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Materials Science

D-Index
79
Citations
21689
World Ranking
2837
National Ranking
802

Research.com Recognitions

  • 2012 - Fellow of the Materials Research Society a Xerox company

Overview

John E. Northrup is affiliated with the Palo Alto Research Center in the United States. The scientist's work has earned recognition within the materials science community.

A notable accolade in their career is being named a Fellow of the Materials Research Society in 2012, which was awarded by a Xerox company.

Best Publications

  • Chemical potential dependence of defect formation energies in GaAs : application to Ga self-diffusion

    S. B. Zhang;John E. Northrup

  • Surface reconstructions of GaAs(100) observed by scanning tunneling microscopy.

    D. K. Biegelsen;R. D. Bringans;J. E. Northrup;L.-E. Swartz

  • Large modulation of carrier transport by grain-boundary molecular packing and microstructure in organic thin films

    Jonathan Rivnay;Leslie H. Jimison;John E. Northrup;Michael F. Toney

  • Reconstructions of the GaN\(0001̄\) Surface

    A. R. Smith;R. M. Feenstra;D. W. Greve;Jörg Neugebauer

  • Structure of GaN(0001): The laterally contracted Ga bilayer model

    John E. Northrup;J. Neugebauer;R. M. Feenstra;A. R. Smith

  • Transport in polycrystalline polymer thin-film transistors

    R. A. Street;J. E. Northrup;A. Salleo

  • Determination of wurtzite GaN lattice polarity based on surface reconstruction

    A. R. Smith;R. M. Feenstra;D. W. Greve;M.-S. Shin

  • Theory of GaN ( 10 1 ¯ 0 ) and ( 11 2 ¯ 0 ) surfaces

    John E. Northrup;J. Neugebauer

  • Adatom kinetics on and below the surface: The existence of a new diffusion channel

    Jörg Neugebauer;Tosja K. Zywietz;Matthias Scheffler;John E. Northrup

  • Ab initio calculation of the electronic and optical properties of solid pentacene

    Murilo L. Tiago;John E. Northrup;Steven G. Louie

  • Reconstructions of GaAs(1-bar 1-bar 1-bar) surfaces observed by scanning tunneling microscopy.

    D. K. Biegelsen;R. D. Bringans;J. E. Northrup;L.-E. Swartz

  • High Carrier Mobility Polythiophene Thin Films: Structure Determination by Experiment and Theory†

    Dean M. DeLongchamp;Regis J. Kline;Eric K. Lin;Daniel A. Fischer

  • Structure of Si(100)H: Dependence on the H chemical potential.

    John E. Northrup

  • Dopant and defect energetics: Si in GaAs.

    John E. Northrup;S. B. Zhang

  • Inversion Domain and Stacking Mismatch Boundaries in GaN.

    John E. Northrup;Jörg Neugebauer;L. T. Romano

  • Structure of GaAs(001) surfaces: The role of electrostatic interactions.

    John E. Northrup;Sverre Froyen

  • Reconstructions of GaN(0001) and (0001̄) surfaces: Ga-rich metallic structures

    A. R. Smith;R. M. Feenstra;D. W. Greve;M. S. Shin

  • Surface energetics, pit formation, and chemical ordering in InGaN alloys

    J. E. Northrup;L. T. Romano;Jörg Neugebauer

  • Origin of surface states on Si(111)(7×7)

    John E. Northrup

  • Inversion of wurtzite GaN(0001) by exposure to magnesium

    V. Ramachandran;R. M. Feenstra;W. L. Sarney;L. Salamanca-Riba

  • Erratum: Surface reconstructions of GaAs(100) observed by scanning tunneling microscopy [Phys. Rev. B 41, 5701 (1990)]

    D. K. Biegelsen;R. D. Bringans;J. E. Northrup;L. E. Swartz

Frequent Co-Authors

Randall M. Feenstra
Randall M. Feenstra Carnegie Mellon University
Jörg Neugebauer
Jörg Neugebauer Max Planck Institute for Iron Research
Marvin L. Cohen
Marvin L. Cohen University of California, Berkeley
Michael Kneissl
Michael Kneissl Technical University of Berlin
Linda T. Romano
Linda T. Romano Palo Alto Research Center
Chris G. Van de Walle
Chris G. Van de Walle University of California, Santa Barbara
Shengbai Zhang
Shengbai Zhang Rensselaer Polytechnic Institute
Steven G. Louie
Steven G. Louie University of California, Berkeley
Michael Wraback
Michael Wraback United States Army Research Laboratory
Matthias Scheffler
Matthias Scheffler Fritz Haber Institute of the Max Planck Society

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