His main research concerns Optoelectronics, Gate oxide, Electronic engineering, Layer and Gate dielectric. Qi Xiang combines subjects such as Transistor, MOSFET, Semiconductor device and Electrical engineering with his study of Optoelectronics. His research on Gate oxide focuses in particular on Metal gate.
He interconnects PMOS logic and Silicon in the investigation of issues within Electronic engineering. His research in Layer intersects with topics in High-κ dielectric and Oxide. Qi Xiang works mostly in the field of Gate dielectric, limiting it down to topics relating to Dielectric and, in certain cases, Wafer, Plating and NMOS logic.
Optoelectronics, Electronic engineering, Gate oxide, MOSFET and Layer are his primary areas of study. His Optoelectronics research is multidisciplinary, incorporating elements of Semiconductor device, Substrate, Gate dielectric, Strained silicon and Electrical engineering. His Electronic engineering study combines topics from a wide range of disciplines, such as Silicon on insulator, Silicide, Silicon, Dopant and Transistor.
Qi Xiang has researched Gate oxide in several fields, including Annealing and Copper interconnect. His MOSFET study integrates concerns from other disciplines, such as Threshold voltage, Ion implantation, Electron mobility and Leakage. His Layer research is multidisciplinary, incorporating perspectives in Semiconductor materials, Oxide and Metal.
His scientific interests lie mostly in Optoelectronics, Electronic engineering, MOSFET, Strained silicon and Gate oxide. His Optoelectronics research integrates issues from Layer, Substrate and Transistor. His studies in Electronic engineering integrate themes in fields like Monocrystalline silicon, Dopant and Oxide thin-film transistor.
MOSFET is a subfield of Electrical engineering that Qi Xiang explores. His study in Strained silicon is interdisciplinary in nature, drawing from both Silicon, Germanium, Trench, Silicon carbide and Semiconductor. His studies deal with areas such as Ion implantation, Gate dielectric and Atomic layer deposition as well as Gate oxide.
Qi Xiang mainly focuses on Optoelectronics, Gate oxide, MOSFET, Strained silicon and Silicon-germanium. His work carried out in the field of Optoelectronics brings together such families of science as Electronic engineering, Substrate and Electrical engineering. His research in Substrate intersects with topics in Field-effect transistor and Transistor.
His research integrates issues of Trench, Gate dielectric and Semiconductor in his study of Gate oxide. He has included themes like Silicide and Nickel in his MOSFET study. His Silicon-germanium study also includes fields such as
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FinFET scaling to 10 nm gate length
Bin Yu;Leland Chang;S. Ahmed;Haihong Wang.
international electron devices meeting (2002)
FinFET scaling to 10 nm gate length
Bin Yu;Leland Chang;S. Ahmed;Haihong Wang.
international electron devices meeting (2002)
Formation of well-controlled thin SiO, SiN, SiON layer for multilayer high-K dielectric applications
Eric N. Paton;Qi Xiang;Bin Yu.
(2002)
Formation of well-controlled thin SiO, SiN, SiON layer for multilayer high-K dielectric applications
Eric N. Paton;Qi Xiang;Bin Yu.
(2002)
Normal bigri FET having improved carrier mobility and method of its formation
Haihong Wang;Qi Xiang.
(2009)
Normal bigri FET having improved carrier mobility and method of its formation
Haihong Wang;Qi Xiang.
(2009)
Method for forming a thin, high quality buffer layer in a field effect transistor and related structure
Joong S. Jeon;Robert B. Clark-Phelps;Qi Xiang;Huicai Zhong.
(2004)
Method for forming a thin, high quality buffer layer in a field effect transistor and related structure
Joong S. Jeon;Robert B. Clark-Phelps;Qi Xiang;Huicai Zhong.
(2004)
CMOS optimization method utilizing sacrificial sidewall spacer
Geoffrey Choh-Fei Yeap;Qi Xiang;Ming-Ren Lin.
(1998)
CMOS optimization method utilizing sacrificial sidewall spacer
Geoffrey Choh-Fei Yeap;Qi Xiang;Ming-Ren Lin.
(1998)
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