World's Best Scientists 2026 revealed!

D-Index & Metrics

Discipline name D-Index World Ranking National Ranking Publications Citations
Electronics and Electrical Engineering 36 5348 1847 129 5375

Qi Xiang publications per year

The chart shows the history of publications by Qi Xiang between 1997 and 2010, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Qi Xiang published across 14 years, from 1997 to 2010, averaging 9.6 papers a year. Output peaked at 36 publications in 2003. 2 of the 135 publications appeared in the last two years.

No. of publications
10 20 30
Bar chart. Horizontal axis: year, 1997 to 2010. Vertical axis: number of publications, 0 to 36. Peak 36 publications in 2003. 1997: 1 publication 1998: 9 publications 1999: 11 publications 2000: 16 publications 2001: 20 publications 2002: 24 publications 2003: 36 publications 2004: 13 publications 2005: 1 publication 2006: 1 publication 2007: 0 publications 2008: 1 publication 2009: 1 publication 2010: 1 publication
1997 2010

135 publications in total across all disciplines

View publications per year as a table
Qi Xiang: publications per year, 1997 to 2010
Year Publications
1997 1
1998 9
1999 11
2000 16
2001 20
2002 24
2003 36
2004 13
2005 1
2006 1
2007 0
2008 1
2009 1
2010 1
Total 135
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Qi Xiang publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Qi Xiang sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 114–133 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 129 publications — 9th percentile

9% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269 129
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431
234–253 399
254–273 366
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Qi Xiang D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Qi Xiang sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 36 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 36 D-Index — 24th percentile

24% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211 36
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
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Overview

What is he best known for?

The fields of study he is best known for:

  • Semiconductor
  • Silicon
  • Integrated circuit

His main research concerns Optoelectronics, Gate oxide, Electronic engineering, Layer and Gate dielectric. Qi Xiang combines subjects such as Transistor, MOSFET, Semiconductor device and Electrical engineering with his study of Optoelectronics. His research on Gate oxide focuses in particular on Metal gate.

He interconnects PMOS logic and Silicon in the investigation of issues within Electronic engineering. His research in Layer intersects with topics in High-κ dielectric and Oxide. Qi Xiang works mostly in the field of Gate dielectric, limiting it down to topics relating to Dielectric and, in certain cases, Wafer, Plating and NMOS logic.

His most cited work include:

  • FinFET scaling to 10 nm gate length (507 citations)
  • Formation of well-controlled thin SiO, SiN, SiON layer for multilayer high-K dielectric applications (177 citations)
  • Method for forming a thin, high quality buffer layer in a field effect transistor and related structure (156 citations)

What are the main themes of his work throughout his whole career to date?

Optoelectronics, Electronic engineering, Gate oxide, MOSFET and Layer are his primary areas of study. His Optoelectronics research is multidisciplinary, incorporating elements of Semiconductor device, Substrate, Gate dielectric, Strained silicon and Electrical engineering. His Electronic engineering study combines topics from a wide range of disciplines, such as Silicon on insulator, Silicide, Silicon, Dopant and Transistor.

Qi Xiang has researched Gate oxide in several fields, including Annealing and Copper interconnect. His MOSFET study integrates concerns from other disciplines, such as Threshold voltage, Ion implantation, Electron mobility and Leakage. His Layer research is multidisciplinary, incorporating perspectives in Semiconductor materials, Oxide and Metal.

He most often published in these fields:

  • Optoelectronics (92.37%)
  • Electronic engineering (48.85%)
  • Gate oxide (37.40%)

What were the highlights of his more recent work (between 2002-2009)?

  • Optoelectronics (92.37%)
  • Electronic engineering (48.85%)
  • MOSFET (32.82%)

In recent papers he was focusing on the following fields of study:

His scientific interests lie mostly in Optoelectronics, Electronic engineering, MOSFET, Strained silicon and Gate oxide. His Optoelectronics research integrates issues from Layer, Substrate and Transistor. His studies in Electronic engineering integrate themes in fields like Monocrystalline silicon, Dopant and Oxide thin-film transistor.

MOSFET is a subfield of Electrical engineering that Qi Xiang explores. His study in Strained silicon is interdisciplinary in nature, drawing from both Silicon, Germanium, Trench, Silicon carbide and Semiconductor. His studies deal with areas such as Ion implantation, Gate dielectric and Atomic layer deposition as well as Gate oxide.

