World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
36
Citations
4347
World Ranking
5412
National Ranking
1865

Materials Science

D-Index
45
Citations
5411
World Ranking
11882
National Ranking
2749

Minh Van Ngo publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Minh Van Ngo sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 218 publications — 35th percentile

35% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Minh Van Ngo D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Minh Van Ngo sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 36 D-Index — 24th percentile

24% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Minh Van Ngo is affiliated with Advanced Micro Devices in the United States, focusing primarily on engineering research. Their work encompasses several specialized subfields within engineering, including electrical and electronic engineering, aerospace engineering, and control and systems engineering.

Their research contributions are notably centered around topics related to wind energy and control systems. Key themes in their work include:

  • Wind Turbine Control Systems
  • Wind Energy Research and Development
  • Real-time Simulation and Control Systems

Minh Van Ngo has collaborated frequently with Bao The Nguyen and Huy Gia Ngo, among others, indicating a pattern of cooperative research engagements within their area of expertise.

Best Publications

  • Methods for improving carrier mobility of PMOS and NMOS devices

    William George En;Angela Hui;Minh Van Ngo

  • Preparation of composite high-K / standard-K dielectrics for semiconductor devices

    Arvind Halliyal;Joong S. Jeon;Minh Van Ngo;Robert B. Ogle

  • Process for fabricating semiconductor memory device with high data retention including silicon nitride etch stop layer formed at high temperature with low hydrogen ion concentration

    Minh Van Ngo;Sunil Mehta

  • Mosfets incorporating nickel germanosilicided gate and methods of their formation

    Eric N. Paton;Qi Xiang;Paul R. Besser;Ming-Ren Lin

  • Method of forming copper sulfide for memory cell

    Minh Van Ngo;Sergey D. Lopatin;Suzette K. Pangrle;Nicholas H. Tripsas

  • Process for reducing copper oxide during integrated circuit fabrication

    Minh Van Ngo;Guarionex Morales;Takeshi Nogami

  • Use of sic for preventing copper contamination of dielectric layer

    Lu You;Fei Wang;Minh Van Ngo

  • Spin on polymers for organic memory devices

    Jane V. Oglesby;Christopher F. Lyons;Ramkumar Subramanian;Angela T. Hui

  • Method of forming reliable capped copper interconnects

    Minh Van Ngo;Shekhar Pramanick;Takeshi Nogami

  • Integrated plasma etch of gate and gate dielectric and low power plasma post gate etch removal of high-K residual

    Chih-Yuh Yang;Minh Van Ngo

  • Engineered metal gate electrode

    James N. Pan;Paul R. Besser;Christy Woo;Minh Van Ngo

  • Method of forming low resistance vias

    Minh Van Ngo;Robert A Huertas;Drawn Hopper

  • Protection of low-k ILD during damascene processing with thin liner

    Minh Van Ngo;Christy Mei-Chu Woo;Steven C. Avanzino;John E. Sanchez

  • Tensile strained substrate

    Minh V. Ngo;Paul R. Besser;Ming Ren Lin;HaiHong Wang

  • Copper interconnect with improved electromigration resistance

    Minh Van Ngo;Shekhar Pramanick;Takeshi Nogami

  • Method of reducing incidence of stress-induced voiding in semiconductor interconnect lines

    Suzette K. Pangrle;Paul R. Besser;Minh Van Ngo

  • Process for forming fully silicided gates

    Qi Xiang;Ercan Adem;Jacques J. Bertrand;Paul R. Besser

  • Gate array with multiple dielectric properties and method for forming same

    William G. En;Arvind Halliyal;Minh-Ren Lin;Minh Van Ngo

  • Nitrogen-plasma treatment for reduced nickel silicide bridging

    Minh Van Ngo;Christy Mei-Chu Woo;Paul R. Besser;Robert A. Huertas

  • Laser thermal annealing of silicon nitride for increased density and etch selectivity

    Minh Van Ngo;Angela Hui

Frequent Co-Authors

Sergey D. Lopatin
Sergey D. Lopatin Applied Materials (United States)
Qi Xiang
Qi Xiang Xilinx (United States)
Mark I. Gardner
Mark I. Gardner Micron Technology
Zoran Krivokapic
Zoran Krivokapic GlobalFoundries (United States)
Bin Yu
Bin Yu Southeast University

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Related Online Degrees & Career Pathways

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