World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
50
Citations
9084
World Ranking
2829
National Ranking
1070

Materials Science

D-Index
52
Citations
9505
World Ranking
9590
National Ranking
2317

Jeffrey P. Gambino publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Jeffrey P. Gambino sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 431 publications — 78th percentile

78% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Jeffrey P. Gambino D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Jeffrey P. Gambino sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 50 D-Index — 60th percentile

60% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Composite material
  • Semiconductor
  • Electrical engineering

His primary scientific interests are in Optoelectronics, Dielectric, Electronic engineering, Layer and Composite material. His Optoelectronics study combines topics in areas such as Image sensor, Semiconductor device, Pixel, Electrical conductor and Substrate. His work carried out in the field of Dielectric brings together such families of science as Composite number, Oxide, Insulator and Capacitor.

His Electronic engineering study also includes

  • Integrated circuit that connect with fields like Wafer and Wafer dicing,
  • Chip which is related to area like Edge, CMOS and Flip chip. As a part of the same scientific family, Jeffrey P. Gambino mostly works in the field of Layer, focusing on Electrical engineering and, on occasion, Distribution networks. The study incorporates disciplines such as Metallurgy and Metal in addition to Composite material.

His most cited work include:

  • Silicides and ohmic contacts (347 citations)
  • Formation and stability of silicides on polycrystalline silicon (178 citations)
  • Low-K gate spacers by fluorine implantation (171 citations)

What are the main themes of his work throughout his whole career to date?

Optoelectronics, Layer, Electronic engineering, Composite material and Integrated circuit are his primary areas of study. Jeffrey P. Gambino studies Optoelectronics, focusing on Dielectric in particular. His study looks at the relationship between Layer and fields such as Electrical conductor, as well as how they intersect with chemical problems.

The concepts of his Electronic engineering study are interwoven with issues in Wafer, Copper interconnect, Trench, Dielectric layer and Conductor. The Composite material study combines topics in areas such as Structural engineering, Metal and Copper. His research in Integrated circuit tackles topics such as Chip which are related to areas like Flip chip.

He most often published in these fields:

  • Optoelectronics (59.83%)
  • Layer (35.20%)
  • Electronic engineering (30.23%)

What were the highlights of his more recent work (between 2012-2018)?

  • Optoelectronics (59.83%)
  • Electronic engineering (30.23%)
  • Substrate (15.73%)

In recent papers he was focusing on the following fields of study:

Jeffrey P. Gambino mainly investigates Optoelectronics, Electronic engineering, Substrate, Layer and Composite material. As a part of the same scientific study, Jeffrey P. Gambino usually deals with the Optoelectronics, concentrating on Electrical engineering and frequently concerns with Capacitance. His studies deal with areas such as Electrical contacts, Trench, Metal and Dielectric as well as Electronic engineering.

His work on Flip chip as part of general Substrate research is frequently linked to Structure, bridging the gap between disciplines. His Layer research is multidisciplinary, relying on both Adhesion, Nanowire and Pillar. His biological study spans a wide range of topics, including Structural engineering and Copper.

Between 2012 and 2018, his most popular works were:

  • An overview of through-silicon-via technology and manufacturing challenges (110 citations)
  • Biological and Chemical Sensors (26 citations)
  • Integrated circuit chip with pyramid or cone-shaped conductive pads for flexible c4 connections and a method of forming the integrated circuit chip (24 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Composite material
  • Electrical engineering

His scientific interests lie mostly in Optoelectronics, Layer, Electronic engineering, Wafer and Chip. His Optoelectronics research includes elements of Substrate and Flip chip. His Layer research entails a greater understanding of Composite material.

His study in Dielectric extends to Composite material with its themes. His Electronic engineering study incorporates themes from Trench and Semiconductor device. His studies in Chip integrate themes in fields like Semiconductor materials, Active devices, Grating, Integrated circuit and Interposer.

