World's Best Scientists 2026 revealed!

D-Index & Metrics

Materials Science

D-Index
50
Citations
11116
World Ranking
10126
National Ranking
2431

Paul T. Fini publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Paul T. Fini sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 119 publications — 6th percentile

6% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Paul T. Fini D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Paul T. Fini sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 50 D-Index — 22nd percentile

22% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Semiconductor
  • Light-emitting diode
  • Composite material

Wide-bandgap semiconductor, Epitaxy, Optoelectronics, Crystallography and Dislocation are his primary areas of study. His Wide-bandgap semiconductor study combines topics from a wide range of disciplines, such as Polarization, Electrostatics and Photoluminescence. His study looks at the intersection of Epitaxy and topics like Transmission electron microscopy with Wafer and Microstructure.

His work on Diode as part of general Optoelectronics research is frequently linked to Al content, thereby connecting diverse disciplines of science. The various areas that Paul T. Fini examines in his Crystallography study include Metalorganic vapour phase epitaxy, Gallium nitride and Nitride. His Dislocation research includes themes of Sapphire, Orders of magnitude, Threading dislocations and Junction diodes.

His most cited work include:

  • Polarization effects, surface states, and the source of electrons in AlGaN/GaN heterostructure field effect transistors (762 citations)
  • Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors. (542 citations)
  • Homoepitaxial growth of GaN under Ga-stable and N-stable conditions by plasma-assisted molecular beam epitaxy (345 citations)

What are the main themes of his work throughout his whole career to date?

Paul T. Fini mainly investigates Epitaxy, Optoelectronics, Sapphire, Chemical vapor deposition and Metalorganic vapour phase epitaxy. His biological study spans a wide range of topics, including Gallium nitride, Transmission electron microscopy, Cathodoluminescence and Dislocation. His studies deal with areas such as Thin film and Diffraction as well as Sapphire.

His studies in Chemical vapor deposition integrate themes in fields like Deposition, Scattering, Photoluminescence, Analytical chemistry and Substrate. His Analytical chemistry research is multidisciplinary, incorporating elements of Molecular beam epitaxy and Doping. His Metalorganic vapour phase epitaxy research incorporates themes from Silicon, Tilt and Scanning electron microscope.

He most often published in these fields:

  • Epitaxy (49.55%)
  • Optoelectronics (44.14%)
  • Sapphire (28.83%)

What were the highlights of his more recent work (between 2006-2016)?

  • Epitaxy (49.55%)
  • Optoelectronics (44.14%)
  • Planar (5.41%)

In recent papers he was focusing on the following fields of study:

His main research concerns Epitaxy, Optoelectronics, Planar, Vapor phase and Hydride. His Epitaxy research is multidisciplinary, relying on both Transmission electron microscopy and Dislocation. His research in Transmission electron microscopy intersects with topics in Molecular physics, Semiconductor and Partial dislocations.

His Molecular physics research is multidisciplinary, incorporating perspectives in Scattering, Crystallography, Scanning transmission electron microscopy, Sapphire and Wide-bandgap semiconductor. His study in Gallium nitride extends to Dislocation with its themes. Paul T. Fini undertakes interdisciplinary study in the fields of Optoelectronics and Quantum yield through his research.

Between 2006 and 2016, his most popular works were:

  • Development of the IES method for evaluating the color rendition of light sources. (133 citations)
  • Anisotropic strain and phonon deformation potentials in GaN (86 citations)
  • Origin of localized excitons in In-containing three-dimensional bulk (Al,In,Ga)N alloy films probed by time-resolved photoluminescence and monoenergetic positron annihilation techniques (24 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Light-emitting diode
  • Composite material

His primary areas of study are Gallium nitride, Non polar, Epitaxy, Dislocation and Composite material.

Best Publications

  • Polarization effects, surface states, and the source of electrons in AlGaN/GaN heterostructure field effect transistors

    J. P. Ibbetson;P. T. Fini;K. D. Ness;S. P. DenBaars

  • Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors.

