World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
50
Citations
9084
World Ranking
2829
National Ranking
1069

Materials Science

D-Index
52
Citations
9505
World Ranking
9592
National Ranking
2319

Overview

What is he best known for?

The fields of study he is best known for:

  • Composite material
  • Semiconductor
  • Electrical engineering

His primary scientific interests are in Optoelectronics, Dielectric, Electronic engineering, Layer and Composite material. His Optoelectronics study combines topics in areas such as Image sensor, Semiconductor device, Pixel, Electrical conductor and Substrate. His work carried out in the field of Dielectric brings together such families of science as Composite number, Oxide, Insulator and Capacitor.

His Electronic engineering study also includes

  • Integrated circuit that connect with fields like Wafer and Wafer dicing,
  • Chip which is related to area like Edge, CMOS and Flip chip. As a part of the same scientific family, Jeffrey P. Gambino mostly works in the field of Layer, focusing on Electrical engineering and, on occasion, Distribution networks. The study incorporates disciplines such as Metallurgy and Metal in addition to Composite material.

His most cited work include:

  • Silicides and ohmic contacts (347 citations)
  • Formation and stability of silicides on polycrystalline silicon (178 citations)
  • Low-K gate spacers by fluorine implantation (171 citations)

What are the main themes of his work throughout his whole career to date?

Optoelectronics, Layer, Electronic engineering, Composite material and Integrated circuit are his primary areas of study. Jeffrey P. Gambino studies Optoelectronics, focusing on Dielectric in particular. His study looks at the relationship between Layer and fields such as Electrical conductor, as well as how they intersect with chemical problems.

The concepts of his Electronic engineering study are interwoven with issues in Wafer, Copper interconnect, Trench, Dielectric layer and Conductor. The Composite material study combines topics in areas such as Structural engineering, Metal and Copper. His research in Integrated circuit tackles topics such as Chip which are related to areas like Flip chip.

He most often published in these fields:

  • Optoelectronics (59.83%)
  • Layer (35.20%)
  • Electronic engineering (30.23%)

What were the highlights of his more recent work (between 2012-2018)?

  • Optoelectronics (59.83%)
  • Electronic engineering (30.23%)
  • Substrate (15.73%)

In recent papers he was focusing on the following fields of study:

Jeffrey P. Gambino mainly investigates Optoelectronics, Electronic engineering, Substrate, Layer and Composite material. As a part of the same scientific study, Jeffrey P. Gambino usually deals with the Optoelectronics, concentrating on Electrical engineering and frequently concerns with Capacitance. His studies deal with areas such as Electrical contacts, Trench, Metal and Dielectric as well as Electronic engineering.

His work on Flip chip as part of general Substrate research is frequently linked to Structure, bridging the gap between disciplines. His Layer research is multidisciplinary, relying on both Adhesion, Nanowire and Pillar. His biological study spans a wide range of topics, including Structural engineering and Copper.

Between 2012 and 2018, his most popular works were:

  • An overview of through-silicon-via technology and manufacturing challenges (110 citations)
  • Biological and Chemical Sensors (26 citations)
  • Integrated circuit chip with pyramid or cone-shaped conductive pads for flexible c4 connections and a method of forming the integrated circuit chip (24 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Composite material
  • Electrical engineering

His scientific interests lie mostly in Optoelectronics, Layer, Electronic engineering, Wafer and Chip. His Optoelectronics research includes elements of Substrate and Flip chip. His Layer research entails a greater understanding of Composite material.

His study in Dielectric extends to Composite material with its themes. His Electronic engineering study incorporates themes from Trench and Semiconductor device. His studies in Chip integrate themes in fields like Semiconductor materials, Active devices, Grating, Integrated circuit and Interposer.

Best Publications

  • Silicides and ohmic contacts

    J.P. Gambino;E.G. Colgan

  • An overview of through-silicon-via technology and manufacturing challenges

    Jeffrey P. Gambino;Shawn A. Adderly;John U. Knickerbocker

  • Formation and stability of silicides on polycrystalline silicon

    E.G. Colgan;J.P. Gambino;Q.Z. Hong

  • Fin field effect transistor with self-aligned gate

    Jeffrey P. Gambino;Jerome B. Lasky;Jed H. Rankin

  • Damascene copper wiring optical image sensor

    James W. Adkisson;Jeffrey P. Gambino;Mark D. Jaffe;Robert K. Leidy

  • Low-K gate spacers by fluorine implantation

    Jeffrey P. Gambino;Jack Mandelman;William R. Tonti

  • A cmos imager array with recessed dielectric layer

    Jeffrey Peter Gambino;James William Adkisson;Edmund Juris Sprogis;Richard John Rassel

  • Double-sided integrated circuit chips

    Kerry Bernstein;Timothy Joseph Dalton;Jeffrey Peter Gambino;Mark David Jaffe

  • Methods for forming a bonded semiconductor substrate including a cooling mechanism

    Jeffrey P. Gambino;Anthony K. Stamper

  • Integrated circuit having a via and a capacitor

    Jeffrey P. Gambino;Mark A. Jaso;David E. Kotecki

  • Nitride etch for improved spacer uniformity

    James A. Culp;John J. Ellis-Monaghan;Jeffrey P. Gambino;Kirk D. Peterson

  • Crack stop for low k dielectrics

    Timothy H. Daubenspeck;Jeffrey P. Gambino;Stephen E. Luce;Thomas J. Mcdevitt

  • Stacked image method

    James W. Adkisson;Jeffrey P. Gambino;Mark D. Jaffe;Robert K. Leidy

  • Effect of Heat Treatments on the Wetting Behavior of Bismuth-Rich Intergranular Phases in ZnO:Bi:Co Varistors

    Jeffrey P. Gambino;W. David Kingery;Gordon E. Pike;Lionel M. Levinson

  • Exposed pore sealing post patterning

    Edward C. Cooney;John A. Fitzsimmons;Jeffrey P. Gambino;Stephen E. Luce

  • Determination of the Fowler–Nordheim tunneling parameters from the Fowler–Nordheim plot

    Y.L. Chiou;J.P. Gambino;M. Mohammad

  • Device and methodology for reducing effective diel

    Edelstein Daniel C;Colburn Matthew E;Cooney Edward C;Dalton Timothy J

  • Anti-reflection structures for CMOS image sensors

    James W. Adkisson;John J. Ellis-Monaghan;Jeffrey P. Gambino;Charles F. Musante

  • Undercut-free blm process for pb-free and pb-reduced c4

    Timothy H. Daubenspeck;Jeffrey P. Gambino;Christopher D. Muzzy;Wolfgang Sauter

  • Cmos imager of eliminating high reflectivity interfaces

    James W Adkisson;Jeffrey P Gambino;Mark D Jaffe;Robert K Leidy

Frequent Co-Authors

Anthony K. Stamper
Anthony K. Stamper GlobalFoundries (United States)
Jack A. Mandelman
Jack A. Mandelman Independent Scientist / Consultant, US
Carl J. Radens
Carl J. Radens IBM (United States)
Edmund J. Sprogis
Edmund J. Sprogis IBM (United States)
William R. Tonti
William R. Tonti Institute of Electrical and Electronics Engineers
Louis L. Hsu
Louis L. Hsu IBM (United States)
Steven H. Voldman
Steven H. Voldman Independent Scientist / Consultant, US
Claude L. Bertin
Claude L. Bertin NANTERO INC
Daniel C. Edelstein
Daniel C. Edelstein IBM (United States)
Douglas D. Coolbaugh
Douglas D. Coolbaugh University at Albany, State University of New York

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