Best Publications

  • Silicides and ohmic contacts

    J.P. Gambino;E.G. Colgan

  • An overview of through-silicon-via technology and manufacturing challenges

    Jeffrey P. Gambino;Shawn A. Adderly;John U. Knickerbocker

  • Formation and stability of silicides on polycrystalline silicon

    E.G. Colgan;J.P. Gambino;Q.Z. Hong

  • Fin field effect transistor with self-aligned gate

    Jeffrey P. Gambino;Jerome B. Lasky;Jed H. Rankin

  • Damascene copper wiring optical image sensor

    James W. Adkisson;Jeffrey P. Gambino;Mark D. Jaffe;Robert K. Leidy

  • Low-K gate spacers by fluorine implantation

    Jeffrey P. Gambino;Jack Mandelman;William R. Tonti

  • A cmos imager array with recessed dielectric layer

    Jeffrey Peter Gambino;James William Adkisson;Edmund Juris Sprogis;Richard John Rassel

  • Double-sided integrated circuit chips

    Kerry Bernstein;Timothy Joseph Dalton;Jeffrey Peter Gambino;Mark David Jaffe

  • Methods for forming a bonded semiconductor substrate including a cooling mechanism

    Jeffrey P. Gambino;Anthony K. Stamper

  • Integrated circuit having a via and a capacitor

    Jeffrey P. Gambino;Mark A. Jaso;David E. Kotecki

  • Nitride etch for improved spacer uniformity

    James A. Culp;John J. Ellis-Monaghan;Jeffrey P. Gambino;Kirk D. Peterson

  • Crack stop for low k dielectrics

    Timothy H. Daubenspeck;Jeffrey P. Gambino;Stephen E. Luce;Thomas J. Mcdevitt

  • Stacked image method

    James W. Adkisson;Jeffrey P. Gambino;Mark D. Jaffe;Robert K. Leidy

  • Effect of Heat Treatments on the Wetting Behavior of Bismuth-Rich Intergranular Phases in ZnO:Bi:Co Varistors

    Jeffrey P. Gambino;W. David Kingery;Gordon E. Pike;Lionel M. Levinson

  • Exposed pore sealing post patterning

    Edward C. Cooney;John A. Fitzsimmons;Jeffrey P. Gambino;Stephen E. Luce

  • Determination of the Fowler–Nordheim tunneling parameters from the Fowler–Nordheim plot

    Y.L. Chiou;J.P. Gambino;M. Mohammad

  • Device and methodology for reducing effective diel

    Edelstein Daniel C;Colburn Matthew E;Cooney Edward C;Dalton Timothy J

  • Anti-reflection structures for CMOS image sensors

    James W. Adkisson;John J. Ellis-Monaghan;Jeffrey P. Gambino;Charles F. Musante

  • Undercut-free blm process for pb-free and pb-reduced c4

    Timothy H. Daubenspeck;Jeffrey P. Gambino;Christopher D. Muzzy;Wolfgang Sauter

  • Cmos imager of eliminating high reflectivity interfaces

    James W Adkisson;Jeffrey P Gambino;Mark D Jaffe;Robert K Leidy

Frequent Co-Authors

Anthony K. Stamper
Anthony K. Stamper GlobalFoundries (United States)
Jack A. Mandelman
Jack A. Mandelman Independent Scientist / Consultant, US
Carl J. Radens
Carl J. Radens IBM (United States)
Edmund J. Sprogis
Edmund J. Sprogis IBM (United States)
William R. Tonti
William R. Tonti Institute of Electrical and Electronics Engineers
Louis L. Hsu
Louis L. Hsu IBM (United States)
Steven H. Voldman
Steven H. Voldman Independent Scientist / Consultant, US
Claude L. Bertin
Claude L. Bertin NANTERO INC
Daniel C. Edelstein
Daniel C. Edelstein IBM (United States)
Douglas D. Coolbaugh
Douglas D. Coolbaugh University at Albany, State University of New York

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