World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
44
Citations
7510
World Ranking
3752
National Ranking
1354

Carl J. Radens publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Carl J. Radens sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 274 publications — 51st percentile

51% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Carl J. Radens D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Carl J. Radens sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 44 D-Index — 47th percentile

47% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

What is he best known for?

The fields of study he is best known for:

  • Electrical engineering
  • Integrated circuit
  • Semiconductor

His scientific interests lie mostly in Optoelectronics, Electrical engineering, Layer, Transistor and Substrate. His studies deal with areas such as Semiconductor device, Trench, Electrical conductor, Gate dielectric and Gate oxide as well as Optoelectronics. Carl J. Radens has researched Trench in several fields, including Etching and Geotechnical engineering.

As a part of the same scientific study, Carl J. Radens usually deals with the Electrical engineering, concentrating on Silicon on insulator and frequently concerns with Static random-access memory, Integrated circuit and Epitaxy. His Transistor research incorporates themes from Electronic engineering and Dynamic random-access memory. His research in Substrate intersects with topics in Silicon, Wafer, Dopant and Flash memory.

His most cited work include:

  • Intelligent wireless power charging system (218 citations)
  • Challenges and future directions for the scaling of dynamic random-access memory (DRAM) (216 citations)
  • Structure and method for replacement gate mosfet with self-aligned contact using sacrificial mandrel dielectric (166 citations)

What are the main themes of his work throughout his whole career to date?

His primary areas of study are Optoelectronics, Electrical engineering, Trench, Capacitor and Layer. The study incorporates disciplines such as Transistor, Substrate and Electronic engineering in addition to Optoelectronics. His Transistor course of study focuses on Silicon on insulator and Insulator.

His Electrical engineering study combines topics in areas such as Dram and Conductor. His study explores the link between Trench and topics such as Etching that cross with problems in Substrate. His biological study spans a wide range of topics, including Structural engineering, Doping and Integrated circuit.

He most often published in these fields:

  • Optoelectronics (67.44%)
  • Electrical engineering (38.76%)
  • Trench (32.30%)

What were the highlights of his more recent work (between 2011-2021)?

  • Optoelectronics (67.44%)
  • Layer (24.03%)
  • Integrated circuit (14.73%)

In recent papers he was focusing on the following fields of study:

Carl J. Radens mainly focuses on Optoelectronics, Layer, Integrated circuit, Electronic engineering and Dielectric. His Optoelectronics research integrates issues from Substrate, Semiconductor device, Interconnection and Electrical engineering. His Layer study combines topics from a wide range of disciplines, such as Transistor and Structural engineering.

His Transistor research incorporates elements of Electrical contacts, Electrical conductor and Silicon. In Integrated circuit, he works on issues like Die, which are connected to Hard mask. His Electronic engineering research is multidisciplinary, incorporating elements of Electronic circuit, Capacitance, Metal, Etching and Insulator.

Between 2011 and 2021, his most popular works were:

  • Methods of forming vertical transistor devices with self-aligned top source/drain conductive contacts (44 citations)
  • Self-aligned via interconnect structures (29 citations)
  • Integration of fin-based devices and etsoi devices (28 citations)

In his most recent research, the most cited papers focused on:

  • Electrical engineering
  • Semiconductor
  • Integrated circuit

Carl J. Radens mainly investigates Optoelectronics, Layer, Dielectric, Electrical engineering and Gate oxide. Carl J. Radens combines subjects such as Transistor, Substrate, Trench and Epitaxy with his study of Optoelectronics. His Transistor research focuses on subjects like Electrical conductor, which are linked to Chemical-mechanical planarization and Plating.

The Trench study combines topics in areas such as Electronic engineering and Back end of line. As a member of one scientific family, Carl J. Radens mostly works in the field of Layer, focusing on Structural engineering and, on occasion, Interconnection. His study looks at the relationship between Gate oxide and topics such as Gate dielectric, which overlap with Threshold voltage, Nitriding, High-κ dielectric and CMOS.

