World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
31
Citations
4384
World Ranking
9671
National Ranking
2758

Overview

What is he best known for?

The fields of study he is best known for:

  • Mechanical engineering
  • Electrical engineering
  • Integrated circuit

James M. Wark mainly investigates Die, Electronic engineering, Optoelectronics, Electrical engineering and Wafer. The various areas that James M. Wark examines in his Die study include Wire bonding, Active surface and Flip chip. His Electronic engineering study combines topics from a wide range of disciplines, such as Semiconductor device and Integrated circuit.

The Optoelectronics study combines topics in areas such as Terminal and Substrate. His Substrate research is multidisciplinary, incorporating elements of Semiconductor chip and Heat sink. His work on Die preparation as part of general Wafer study is frequently connected to Interconnection, therefore bridging the gap between diverse disciplines of science and establishing a new relationship between them.

His most cited work include:

  • Multi-dice chip scale semiconductor components and wafer level methods of fabrication (361 citations)
  • Device and method for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice (202 citations)
  • Through-wafer interconnects for photoimager and memory wafers (190 citations)

What are the main themes of his work throughout his whole career to date?

His main research concerns Optoelectronics, Electronic engineering, Die, Substrate and Wafer. His Optoelectronics study deals with Electrical conductor intersecting with Layer, Terminal, Base and Conductor. He interconnects Mechanical engineering, Semiconductor device, Solder ball and Chip in the investigation of issues within Electronic engineering.

His Die research is multidisciplinary, relying on both Flip chip, Electrical engineering, Integrated circuit and Wire bonding. His studies in Substrate integrate themes in fields like Semiconductor chip and Electrically conductive. While the research belongs to areas of Wafer, James M. Wark spends his time largely on the problem of Structural engineering, intersecting his research to questions surrounding Cover, Stamping, Seal and Semiconductor package.

He most often published in these fields:

  • Optoelectronics (46.84%)
  • Electronic engineering (46.84%)
  • Die (44.30%)

What were the highlights of his more recent work (between 2005-2012)?

  • Optoelectronics (46.84%)
  • Electrical conductor (26.58%)
  • Substrate (37.97%)

In recent papers he was focusing on the following fields of study:

His scientific interests lie mostly in Optoelectronics, Electrical conductor, Substrate, Electronic engineering and Layer. His Optoelectronics study typically links adjacent topics like Die. His research in Die intersects with topics in DIMM, Memory module, Wafer and Footprint.

His Electrical conductor research focuses on subjects like Terminal, which are linked to Conductor, Semiconductor components and Semiconductor. His work deals with themes such as Electrical contacts and Dielectric, which intersect with Substrate. His study in Electronic engineering is interdisciplinary in nature, drawing from both Flip chip, Semiconductor device, Printed circuit board and Integrated circuit.

Between 2005 and 2012, his most popular works were:

  • Through-wafer interconnects for photoimager and memory wafers (190 citations)
  • Method for fabricating semiconductor components with thinned substrate, circuit side contacts, conductive vias and backside contacts (85 citations)
  • Semiconductor component having plate, stacked dice and conductive vias (84 citations)

In his most recent research, the most cited papers focused on:

  • Mechanical engineering
  • Electrical engineering
  • Integrated circuit

James M. Wark spends much of his time researching Optoelectronics, Terminal, Electrical conductor, Die and Wafer. James M. Wark integrates several fields in his works, including Optoelectronics, Dice and Interconnection. James M. Wark incorporates a variety of subjects into his writings, including Dice, Stencil, Base, Layer and Electrical engineering.

His Interconnection research spans across into subjects like Parasitic extraction, Signal, Integrated circuit, Wire bonding and Electronic engineering. Parasitic extraction is closely attributed to Wafer-level packaging in his study. The study incorporates disciplines such as Electrical contacts, Semiconductor components, Semiconductor and Substrate in addition to Conductor.

Best Publications

  • Projected contact structures for engaging bumped semiconductor devices

    James Wark;Salman Akram

  • Methods for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice

    James M. Wark

  • Packaged die on PCB with heat sink encapsulant and methods

    Salman Akram;James M. Wark

  • Through-wafer interconnects for photoimager and memory wafers

    Salman Akram;Charles M. Watkins;Mark Hiatt;David R. Hembree

  • Flip-chip on leads devices

    James M. Wark

  • System and interconnect for making temporary electrical connections with bumped semiconductor components

    David R. Hembree;John O. Jacobson;James M. Wark;Warren M. Farnworth

  • Semiconductor package with pre-fabricated cover

    Warren M. Farnworth;David R. Hembree;Derek Gochnour;Salman Akram

  • Thin film capacitor coupons for memory modules and multi-chip modules

    James M. Wark;Salman Akram

  • Apparatus for testing semiconductor wafers

    Warren M. Farnworth;Salman Akram;Alan G. Wood;David R. Hembree

  • Device and method for testing integrated circuit dice in an integrated circuit module

    Warren M. Farnworth;James M. Wark;Eric S. Nelson;Kevin G. Duesman

  • Apparatus for automatically positioning electronic dice within component packages

    Warren M. Farnworth;Alan G. Wood;John O. Jacobson;David R. Hembree

  • Force applying probe card and test system for semiconductor wafers

    David R. Hembree;Warren M. Farnworth;James M. Wark

  • Direct connect interconnect for testing semiconductor dice and wafers

    Salman Akram;James M. Wark;Warren M. Farnworth

  • Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs

    Salman Akram;Warren M. Farnworth;Derek J. Gochnour;David R. Hembree

  • Method and apparatus for underfill of bumped or raised die

    Salman Akram;James M. Wark

  • Microelectronic imagers and methods of packaging microelectronic imagers

    Warren M. Farnworth;Sidney B. Rigg;William M. Hiatt;Kyle K. Kirby

  • Apparatus providing redundancy for fabricating highly reliable memory modules

    Salman Akram;James M. Wark;David R. Hembree

  • Temporary package, and method system for testing semiconductor dice having backside electrodes

    David R. Hembree;Salman Akram;Warren M. Farnworth;James M. Wark

  • Method for fabricating calibration target for calibrating semiconductor wafer test systems

    Andrew J. Krivy;Warren M. Farnworth;David R. Hembree;Salman Akram

  • Underfill of a bumped or raised die utilizing a barrier adjacent to the side wall of flip chip

    Salman Akram;James M. Wark

  • Semiconductor devices with permanent polymer stencil and method for manufacturing the same

    Warren M. Farnworth;Alan G. Wood;James M. Wark;David R. Hembree

  • Die assemblies using suspended bond wires, carrier substrates and dice having wire suspension structures, and methods of fabricating same

    James M. Wark;Salman Akram

  • Microelectronic imagers with optical devices having integral reference features and methods for manufacturing such microelectronic imagers

    Steven D. Oliver;James M. Wark;Kyle K. Kirby

  • Multi-chip module system and method of fabrication

    Salman Akram;David R. Hembree;James M. Wark

Frequent Co-Authors

Salman Akram
Salman Akram Micron (United States)
David R. Hembree
David R. Hembree Micron (United States)
Kyle K. Kirby
Kyle K. Kirby Micron (United States)
Alan G. Wood
Alan G. Wood Micron (United States)
Mark E. Tuttle
Mark E. Tuttle University of Washington

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