James S. Speck is affiliated with the University of California, Santa Barbara in the United States. Their research spans multiple disciplines with significant contributions to physics, materials science, and engineering. The main fields of study covered by their work include Physics and Astronomy, Materials Science, and Engineering. Within these, they have a particular focus on subfields such as Condensed Matter Physics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, and Atomic and Molecular Physics, and Optics.
Speck's research topics concentrate notably on semiconductor materials and devices. Key areas of work include GaN-based semiconductor devices and materials, Ga2O3 and related materials, ZnO doping and properties, semiconductor quantum structures and devices, semiconductor materials and devices, advanced photocatalysis techniques, and metal and thin film mechanics.
The scientist has published extensively, with frequent appearances in several journals. Among the primary publication venues are:
Recent notable papers include:
They have collaborated frequently with several researchers, including:
Throughout their career, James S. Speck has received several recognitions, including being named a Fellow of the National Academy of Inventors in 2016. They were also honored as a Fellow of the American Physical Society in 2009, with a citation highlighting their work on strain relaxation in epitaxial films, molecular beam epitaxial growth of GaN, nonpolar orientations of nitride semiconductors, and leadership in applying wide-bandgap semiconductors to solid-state lighting. Additionally, they were recognized as a Fellow of the Materials Research Society in 2008.
Siddha Pimputkar;James S. Speck;Steven P. DenBaars;Shuji Nakamura
J. P. Ibbetson;P. T. Fini;K. D. Ness;S. P. DenBaars
B. Heying;X. H. Wu;S. Keller;Y. Li
A. E. Romanov;T. J. Baker;S. Nakamura;J. S. Speck
Shigefusa F. Chichibu;Akira Uedono;Akira Uedono;Takeyoshi Onuma;Benjamin A. Haskell
Justin Iveland;Lucio Martinelli;Jacques Peretti;James S. Speck
J. S. Speck;W. Pompe
T. Palacios;A. Chakraborty;S. Rajan;C. Poblenz
X. H. Wu;C. R. Elsass;A. Abare;M. Mack
B. Heying;R. Averbeck;L. F. Chen;E. Haus
I. P. Smorchkova;C. R. Elsass;J. P. Ibbetson;R. Vetury
X. H. Wu;L. M. Brown;D. Kapolnek;S. Keller
M. D. Craven;S. H. Lim;F. Wu;J. S. Speck
V. Srikant;J. S. Speck;D. R. Clarke
E. J. Tarsa;B. Heying;X. H. Wu;P. Fini
B. Heying;E. J. Tarsa;C. R. Elsass;P. Fini
Steven P. Denbaars;Daniel Feezell;Katheryn Kelchner;Siddha Pimputkar
Yu Liu;T.R. Taylor;J.S. Speck;R.A. York
D. Kapolnek;X. H. Wu;B. Heying;S. Keller
Hitoshi Sato;Hirohiko Hirasawa;Roy B. Chung;Steven P. DenBaars
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