Best Publications

  • Challenges and future directions for the scaling of dynamic random-access memory (DRAM)

    J. A. Mandelman;R. H. Dennard;G. B. Bronner;J. K. DeBrosse

  • Intelligent wireless power charging system

    Lawrence Clevenger;Timothy Dalton;Louis Hsu;Carl Radens

  • VERTICAL MOSFET SRAM CELL WITH SURROUNDED GATE TO OBTAIN IMPROVED TRANSCONDUCTANCE AND EFFICIENCY

    Hsu Louis L;Gluschenenkov Oleg;Mandelman Jack A;Radens Carl J

  • Structure and method for replacement gate mosfet with self-aligned contact using sacrificial mandrel dielectric

    Shahab Siddiqui;Michael P. Chudzik;Carl J. Radens

  • Fluctuation limits & scaling opportunities for CMOS SRAM cells

    A. Bhavnagarwala;S. Kosonocky;C. Radens;K. Stawiasz

  • Silicon-on-insulator vertical array device trench capacitor DRAM

    Carl J. Radens;Gary B. Bronner;Tze-Chiang Chen;Bijan Davari

  • High performance 14nm SOI FinFET CMOS technology with 0.0174µm 2 embedded DRAM and 15 levels of Cu metallization

    C-H. Lin;B. Greene;S. Narasimha;J. Cai

  • Integrated chip having SRAM, DRAM and Flash memory and method for fabricating the same

    Louis L. Hsu;Carl Radens;Li-Kong Wang

  • Method for trench capacitor dram cell without floating-well effects

    Jack A. Mandelman;Ramachandra Divakaruni;Carl J. Radens;Stephan Kudelka

  • A Sub-600-mV, Fluctuation Tolerant 65-nm CMOS SRAM Array With Dynamic Cell Biasing

    A.J. Bhavnagarwala;S. Kosonocky;C. Radens;Yuen Chan

  • A 64 Mb SRAM in 32 nm High-k Metal-Gate SOI Technology With 0.7 V Operation Enabled by Stability, Write-Ability and Read-Ability Enhancements

    Harold Pilo;Igor Arsovski;Kevin Batson;Geordie Braceras

  • Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain

    Dureseti Chidambarrao;Anda C. Mocuta;Dan M. Mocuta;Carl Radens

  • Semiconductor integrated circuit devices having high-Q wafer backside inductors and methods of fabricating same

    Lawrence Clevenger;Timothy Joseph Dalton;Louis Hsu;Carl Radens

  • Method of integrating volatile and non-volatile memory devices in a single chip

    Hsu Louis L;Radens Carl J;Wang Li-Kong

  • High performance 65 nm SOI technology with dual stress liner and low capacitance SRAM cell

    E. Leobandung;H. Nayakama;D. Mocuta;K. Miyamoto

  • High performance FET with elevated source/drain region

    Rama Divakaruni;Louis C. Hsu;Rajiv V. Joshi;Carl J. Radens

  • Structure and method for MOSFET with metallic gate electrode

    Jack A. Mandelman;Oleg Gluschenkov;Carl J. Radens

  • Properties of four-layer planar optical waveguides near cutoff

    W. Borland;D. Zelmon;C. Radens;J. Boyd

  • Replacement gate mosfet with self-aligned diffusion contact

    Sameer H. Jain;Carl J. Radens;Shahab Siddiqui;Jay W. Strane

  • Integrated circuit using damascene gate structure

    Carl Radens;Mary E. Weybright;Gary Bronner

Frequent Co-Authors

Jack A. Mandelman
Jack A. Mandelman Independent Scientist / Consultant, US
Louis L. Hsu
Louis L. Hsu IBM (United States)
William R. Tonti
William R. Tonti Institute of Electrical and Electronics Engineers
Kangguo Cheng
Kangguo Cheng IBM (United States)
Jeffrey P. Gambino
Jeffrey P. Gambino ON Semiconductor (United States)
Dureseti Chidambarrao
Dureseti Chidambarrao IBM (United States)
Oleg Gluschenkov
Oleg Gluschenkov IBM (United States)
Bruce B. Doris
Bruce B. Doris IBM (United States)
Toshiharu Furukawa
Toshiharu Furukawa IBM (United States)
Michael P. Chudzik
Michael P. Chudzik IBM (United States)

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