    Shigefusa F. Chichibu;Akira Uedono;Akira Uedono;Takeyoshi Onuma;Benjamin A. Haskell

  • POLARIZATION-INDUCED CHARGE AND ELECTRON MOBILITY IN ALGAN/GAN HETEROSTRUCTURES GROWN BY PLASMA-ASSISTED MOLECULAR-BEAM EPITAXY

    I. P. Smorchkova;C. R. Elsass;J. P. Ibbetson;R. Vetury

  • Homoepitaxial growth of GaN under Ga-stable and N-stable conditions by plasma-assisted molecular beam epitaxy

    E. J. Tarsa;B. Heying;X. H. Wu;P. Fini

  • Dislocation mediated surface morphology of GaN

    B. Heying;E. J. Tarsa;C. R. Elsass;P. Fini

  • High-performance (Al,Ga)N-based solar-blind ultraviolet p–i–n detectors on laterally epitaxially overgrown GaN

    G. Parish;S. Keller;P. Kozodoy;J. P. Ibbetson

  • Defect reduction in (112̄0) a-plane gallium nitride via lateral epitaxial overgrowth by hydride vapor-phase epitaxy

    B. A. Haskell;F. Wu;M. D. Craven;S. Matsuda

  • Electrical characterization of GaN p-n junctions with and without threading dislocations

    P. Kozodoy;J. P. Ibbetson;H. Marchand;P. T. Fini

  • High Al-content AlGaN/GaN MODFETs for ultrahigh performance

    Y.-F. Wu;B.P. Keller;P. Fini;S. Keller

  • Microstructure of GaN laterally overgrown by metalorganic chemical vapor deposition

    H. Marchand;X. H. Wu;J. P. Ibbetson;P. T. Fini

  • Dislocation generation in GaN heteroepitaxy

    X.H Wu;P Fini;E.J Tarsa;B Heying

  • Technique for the growth of planar semi-polar gallium nitride

    Troy J. Baker;Benjamin A. Haskell;Paul T. Fini;Steven P. Denbaars

  • Optimization of the surface morphologies and electron mobilities in GaN grown by plasma-assisted molecular beam epitaxy

    B. Heying;I. Smorchkova;C. Poblenz;C. Elsass

  • Characterization of Planar Semipolar Gallium Nitride Films on Spinel Substrates

    Troy J. Baker;Benjamin A. Haskell;Feng Wu;James S. Speck

  • Structural and morphological characteristics of planar (112̄0) a-plane gallium nitride grown by hydride vapor phase epitaxy

    B. A. Haskell;F. Wu;S. Matsuda;M. D. Craven

  • Metalorganic chemical vapor deposition of high mobility AlGaN/GaN heterostructures

    S. Keller;G. Parish;P. T. Fini;S. Heikman

  • GROWTH OF PLANAR NONPOLAR GALLIUM NITRIDE BY HYDRIDE-VAPOR PHASE GROWING METHOD

    Haskell Benjamin A;Fini Paul T;Matsuda Narimasa;Craven Michael D

  • Emission mechanisms of bulk GaN and InGaN quantum wells prepared by lateral epitaxial overgrowth

    S. F. Chichibu;S. F. Chichibu;H. Marchand;M. S. Minsky;S. Keller

  • Microstructure and enhanced morphology of planar nonpolar m-plane GaN grown by hydride vapor phase epitaxy

    Benjamin A. Haskell;Arpan Chakraborty;Feng Wu;Hideo Sasano

  • 292 nm AlGaN Single-Quantum Well Light Emitting Diodes Grown on Transparent AlN Base

    Amy Hanlon;P. Morgan Pattison;John F. Kaeding;Rajat Sharma

Frequent Co-Authors

James S. Speck
James S. Speck University of California, Santa Barbara
Steven P. DenBaars
Steven P. DenBaars University of California, Santa Barbara
Umesh K. Mishra
Umesh K. Mishra University of California, Santa Barbara
Shuji Nakamura
Shuji Nakamura University of California, Santa Barbara
Sarah L. Keller
Sarah L. Keller University of Washington
Pierre Petroff
Pierre Petroff University of California, Santa Barbara
Orlando Auciello
Orlando Auciello The University of Texas at Dallas
Jeffrey A. Eastman
Jeffrey A. Eastman Argonne National Laboratory
Bo Monemar
Bo Monemar Linköping University
Detlef Hommel
Detlef Hommel University of Wrocław

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