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Sampath Purushothaman

Sampath Purushothaman

D-Index & Metrics

Materials Science

D-Index
52
Citations
10807
World Ranking
9506
National Ranking
2300

Overview

Sampath Purushothaman is affiliated with IBM in the United States. Their research spans multiple areas within materials science and engineering, particularly focusing on supercapacitor materials, advanced battery technologies, and copper-based nanomaterials.

The main fields of study for this researcher include:

  • Materials Science
  • Engineering

Their work also extends to several subfields, which are:

  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Electronic, Optical and Magnetic Materials
  • Polymers and Plastics

Key research topics addressed by Sampath Purushothaman include:

  • Supercapacitor Materials and Fabrication
  • Advanced battery technologies research
  • Copper-based nanomaterials and applications
  • Conducting polymers and applications
  • ZnO doping and properties
  • Gas Sensing Nanomaterials and Sensors

Several publications reflect this focus. Notable recent papers are:

  • Cu2O nanosheets decorated CuMnO2 nanosphere electrodeposited on Cu foil as high-performance supercapacitor electrode, 2020, Materials Science in Semiconductor Processing
  • In-situ fabrication of sulphur decorated elongated cuboctahedron shaped Mn3O4 as high-performance active charge storage material for supercapacitor application, 2021, Surface and Coatings Technology
  • Synthesis and characterization of Ag-ZnO nanocomposites, 2025, Journal of Optoelectronic and Biomedical Materials

Frequent co-authors collaborating with Sampath Purushothaman include:

  • K. Jeyasubramanian
  • G.S. Hikku
  • M. Muthuselvi
  • H Bouguessir
  • L. S. Chuah

Their research has been published in multiple venues such as:

  • Materials Science in Semiconductor Processing
  • Surface and Coatings Technology
  • Journal of Optoelectronic and Biomedical Materials

Best Publications

  • Low-Voltage Organic Transistors on Plastic Comprising High-Dielectric Constant Gate Insulators

    C. D. Dimitrakopoulos;S. Purushothaman;J. Kymissis;A. Callegari

  • Atomic-beam alignment of inorganic materials for liquid-crystal displays

    P. Chaudhari;James Lacey;James Doyle;Eileen Galligan

  • High-performance bottom electrode organic thin-film transistors

    I. Kymissis;C.D. Dimitrakopoulos;S. Purushothaman

  • Liquid crystal alignment on carbonaceous surfaces with orientational order.

    J. Stöhr;M. G. Samant;J. Lüning;A. C. Callegari

  • Method of forming closed air gap interconnects and structures formed thereby

    Matthew E Colburn;Timothy J Dalton;Elbert Huang;Satya V Nitta

  • Chip interconnect wiring structure with low dielectric constant insulator and methods for fabricating the same

    Leena P. Buchwalter;Alessandro Cesare Callegari;Stephan Alan Cohen;Teresita Ordonez Graham

  • Field-effect transistors comprising molecular beam deposited α,ω-di-hexyl-hexathienylene and polymeric insulator

    Christos D. Dimitrakopoulos;Bruce K. Furman;Teresita Graham;Suryanarayan Hegde

  • Multilayer interconnect structure containing air gaps and method for making

    Katherina E. Babich;Roy Arthur Carruthers;Timothy Joseph Dalton;Alfred Grill

  • Electrical integrity of state-of-the-art 0.13 /spl mu/m SOI CMOS devices and circuits transferred for three-dimensional (3D) integrated circuit (IC) fabrication

    K.W. Guarini;A.W. Topol;M. Ieong;R. Yu

  • Wafer-level 3D integration technology

    S. J. Koester;A. M. Young;R. R. Yu;S. Purushothaman

  • Sputter deposition of hydrogenated amorphous carbon film and applications thereof

    Edward D. Babich;Alessandro Cesare Callegari;Fuad Elias Doany;Sampath Purushothaman

  • Layer transfer process and functionally enhanced integrated circuits produced thereby

    Bruce K. Furman;Sampath Purushothaman;Muthumanickam Sankarapandian;Anna Topol

  • Low-Voltage, High-Mobility Pentacene Transistors with Solution-Processed High Dielectric Constant Insulators

    C. D. Dimitrakopoulos;I. Kymissis;S. Purushothaman;D. A. Neumayer

  • METHOD OF PE-ALD OF SiNxCy AND INTEGRATION OF LINER MATERIALS ON POROUS LOW K SUBSTRATES

    Andrew J. Kellock;Hyungjun Kim;Dae-Gyu Park;Satyanarayana V. Nitta

  • Methods to mitigate plasma damage in organosilicate dielectrics using a protective sidewall spacer

    John C. Arnold;Sampath Purushothaman;Muthumanickam Sankarapandian;Hosadurga K. Shobha

  • Interfacial reactions during soldering with lead-tin eutectic and lead (Pb)-free, tin-rich solders

    S. K. Kang;R. S. Rai;S. Purushothaman

  • Fabrication of thin film effect transistor comprising an organic semiconductor and chemical solution deposited metal oxide gate dielectric

    Christos Dimitrios Dimitrakopoulos;Peter Richard Duncombe;Bruce K. Furman;Robert B. Laibowitz

  • Techniques for Layer Transfer Processing

    Stephen W. Bedell;Keith Edward Fogel;Bruce Kenneth Furman;Sampath Purushothaman

  • Method for improving performance of organic semiconductors in bottom electrode structure

    Christos Dimitrios Dimitrakopoulos;Ioannis Kymissis;Sampath Purushothaman

  • Method of forming multilevel interconnect structure containing air gaps including utilizing both sacrificial and placeholder material

    Alfred Grill;Jeffrey Curtis Hedrick;Christopher Vincent Jahnes;Satyanarayana Venkata Nitta

Frequent Co-Authors

Fuad E. Doany
Fuad E. Doany IBM (United States)
Christos D. Dimitrakopoulos
Christos D. Dimitrakopoulos University of Massachusetts Amherst
Matthew E. Colburn
Matthew E. Colburn Facebook (United States)
Willi Volksen
Willi Volksen IBM (United States)
Steven J. Koester
Steven J. Koester University of Minnesota
Robert D. Miller
Robert D. Miller Stanford University
Katherine L. Saenger
Katherine L. Saenger Auburn University
Mahesh G. Samant
Mahesh G. Samant IBM (United States)
Alshakim Nelson
Alshakim Nelson University of Washington
Christopher V. Jahnes
Christopher V. Jahnes IBM (United States)

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