World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
31
Citations
4384
World Ranking
9674
National Ranking
2760

James M. Wark publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where James M. Wark sits on this spectrum.

38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 135 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 118 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 60 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38 publications 804+

This scientist: 38 publications — 1st percentile

1% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

James M. Wark D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where James M. Wark sits on this spectrum.

30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 129 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 348 scientists 41 D-Index: 362 scientists 42 D-Index: 426 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 95 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 25 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 31 D-Index — 2nd percentile

2% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Mechanical engineering
  • Electrical engineering
  • Integrated circuit

James M. Wark mainly investigates Die, Electronic engineering, Optoelectronics, Electrical engineering and Wafer. The various areas that James M. Wark examines in his Die study include Wire bonding, Active surface and Flip chip. His Electronic engineering study combines topics from a wide range of disciplines, such as Semiconductor device and Integrated circuit.

The Optoelectronics study combines topics in areas such as Terminal and Substrate. His Substrate research is multidisciplinary, incorporating elements of Semiconductor chip and Heat sink. His work on Die preparation as part of general Wafer study is frequently connected to Interconnection, therefore bridging the gap between diverse disciplines of science and establishing a new relationship between them.

His most cited work include:

  • Multi-dice chip scale semiconductor components and wafer level methods of fabrication (361 citations)
  • Device and method for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice (202 citations)
  • Through-wafer interconnects for photoimager and memory wafers (190 citations)

What are the main themes of his work throughout his whole career to date?

His main research concerns Optoelectronics, Electronic engineering, Die, Substrate and Wafer. His Optoelectronics study deals with Electrical conductor intersecting with Layer, Terminal, Base and Conductor. He interconnects Mechanical engineering, Semiconductor device, Solder ball and Chip in the investigation of issues within Electronic engineering.

His Die research is multidisciplinary, relying on both Flip chip, Electrical engineering, Integrated circuit and Wire bonding. His studies in Substrate integrate themes in fields like Semiconductor chip and Electrically conductive. While the research belongs to areas of Wafer, James M. Wark spends his time largely on the problem of Structural engineering, intersecting his research to questions surrounding Cover, Stamping, Seal and Semiconductor package.

He most often published in these fields:

  • Optoelectronics (46.84%)
  • Electronic engineering (46.84%)
  • Die (44.30%)

What were the highlights of his more recent work (between 2005-2012)?

  • Optoelectronics (46.84%)
  • Electrical conductor (26.58%)
  • Substrate (37.97%)

In recent papers he was focusing on the following fields of study:

His scientific interests lie mostly in Optoelectronics, Electrical conductor, Substrate, Electronic engineering and Layer. His Optoelectronics study typically links adjacent topics like Die. His research in Die intersects with topics in DIMM, Memory module, Wafer and Footprint.

His Electrical conductor research focuses on subjects like Terminal, which are linked to Conductor, Semiconductor components and Semiconductor. His work deals with themes such as Electrical contacts and Dielectric, which intersect with Substrate. His study in Electronic engineering is interdisciplinary in nature, drawing from both Flip chip, Semiconductor device, Printed circuit board and Integrated circuit.

Between 2005 and 2012, his most popular works were:

  • Through-wafer interconnects for photoimager and memory wafers (190 citations)
  • Method for fabricating semiconductor components with thinned substrate, circuit side contacts, conductive vias and backside contacts (85 citations)
  • Semiconductor component having plate, stacked dice and conductive vias (84 citations)

In his most recent research, the most cited papers focused on:

  • Mechanical engineering
  • Electrical engineering
  • Integrated circuit

James M. Wark spends much of his time researching Optoelectronics, Terminal, Electrical conductor, Die and Wafer. James M. Wark integrates several fields in his works, including Optoelectronics, Dice and Interconnection. James M. Wark incorporates a variety of subjects into his writings, including Dice, Stencil, Base, Layer and Electrical engineering.

His Interconnection research spans across into subjects like Parasitic extraction, Signal, Integrated circuit, Wire bonding and Electronic engineering. Parasitic extraction is closely attributed to Wafer-level packaging in his study. The study incorporates disciplines such as Electrical contacts, Semiconductor components, Semiconductor and Substrate in addition to Conductor.

Best Publications

  • Projected contact structures for engaging bumped semiconductor devices

    James Wark;Salman Akram

  • Methods for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice

    James M. Wark

  • Packaged die on PCB with heat sink encapsulant and methods

    Salman Akram;James M. Wark

  • Through-wafer interconnects for photoimager and memory wafers

    Salman Akram;Charles M. Watkins;Mark Hiatt;David R. Hembree

  • Flip-chip on leads devices

    James M. Wark

  • System and interconnect for making temporary electrical connections with bumped semiconductor components

    David R. Hembree;John O. Jacobson;James M. Wark;Warren M. Farnworth

  • Semiconductor package with pre-fabricated cover

    Warren M. Farnworth;David R. Hembree;Derek Gochnour;Salman Akram

  • Thin film capacitor coupons for memory modules and multi-chip modules

    James M. Wark;Salman Akram

  • Apparatus for testing semiconductor wafers

    Warren M. Farnworth;Salman Akram;Alan G. Wood;David R. Hembree

  • Device and method for testing integrated circuit dice in an integrated circuit module

    Warren M. Farnworth;James M. Wark;Eric S. Nelson;Kevin G. Duesman

  • Apparatus for automatically positioning electronic dice within component packages

    Warren M. Farnworth;Alan G. Wood;John O. Jacobson;David R. Hembree

  • Force applying probe card and test system for semiconductor wafers

    David R. Hembree;Warren M. Farnworth;James M. Wark

  • Direct connect interconnect for testing semiconductor dice and wafers

    Salman Akram;James M. Wark;Warren M. Farnworth

  • Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs

    Salman Akram;Warren M. Farnworth;Derek J. Gochnour;David R. Hembree

  • Method and apparatus for underfill of bumped or raised die

    Salman Akram;James M. Wark

  • Microelectronic imagers and methods of packaging microelectronic imagers

    Warren M. Farnworth;Sidney B. Rigg;William M. Hiatt;Kyle K. Kirby

  • Apparatus providing redundancy for fabricating highly reliable memory modules

    Salman Akram;James M. Wark;David R. Hembree

  • Temporary package, and method system for testing semiconductor dice having backside electrodes

    David R. Hembree;Salman Akram;Warren M. Farnworth;James M. Wark

  • Method for fabricating calibration target for calibrating semiconductor wafer test systems

    Andrew J. Krivy;Warren M. Farnworth;David R. Hembree;Salman Akram

  • Underfill of a bumped or raised die utilizing a barrier adjacent to the side wall of flip chip

    Salman Akram;James M. Wark

  • Semiconductor devices with permanent polymer stencil and method for manufacturing the same

    Warren M. Farnworth;Alan G. Wood;James M. Wark;David R. Hembree

  • Die assemblies using suspended bond wires, carrier substrates and dice having wire suspension structures, and methods of fabricating same

    James M. Wark;Salman Akram

  • Microelectronic imagers with optical devices having integral reference features and methods for manufacturing such microelectronic imagers

    Steven D. Oliver;James M. Wark;Kyle K. Kirby

  • Multi-chip module system and method of fabrication

    Salman Akram;David R. Hembree;James M. Wark

Frequent Co-Authors

Salman Akram
Salman Akram Micron (United States)
David R. Hembree
David R. Hembree Micron (United States)
Kyle K. Kirby
Kyle K. Kirby Micron (United States)
Alan G. Wood
Alan G. Wood Micron (United States)
Mark E. Tuttle
Mark E. Tuttle University of Washington

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