World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
58
Citations
11430
World Ranking
1892
National Ranking
745

David L. Harame publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where David L. Harame sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 344 publications — 66th percentile

66% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

David L. Harame D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where David L. Harame sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 58 D-Index — 74th percentile

74% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2005 - IEEE Daniel E. Noble Award for Emerging Technologies “For the development of manufacturable Silicon Germanium, HBT Bipolar and BiCMOS technologies.”
  • 2003 - IEEE Fellow For contributions to the development of SiGe Heterojunction Bipolar Transistor and BiCMOS technologies.

Overview

David L. Harame is affiliated with IBM in the United States. Their work has been recognized through notable awards related to semiconductor technologies.

Among the awards received, David L. Harame was honored with the IEEE Daniel E. Noble Award for Emerging Technologies in 2005. This award was given for contributions to the development of manufacturable Silicon Germanium (SiGe), Heterojunction Bipolar Transistor (HBT) Bipolar, and BiCMOS technologies. Additionally, Harame was named an IEEE Fellow in 2003 for work on SiGe HBT and BiCMOS technologies.

The primary focus of Harame's research concerns silicon-germanium semiconductor technology and its applications within the field of microelectronics. The contributions relate specifically to the advancement of manufacturable versions of SiGe HBT and BiCMOS technologies, which are key components in high-performance integrated circuits.

No recent publications, co-authors, or specific fields of study were listed. There is also no available data on book publications or frequent publication venues for this researcher.

Best Publications

  • Si/SiGe epitaxial-base transistors. I. Materials, physics, and circuits

    D.L. Harame;J.H. Comfort;J.D. Cressler;E.F. Crabbe

  • Heterojunction bipolar transistors using Si-Ge alloys

    S.S. Iyer;G.L. Patton;J.M.C. Stork;B.S. Meyerson

  • 75-GHz f/sub T/ SiGe-base heterojunction bipolar transistors

    G.L. Patton;J.H. Comfort;B.S. Meyerson;E.F. Crabbe

  • A scalable high-frequency noise model for bipolar transistors with application to optimal transistor sizing for low-noise amplifier design

    S.P. Voinigescu;M.C. Maliepaard;J.L. Showell;G.E. Babcock

  • SiGe-channel heterojunction p-MOSFET's

    S. Verdonckt-Vandebroek;E.F. Crabbe;B.S. Meyerson;D.L. Harame

  • Si/SiGe epitaxial-base transistors. II. Process integration and analog applications

    D.L. Harame;J.H. Comfort;J.D. Cressler;E.F. Crabbe

  • 22nm FDSOI technology for emerging mobile, Internet-of-Things, and RF applications

    R. Carter;J. Mazurier;L. Pirro;J-U. Sachse

  • Current status and future trends of SiGe BiCMOS technology

    D.L. Harame;D.C. Ahlgren;D.D. Coolbaugh;J.S. Dunn

  • Nonequilibrium boron doping effects in low‐temperature epitaxial silicon films

    B. S. Meyerson;F. K. LeGoues;T. N. Nguyen;D. L. Harame

  • A 0.18 /spl mu/m BiCMOS technology featuring 120/100 GHz (f/sub T//f/sub max/) HBT and ASIC-compatible CMOS using copper interconnect

    A. Joseph;D. Coolbaugh;M. Zierak;R. Wuthrich

  • A 22nm FDSOI Technology Optimized for RF/mmWave Applications

    Unknown

  • High-mobility modulation-doped SiGe-channel p-MOSFETs

    S. Verdonckt-Vandebroek;E.F. Crabbe;B.S. Meyerson;D.L. Harame

  • Foundation of rf CMOS and SiGe BiCMOS technologies

    J. S. Dunn;D. C. Ahlgren;D. Coolbaugh;N. B. Feilchenfeld

  • Temperature dependence of Q and inductance in spiral inductors fabricated in a silicon-germanium/BiCMOS technology

    R. Groves;D.L. Harame;D. Jadus

  • Status and Direction of Communication Technologies - SiGe BiCMOS and RFCMOS

    A.J. Joseph;D.L. Harame;B. Jagannathan;D. Coolbaugh

  • Graded-SiGe-base, poly-emitter heterojunction bipolar transistors

    G.L. Patton;D.L. Harame;J.M.C. Stork;B.S. Meyerson

  • A unified approach to RF and microwave noise parameter modeling in bipolar transistors

    G. Niu;J.D. Cressler;Shiming Zhang;W.E. Ansley

  • A 90nm SiGe BiCMOS technology for mm-wave and high-performance analog applications

    John J. Pekarik;J. Adkisson;P. Gray;Q. Liu

  • SiGe heterojunction bipolar transistors and circuits toward terahertz communication applications

    Jae-Sung Rieh;B. Jagannathan;D.R. Greenberg;M. Meghelli

  • Vertical profile optimization of very high frequency epitaxial Si- and SiGe-base bipolar transistors

    E.F. Crabbe;B.S. Meyerson;J.M.C. Stork;D.L. Harame

  • A scalable high frequency noise model for bipolar transistors with application to optimal transistor sizing for low-noise amplifier design

    S.P. Voinigescu;M.C. Maliepaard;M. Schroter;P. Schvan

  • SILICON:GERMANIUM HETEROJUNCTION BIPOLAR TRANSISTORS: FROM EXPERIMENT TO TECHNOLOGY

    B.S. Meyerson;D.L. Harame;J. Stork;E. Crabbe

  • S iGe-Channel Heteroj unc tion p-MOSFET ' s

    Sophie Verdonckt-Vandebroek;Emmanuel F. CrabbC;Bernard S. Meyerson;David L. Harame

Frequent Co-Authors

Bernard S. Meyerson
Bernard S. Meyerson IBM (United States)
Alvin J. Joseph
Alvin J. Joseph GlobalFoundries (United States)
John D. Cressler
John D. Cressler Georgia Institute of Technology
Johannes M. C. Stork
Johannes M. C. Stork ON Semiconductor (United States)
Guofu Niu
Guofu Niu Auburn University
Gregory G. Freeman
Gregory G. Freeman IBM (United States)
David C. Ahlgren
David C. Ahlgren IBM (United States)
Robert A. Groves
Robert A. Groves IBM (United States)
Lawrence E. Larson
Lawrence E. Larson Brown University
Joachim N. Burghartz
Joachim N. Burghartz University of Stuttgart

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