World's Best Scientists 2026 revealed!
Trung T. Doan

Trung T. Doan

D-Index & Metrics

Materials Science

D-Index
76
Citations
17064
World Ranking
3354
National Ranking
33

Trung T. Doan publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Trung T. Doan sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 251 publications — 47th percentile

47% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Trung T. Doan D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Trung T. Doan sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 76 D-Index — 75th percentile

75% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Overview

Trung T. Doan is affiliated with SemiLEDs in Taiwan and conducts research primarily within the field of Engineering. Their work spans multiple subfields including Electrical and Electronic Engineering, Aerospace Engineering, Safety, Risk, Reliability and Quality, Clinical Psychology, and Social Psychology.

The scientist's research topics cover a range of technical and applied areas, notably:

  • Ultra-Wideband Communications Technology
  • Advanced Control and Stabilization in Aerospace Systems
  • Industrial and Mining Safety
  • COVID-19 and Mental Health
  • Mental Health Treatment and Access
  • Health Disparities and Outcomes
  • Speech and Audio Processing

Trung T. Doan has contributed to the following recent papers:

  • Supporting the vulnerable: developing a strategic community mental health response to the COVID-19 pandemic, 2020, Australasian Psychiatry
  • Estimation of Accuracy When Measuring the Coordinates of the Ultra-Wideband Signal Sources in the Presence of Interference, 2024, Radiophysics and Quantum Electronics
  • ESTIMATION OF THE ACCURACY WHEN MEASURING THE COORDINATES OF THE ULTRA-WIDEBAND SIGNAL SOURCES IN THE PRESENCE OF INTERFERENCE, 2024, Izvestiya vysshikh uchebnykh zavedenii Radiofizika
  • Method of estimation of frequency parameters of ultra-wideband signals with an unknown spectrum shape in the presence of interference, 2025, Physics of Wave Processes and Radio Systems

The scientist collaborates frequently with several co-authors, including:

  • P. A. Trifonov
  • Sumana Thomson
  • Dennis Liu
  • Klaus Oliver Schubert
  • Julian Toh

Trung T. Doan's work has been published across various venues, reflecting the interdisciplinary nature of their research:

  • Australasian Psychiatry
  • Radiophysics and Quantum Electronics
  • Izvestiya vysshikh uchebnykh zavedenii Radiofizika
  • Physics of Wave Processes and Radio Systems

Best Publications

  • Semiconductor component sealed on five sides by polymer sealing layer

    Warren M. Farnworth;Alan G. Wood;Trung Tri Doan

  • Chemical vapor deposition technique for depositing titanium silicide on semiconductor wafers

    Trung T. Doan;Gurtej S. Sandhu

  • System for real-time control of semiconductor wafer polishing including optical monitoring

    Gurtej S. Sandhu;Trung Tri Doan

  • System for real-time control of semiconductor wafer polishing

    Gurtej S. Sandhu;Trung Tri Doan

  • Method for controlling a semiconductor (CMP) process by measuring a surface temperature and developing a thermal image of the wafer

    Gurtej S. Sandhu;Trung T. Doan

  • METHOD FOR FORMING SELF-ALIGNING GATE STRUCTURE AROUND COLD-CATHODE EMITTER END USING CHEMICAL AND MECHANICAL POLISHING METHOD

    Doan Trung T;Rolfson J Brett;Lowrey Tyler A;Cathey David A

  • Slurries for chemical mechanically polishing copper containing metal layers

    Chris C. Yu;Trung T. Doan

  • System and method for real-time control of semiconductor a wafer polishing, and a polishing head

    Gurtej S. Sandhu;Trung T. Doan

  • Method to form a low resistant bond pad interconnect

    Trung T. Doan;Mark E. Tuttle

  • METHOD OF FORMING BURIED AND PROJECTED CONDUCTIVE PLUGS IN INSULATING LAYER

    Yu Chris C;Doan Trung T

  • Method for fabricating semiconductor component with thnned substrate having pin contacts

    Alan G. Wood;Trung Tri Doan

  • Method to slope conductor profile prior to dielectric deposition to improve dielectric step-coverage

    Guy T. Blalock;Trung T. Doan

  • Method of endpoint detection during chemical/mechanical planarization of semiconductor wafers

    Gurtej S. Sandhu;Laurence D. Schultz;Trung T. Doan

  • Apparatus for endpoint detection during mechanical planarization of semiconductor wafers

    Gurtej S. Sandhu;Laurence D. Schultz;Trung T. Doan

  • Atomic Layer Deposition Methods

    Trung Tri Doan;Guy T. Blalock;Gurtej S. Sandhu

  • Method to form self-aligned gate structures and focus rings

    Trung T. Doan;Tyler A. Lowrey;David A. Cathey;J. Brett Rolfson

  • System having semiconductor component with multiple stacked dice

    Dean A. Klein;Alan G. Wood;Trung Tri Doan

  • Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces

    Lingyi A. Zheng;Trung T. Doan;Lyle D. Breiner;Er-Xuan Ping

  • Method for packaging semiconductor dice

    Warren M. Farnworth;Alan G. Wood;Trung T. Doan;John O. Jacobson

  • Multiple step method of chemical-mechanical polishing which minimizes dishing

    Trung T. Doan;Chris C. Yu

Frequent Co-Authors

Gurtej S. Sandhu
Gurtej S. Sandhu Micron (United States)
Tyler A. Lowrey
Tyler A. Lowrey Independent Scientist / Consultant, US
Alan G. Wood
Alan G. Wood Micron (United States)
Charles H. Dennison
Charles H. Dennison Intel (United States)
Mark E. Tuttle
Mark E. Tuttle University of Washington
Fernando Gonzalez
Fernando Gonzalez Micron (United States)
David R. Hembree
David R. Hembree Micron (United States)
Dean A. Klein
Dean A. Klein Micron (United States)
Howard E. Rhodes
Howard E. Rhodes Micron (United States)
Pierre C. Fazan
Pierre C. Fazan Micron (United States)

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