The scientist’s investigation covers issues in Optoelectronics, Layer, Dielectric, Electronic engineering and Electrical engineering. His studies deal with areas such as Dynamic random-access memory and Substrate as well as Optoelectronics. His Layer research entails a greater understanding of Composite material.
As a part of the same scientific study, he usually deals with the Dielectric, concentrating on Barrier layer and frequently concerns with Contact resistance. The study incorporates disciplines such as Thin film, Surface area, Semiconductor device and Deposition in addition to Electronic engineering. His study in Electrical engineering is interdisciplinary in nature, drawing from both Dram and Vacuum variable capacitor.
Pierre C. Fazan spends much of his time researching Optoelectronics, Layer, Electrical engineering, Electronic engineering and Dielectric. His work on Dram and Silicon as part of his general Optoelectronics study is frequently connected to Fabrication and Node, thereby bridging the divide between different branches of science. His research integrates issues of Wafer and Oxide in his study of Layer.
His Electrical engineering research is multidisciplinary, incorporating perspectives in Node, Gate dielectric and Memory cell. His Electronic engineering study integrates concerns from other disciplines, such as Semiconductor device, Annealing, Doping and Thin-film transistor. His biological study deals with issues like Titanium, which deal with fields such as Chemical vapor deposition.
His primary scientific interests are in Optoelectronics, Dram, Electrical engineering, Electronic engineering and Metal gate. In general Optoelectronics study, his work on CMOS often relates to the realm of Grain boundary, thereby connecting several areas of interest. His Electrical engineering study combines topics from a wide range of disciplines, such as Body region, Gate dielectric and Memory cell.
His Electronic engineering research includes themes of Annealing, Passivation, Semiconductor, Layer by layer and Fluorine. His High-κ dielectric study incorporates themes from Barrier layer, Oxide, Composite material and Nitride. His Oxide research integrates issues from Layer and Hot-carrier injection.
His main research concerns Electrical engineering, Optoelectronics, Dram, CMOS and PMOS logic. His Electrical engineering research incorporates elements of Etching, Transistor array, Common drain and Lithography. Pierre C. Fazan does research in Optoelectronics, focusing on Silicon on insulator specifically.
His research in CMOS focuses on subjects like Gate equivalent, which are connected to Electronic engineering, Electronic circuit and MOSFET. In his work, Tin and High-κ dielectric is strongly intertwined with Metal gate, which is a subfield of PMOS logic. His Gate oxide study is concerned with Layer in general.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
High dielectric constant capacitor and method of manufacture
Gurtej Sandhu;Pierre Fazan.
(1993)
High dielectric constant capacitor and method of manufacture
Gurtej Sandhu;Pierre Fazan.
(1993)
Chemical vapor deposition using organometallic precursors
Gurtej S. Sandhu;Pierre Fazan.
(2001)
Capacitor compatible with high dielectric constant materials having two independent insulative layers and the method for forming same
Pierre C. Fazan;Gurtej S. Sandhu.
(2002)
Capacitor compatible with high dielectric constant materials having two independent insulative layers and the method for forming same
Pierre C. Fazan;Gurtej S. Sandhu.
(2002)
Process for fabricating a DRAM array having feature widths that transcend the resolution limit of available photolithography
Tyler A. Lowrey;Randal W. Chance;D. Mark Durcan;Ruojia Lee.
(1990)
Process for fabricating a DRAM array having feature widths that transcend the resolution limit of available photolithography
Tyler A. Lowrey;Randal W. Chance;D. Mark Durcan;Ruojia Lee.
(1990)
Method of deposting uniform dielectric film deposition on textured surfaces
Klaus F. Schuegraf;Pierre C. Fazan.
(1998)
Method of deposting uniform dielectric film deposition on textured surfaces
Klaus F. Schuegraf;Pierre C. Fazan.
(1998)
Method for forming a storage cell capacitor compatible with high dielectric constant materials
Pierre C. Fazan;Viju K. Mathews.
(2004)
If you think any of the details on this page are incorrect, let us know.
We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:
Micron (United States)
Intel (United States)
Micron (United States)
Imec
Micron (United States)
National University of Singapore
Independent Scientist / Consultant, US
Ghent University
Micron (United States)
KU Leuven
University of Waterloo
MIT
Arizona State University
Kyoto University
KU Leuven
Austrian Academy of Sciences
Yale University
University of Glasgow
Yale University
University of California, Los Angeles
Federal University of Toulouse Midi-Pyrénées
Southern Cross University
University of Montreal
Harvard University
University of Paris-Saclay
University of Copenhagen