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Jeffrey C. Suhling

Jeffrey C. Suhling

D-Index & Metrics

Mechanical and Aerospace Engineering

D-Index
46
Citations
8952
World Ranking
1431
National Ranking
566

Research.com Recognitions

  • 2009 - Fellow of the American Society of Mechanical Engineers

Overview

Jeffrey C. Suhling is affiliated with Auburn University in the United States and has a research focus primarily in the field of engineering. Their work spans various subfields including electrical and electronic engineering, mechanical engineering, aerospace engineering, mechanics of materials, and automotive engineering.

The scientist's research covers multiple topics with a strong emphasis on electronic packaging and soldering technologies. Other notable topics include 3D IC and TSV technologies, aluminum alloy microstructure properties, intermetallics and advanced alloy properties, aluminum alloys composites properties, advanced welding techniques analysis, and copper interconnects and reliability.

Jeffrey C. Suhling has contributed extensively to several publication venues, with the highest number of publications appearing in the IEEE Transactions on Components Packaging and Manufacturing Technology. Other frequent venues include the 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), the 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), the Journal of Electronic Packaging, and the Journal of Electronic Materials.

Their recent papers reflect research on the mechanical and microstructural properties of solder materials under various conditions. Selected recent publications include:

  • Impact of Mechanical Property Degradation and Intermetallic Compound Formation on Electromigration-Oriented Failure of a Flip-Chip Solder Joint, 2020, Journal of Electronic Materials
  • Mechanical Property Evolution in SAC+Bi Lead-Free Solders Subjected to Various Thermal Exposure Profiles, 2022, 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
  • Microstructural Evolution of Viscoelastic Properties of Underfills Under Sustained High Temperature Operation, 2021, Journal of Electronic Packaging
  • Creep and Microstructure Evolutions in SAC305 Lead Free Solder Subjected to Different Thermal Exposure Profiles, 2022, 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
  • Evolution of SAC305 Mechanical Behavior Due to Damage Accumulation During Cycling, 2022, 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)

Jeffrey C. Suhling frequently collaborates with several researchers, including:

  • Pradeep Lall
  • Ravi Mahajan
  • Alan Huffman
  • K Yokouchi
  • Karlheinz Bock

In recognition of their contributions, they have been awarded the status of Fellow of the American Society of Mechanical Engineers in 2009.

Best Publications

  • A review of mechanical properties of lead-free solders for electronic packaging

    Hongtao Ma;Jeffrey C. Suhling

  • Silicon piezoresistive stress sensors and their application in electronic packaging

    J.C. Suhling;R.C. Jaeger

  • Piezoresistive Stress Sensors for Structural Analysis of Electronic Packages

    D. A. Bittle;J. C. Suhling;R. E. Beaty;R. C. Jaeger

  • The Influence of Elevated Temperature Aging on Reliability of Lead Free Solder Joints

    Hongtao Ma;J.C. Suhling;Yifei Zhang;P. Lall

  • Reliability of the aging lead free solder joint

    Hongtao Ma;J.C. Suhling;P. Lall;M.J. Bozack

  • CMOS stress sensors on [100] silicon

    R.C. Jaeger;J.C. Suhling;R. Ramani;A.T. Bradley

  • Determination of Anand constants for SAC solders using stress-strain or creep data

    Mohammad Motalab;Zijie Cai;Jeffrey C. Suhling;Pradeep Lall

  • Piezoresistive characteristics of short-channel MOSFETs on (100) silicon

    A.T. Bradley;R.C. Jaeger;J.C. Suhling;K.J. O'Connor

  • Models for Reliability Prediction of Fine-Pitch BGAs and CSPs in Shock and Drop-Impact

    P. Lall;D.R. Panchagade;Yueli Liu;R.W. Johnson

  • The effects of aging temperature on SAC solder joint material behavior and reliability

    Yifei Zhang;Zijie Cai;J.C. Suhling;P. Lall

  • Model for BGA and CSP reliability in automotive underhood applications

    P. Lall;M.N. Islam;N. Singh;J.C. Suhling

  • Models for reliability prediction of fine-pitch BGAs and CSPs in shock and drop-impact

    P. Lall;D. Panchagade;Yueli Liu;W. Johnson

  • Reduction of lead free solder aging effects using doped SAC alloys

    Zijie Cai;Yifei Zhang;Jeffrey C. Suhling;Pradeep Lall

  • Evaluation of piezoresistive coefficient variation in silicon stress sensors using a four-point bending test fixture

    R.E. Beaty;R.C. Jaeger;J.C. Suhling;R.W. Johnson

  • Health monitoring for damage initiation & progression during mechanical shock in electronic assemblies

    P. Lall;P. Choudhary;S. Gupte;J. Suhling

  • Errors associated with the design, calibration and application of piezoresistive stress sensors in (100) silicon

    R.C. Jaeger;J.C. Suhling;R. Ramani

  • Failure-Envelope Approach to Modeling Shock and Vibration Survivability of Electronic and MEMS Packaging

    P. Lall;D.R. Panchagade;P. Choudhary;S. Gupte

  • Prognostics and Health Management of Electronic Packaging

    P. Lall;M.N. Islam;M.K. Rahim;J.C. Suhling

  • Improved predictions of lead free solder joint reliability that include aging effects

    Mohammad Motalab;Zijie Cai;Jeffrey C. Suhling;Jiawei Zhang

  • Thermal Aging Effects on the Thermal Cycling Reliability of Lead-Free Fine Pitch Packages

    Jiawei Zhang;Zhou Hai;Sivasubramanian Thirugnanasambandam;John L. Evans

  • The effects of aging on the cyclic stress-strain behavior and hysteresis loop evolution of lead free solders

    Muhannad Mustafa;Zijie Cai;Jeffrey C. Suhling;Pradeep Lall

  • Correlation of reliability models including aging effects with thermal cycling reliability data

    Mohammad Motalab;Muhannad Mustafa;Jeffrey C. Suhling;Jiawei Zhang

  • The effects of SAC alloy composition on aging resistance and reliability

    Yifei Zhang;Zijie Cai;Jeffrey C. Suhling;Pradeep Lall

  • Prognostics and Health Management of Electronics

    P. Lall;M. Hande;C. Bhat;J. Suhling

Frequent Co-Authors

Pradeep Lall
Pradeep Lall Auburn University
Richard C. Jaeger
Richard C. Jaeger Auburn University
Kai Goebel
Kai Goebel Palo Alto Research Center
Bogdan M. Wilamowski
Bogdan M. Wilamowski Auburn University
Ryan J. Lowe
Ryan J. Lowe University of Western Australia
Robert L. Jackson
Robert L. Jackson Auburn University
Song-Yul Choe
Song-Yul Choe Auburn University
Guofu Niu
Guofu Niu Auburn University
Jay Lee
Jay Lee University of Maryland, College Park
Herbert Reichl
Herbert Reichl Fraunhofer Society

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