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Materials Science

D-Index
74
Citations
17766
World Ranking
3687
National Ranking
1009

Research.com Recognitions

  • 1994 - Fellow of the American Association for the Advancement of Science (AAAS)
  • 1962 - Fellow of American Physical Society (APS)

Overview

Wolfgang J. Choyke is affiliated with the University of Pittsburgh in the United States. Their research primarily focuses on materials science and engineering, with particular attention to fields such as Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, and Materials Chemistry.

The main topics addressed in Wolfgang J. Choyke's work include:

  • Silicon Carbide Semiconductor Technologies
  • Ga2O3 and related materials
  • ZnO doping and properties

One recent publication by Wolfgang J. Choyke is titled "Band structure properties, phonons, and exciton fine structure in 4H-SiC measured by wavelength-modulated absorption and low-temperature photoluminescence," published in 2020 in Physical Review B.

Frequent co-authors in Wolfgang J. Choyke's research include:

  • Walter M. Klahold
  • Robert P. Devaty

Their work has appeared in the journal Physical Review B, reflecting a focus on condensed matter physics and materials science.

Wolfgang J. Choyke has received several professional honors including:

  • Fellow of the American Association for the Advancement of Science (AAAS), awarded in 1994
  • Fellow of American Physical Society (APS), awarded in 1962

Best Publications

  • Silicon carbide : recent major advances

    W. J. Choyke;弘之 松波;G. Pensl

  • Deep Defect Centers in Silicon Carbide Monitored with Deep Level Transient Spectroscopy

    T. Dalibor;G. Pensl;H. Matsunami;T. Kimoto

  • Phonon Dispersion Curves by Raman Scattering in SiC, Polytypes 3 C , 4 H , 6 H , 1 5 R , and 2 1 R

    Unknown

  • An investigation of the properties of cubic GaN grown on GaAs by plasma-assisted molecular-beam epitaxy

    S. Strite;J. Ruan;Z. Li;A. Salvador

  • Electrical and optical characterization of SiC

    G. Pensl;W.J. Choyke

  • Comparative electron spectroscopic studies of surface segregation on SiC(0001) and SiC(0001̄)

    L. Muehlhoff;W. J. Choyke;M. J. Bozack;John T. Yates

  • Physical Properties of SiC

    Unknown

  • Adsorption and thermal behavior of ethylene on Si(100)-(2 × 1)

    L. Clemen;R.M. Wallace;P.A. Taylor;M.J. Dresser

  • Nitrogen donors in 4H‐silicon carbide

    W. Götz;A. Schöner;G. Pensl;W. Suttrop

  • Raman scattering studies of chemical-vapor-deposited cubic SiC films of (100) Si

    Z. C. Feng;A. J. Mascarenhas;W. J. Choyke;J. A. Powell

  • Static Dielectric Constant of SiC

    Unknown

  • Optical Properties of Cubic SiC: Luminescence of Nitrogen-Exciton Complexes, and Interband Absorption

    Unknown

  • Field effect in epitaxial graphene on a silicon carbide substrate

    Gong Gu;Shu Nie;Randall M. Feenstra;R. P. Devaty

  • Hall effect and infrared absorption measurements on nitrogen donors in 6H‐silicon carbide

    W. Suttrop;G. Pensl;W. J. Choyke;R. Stein

  • Adsorption and decomposition of acetylene on Si(100)-(2×1)

    P. A. Taylor;R. M. Wallace;C. C. Cheng;W. H. Weinberg

  • Controlled growth of 3C‐SiC and 6H‐SiC films on low‐tilt‐angle vicinal (0001) 6H‐SiC wafers

    J. A. Powell;J. B. Petit;J. H. Edgar;I. G. Jenkins

  • Defects in SiO 2 as the possible origin of near interface traps in the SiC ∕ SiO 2 system: A systematic theoretical study

    J. Knaup;P. Deák;Th. Frauenheim;Ádám Gali

  • Low‐temperature photoluminescence studies of chemical‐vapor‐deposition‐grown 3C‐SiC on Si

    W. J. Choyke;Z. C. Feng;J. A. Powell

  • Theoretical study of the mechanism of dry oxidation of 4H-SiC

    Jan M. Knaup;Peter Deák;Thomas Frauenheim;Adam Gali

  • The Adsorption and Decomposition of NH3 on Si(100) - Detection of the NH2(a) Species

    M.J. Dresser;P.A. Taylor;R.M. Wallace;W.J. Choyke

  • Direct determination of absolute monolayer coverages of chemisorbed C2H2 and C2H4 on Si(100)

    C. C. Cheng;R. M. Wallace;P. A. Taylor;W. J. Choyke

  • Raman Scattering in 6H SiC

    Unknown

  • Penetration depths in the ultraviolet for 4H, 6H and 3C silicon carbide at seven common laser pumping wavelengths

    S.G Sridhara;T.J Eperjesi;R.P Devaty;W.J Choyke

  • Growth of high quality 6H-SiC epitaxial films on vicinal (0001) 6H-SiC wafers

    J. A. Powell;D. J. Larkin;L. G. Matus;W. J. Choyke

  • Photoluminescence and transport studies of boron in 4H SiC

    S. G. Sridhara;L. L. Clemen;R. P. Devaty;W. J. Choyke

  • EXCITON RECOMBINATION RADIATION AND PHONON SPECTRUM OF 6H SiC

    Unknown

Frequent Co-Authors

Gerhard Pensl
Gerhard Pensl University of Erlangen-Nuremberg
Adam Gali
Adam Gali Budapest University of Technology and Economics
Tsunenobu Kimoto
Tsunenobu Kimoto Kyoto University
Erik Janzén
Erik Janzén Linköping University
Takeshi Ohshima
Takeshi Ohshima Japan Atomic Energy Agency
Nguyen Tien Son
Nguyen Tien Son Linköping University
Zdenek Dohnalek
Zdenek Dohnalek Pacific Northwest National Laboratory
Robert M. Wallace
Robert M. Wallace The University of Texas at Dallas
Ulrich Starke
Ulrich Starke Max Planck Society
Randall M. Feenstra
Randall M. Feenstra Carnegie Mellon University

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