  • Silicon on germanium

    Kie Y. Ahn;Leonard Forbes

  • Methods for atomic-layer deposition

    Kie Y. Ahn;Leonard Forbes

  • Hafnium tantalum oxynitride dielectric

    Leonard Forbes;Kie Y. Ahn;Arup Bhattacharyya

Frequent Co-Authors

Leonard Forbes
Leonard Forbes L. Forbes and Associates LLC
Arup Bhattacharyya
Arup Bhattacharyya Micron (United States)
Salman Akram
Salman Akram Micron (United States)
Wendell P. Noble
Wendell P. Noble Micron (United States)

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