Taiwan Semiconductor Manufacturing Company (United States)
United States
His scientific interests lie mostly in Optoelectronics, Semiconductor, Nanotechnology, Field-effect transistor and Germanium. Optoelectronics and Epitaxy are frequently intertwined in his study. His Epitaxy research incorporates elements of Chemical vapor deposition and Aspect ratio.
Anthony J. Lochtefeld focuses mostly in the field of Semiconductor, narrowing it down to topics relating to Lattice and, in certain cases, Dielectric layer, Semiconductor materials, Threading dislocations, Semiconductor heterostructures and Semiconductor device. As part of his studies on Field-effect transistor, Anthony J. Lochtefeld often connects relevant subjects like Substrate. His Germanium study is associated with Silicon.
Anthony J. Lochtefeld spends much of his time researching Optoelectronics, Semiconductor, Silicon, Substrate and Semiconductor device. His Optoelectronics research is multidisciplinary, relying on both Trench and Epitaxy. His Semiconductor research incorporates themes from Layer, Nanotechnology, Heterojunction, Lattice and Insulator.
His work deals with themes such as Electron mobility, Substrate and Dislocation, which intersect with Silicon. His research on Substrate frequently links to adjacent areas such as Field-effect transistor. His research in Semiconductor device tackles topics such as Photodetector which are related to areas like Hybrid silicon laser.
Optoelectronics, Semiconductor device, Silicon, Photodetector and Photonics are his primary areas of study. His studies deal with areas such as Substrate, Compound semiconductor and Dislocation as well as Optoelectronics. His Substrate study incorporates themes from Hybrid silicon laser and Semiconductor sensor.
The concepts of his Dislocation study are interwoven with issues in Crystal and Micron size. Many of his studies on Silicon involve topics that are commonly interrelated, such as Substrate. Anthony J. Lochtefeld interconnects Dram and Shallow trench isolation in the investigation of issues within Semiconductor.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors
Minjoo L. Lee;Eugene A. Fitzgerald;Mayank T. Bulsara;Matthew T. Currie.
Journal of Applied Physics (2005)
Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same
Matthew T. Currie;Anthony J. Lochtefeld;Richard Hammond;Eugene A. Fitzgerald.
(2002)
Strained-semiconductor-on-insulator device structures
Anthony Lochtefeld;Thomas Langdo;Richard Hammond;Matthew Currie.
(2003)
Methods of Forming Strained-Semiconductor-on-Insulator Device Structures
Thomas A. Langdo;Matthew T. Currie;Richard Hammond;Anthony J. Lochtefeld.
(2005)
Lattice-Mismatched Semiconductor Structures with Reduced Dislocation Defect Densities and Related Methods for Device Fabrication
Anthony J. Lochtefeld;Matthew T. Currie;Zhiyuan Cheng;James Fiorenza.
(2006)
High quality Ge on Si by epitaxial necking
T. A. Langdo;C. W. Leitz;M. T. Currie;E. A. Fitzgerald.
Applied Physics Letters (2000)
Defect reduction of selective Ge epitaxy in trenches on Si(001) substrates using aspect ratio trapping
J.-S. Park;J. Bai;M. Curtin;B. Adekore.
Applied Physics Letters (2007)
Tri-gate field-effect transistors formed by aspect ratio trapping
Anthony J. Lochtefeld.
(2007)
Shallow trench isolation process
Matthew T. Currie;Anthony J. Lochtefeld.
(2004)
On experimental determination of carrier velocity in deeply scaled NMOS: how close to the thermal limit?
A. Lochtefeld;D.A. Antoniadis.
IEEE Electron Device Letters (2001)
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