World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
43
Citations
6520
World Ranking
3957
National Ranking
63

Best Publications

  • Divacancy acceptor levels in ion-irradiated silicon.

    Unknown

  • Lifetime in proton irradiated silicon

    Unknown

  • GENERATION OF VACANCY-TYPE POINT DEFECTS IN SINGLE COLLISION CASCADES DURING SWIFT-ION BOMBARDMENT OF SILICON

    B. G. Svensson;C. Jagadish;A. Hallén;J. Lalita

  • Annealing kinetics of vacancy-related defects in low-dose MeV self-ion-implanted n-type silicon

    P Pellegrino;P Leveque;J Lalita;A Hallen

  • Pseudodonor nature of the DI defect in 4H-SiC

    L. Storasta;F. H. C. Carlsson;S. G. Sridhara;J. P. Bergman

  • Effects of implantation temperature on damage accumulation in Al-implanted 4H-SiC

    Yanwen Zhang;William J. Weber;Weilin Jiang;Chong M. Wang

  • Helium entrapment in a nanostructured ferritic alloy

    Philip D Edmondson;Chad M Parish;Yanwen Zhang;Anders Hallen

  • Electrically active defects in irradiated 4H-SiC

    M. L. David;G. Alfieri;E. M. Monakhov;Anders. Hallén

  • Damage evolution and recovery on both Si and C sublattices in Al-implanted 4H–SiC studied by Rutherford backscattering spectroscopy and nuclear reaction analysis

    Yanwen Zhang;William J. Weber;Weilin Jiang;Anders Hallen

  • Bandgap widening in thermochromic Mg-doped VO2 thin films: Quantitative data based on optical absorption

    Shu-Yi Li;Nuru R. Mlyuka;Daniel Primetzhofer;Anders Hallén

  • Formation of a double acceptor center during divacancy annealing in low-doped high-purity oxygenated Si

    Unknown

  • Nitrogen deactivation by implantation-induced defects in 4H-SiC epitaxial layers

    D. Aberg;Anders. Hallén;P. Pellegrino;B. G. Svensson

  • New beam line for time-of-flight medium energy ion scattering with large area position sensitive detector.

    M. K. Linnarsson;A. Hallen;Jonas Åström;Daniel Primetzhofer

  • Ion implantation of silicon carbide

    A Hallén;M.S Janson;A.Yu Kuznetsov;D Åberg

  • Elimination of carbon vacancies in 4H-SiC employing thermodynamic equilibrium conditions at moderate temperatures

    H. M. Ayedh;R. Nipoti;Anders Hallén;B. G. Svensson

  • Defect energy levels in hydrogen-implanted and electron-irradiated n-type 4H silicon carbide

    G. Alfieri;E. V. Monakhov;B. G. Svensson;Anders. Hallén

  • Deep level transient spectroscopy analysis of fast ion tracks in silicon

    Unknown

  • Formation of carbon vacancy in 4H silicon carbide during high-temperature processing

    Hussein Mohammed Hussein Ayedh;Viktor Bobal;R Nipoti;Anders Hallen

  • The influence of ion flux on defect production in MeV proton‐irradiated silicon

    A. Hallén;D. Fenyö;B. U. R. Sundqvist;R. E. Johnson

  • Hydrogen diffusion, complex formation, and dissociation in acceptor-doped silicon carbide

    Unknown

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