Between 2002 and 2009, his most popular works were:

  • Method for forming a thin, high quality buffer layer in a field effect transistor and related structure (156 citations)
  • Shallow trench isolation (STI) region with high-K liner and method of formation (105 citations)
  • Mosfets incorporating nickel germanosilicided gate and methods of their formation (100 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Integrated circuit
  • Silicon

Qi Xiang mainly focuses on Optoelectronics, Gate oxide, MOSFET, Strained silicon and Silicon-germanium. His work carried out in the field of Optoelectronics brings together such families of science as Electronic engineering, Substrate and Electrical engineering. His research in Substrate intersects with topics in Field-effect transistor and Transistor.

His research integrates issues of Trench, Gate dielectric and Semiconductor in his study of Gate oxide. He has included themes like Silicide and Nickel in his MOSFET study. His Silicon-germanium study also includes fields such as

  • Epitaxy together with LOCOS and Oxide,
  • Electron mobility, which have a strong connection to Leakage, Inverter, Ring oscillator and CMOS.

Best Publications

  • FinFET scaling to 10 nm gate length

    Bin Yu;Leland Chang;S. Ahmed;Haihong Wang

  • Formation of well-controlled thin SiO, SiN, SiON layer for multilayer high-K dielectric applications

    Eric N. Paton;Qi Xiang;Bin Yu

  • Normal bigri FET having improved carrier mobility and method of its formation

    Haihong Wang;Qi Xiang

  • Method for forming a thin, high quality buffer layer in a field effect transistor and related structure

    Joong S. Jeon;Robert B. Clark-Phelps;Qi Xiang;Huicai Zhong

  • CMOS optimization method utilizing sacrificial sidewall spacer

    Geoffrey Choh-Fei Yeap;Qi Xiang;Ming-Ren Lin

  • Strained silicon PMOS having silicon germanium source/drain extensions and method for its fabrication

    Qi Xiang;Eric N. Paton;HaiHong Wang

  • Enhanced electroless deposition of dielectric precursor materials for use in in-laid gate MOS transistors

    Matthew S. Buynoski;Paul R. Besser;Paul L. King;Eric N. Paton

  • 15 nm gate length planar CMOS transistor

    Bin Yu;Haihong Wang;A. Joshi;Qi Xiang

  • Process for fabricating a semiconductor device component using a selective silicidation reaction

    Qi Xiang;Scott Allan Bell;Chih-Yuh Yang

  • SOI device with metal source/drain and method of fabrication

    Zoran Krivokapic;Qi Xiang;Bin Yu

  • MOSFETs with differing gate dielectrics and method of formation

    Bin Yu;Qi Xiang;Olov Karlsson;HaiHong Wang

  • Formation of finFET using a sidewall epitaxial layer

    Witold P. Maszara;Jung-Suk Goo;James N. Pan;Qi Xiang

  • Damascene NiSi metal gate high-k transistor

    Qi Xiang;Paul R. Besser;Matthew S. Buynoski;John C. Foster

  • Limits of gate-oxide scaling in nano-transistors

    Bin Yu;Haihong Wang;C. Riccobene;Qi Xiang

  • Method of manufacturing a semiconductor device with supersaturated source/drain extensions and metal silicide contacts

    George Jonathan Kluth;Qi Xiang

  • Scalability of strained-Si nMOSFETs down to 25 nm gate length

    Jung-Suk Goo;Qi Xiang;Y. Takamura;Haihong Wang

  • Strained fully depleted silicon on insulator semiconductor device and manufacturing method therefor

    Qi Xiang;Niraj Subba;Witold P. Maszara;Zoran Krivokapic

  • Process for forming fully silicided gates

    Qi Xiang;Ercan Adem;Jacques J. Bertrand;Paul R. Besser

  • Strained silicon NMOS with nickel-silicide metal gate

    Qi Xiang;Jung-Suk Goo;J. Pan;Bin Yu

  • 70 nm MOSFET with ultra-shallow, abrupt, and super-doped S/D extension implemented by laser thermal process (LTP)

    Bin Yu;Yun Wang;Haihong Wang;Qi Xiang

Frequent Co-Authors

Bin Yu
Bin Yu Southeast University
Minh Van Ngo
Minh Van Ngo Advanced Micro Devices (United States)
Zoran Krivokapic
Zoran Krivokapic GlobalFoundries (United States)
Jeffrey Bokor
Jeffrey Bokor University of California, Berkeley
Leland Chang
Leland Chang IBM Research - Thomas J. Watson Research Center
Chenming Hu
Chenming Hu University of California, Berkeley
Sergey D. Lopatin
Sergey D. Lopatin Applied Materials (United States)
Tsu-Jae King
Tsu-Jae King University of California, Berkeley
Sanjay K. Banerjee
Sanjay K. Banerjee The University of Texas at Austin
Matthew T. Currie
Matthew T. Currie Morgan, Lewis & Bockius LLP

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