2026 Eric Chason: Materials Science Researcher – H-Index, Publications & Awards

Discipline name	D-Index	World Ranking	Current World Ranking	National Ranking	Current National Ranking	Publications	Citations
Materials Science	55	8510	8220	2096	1943	224	13089

Discipline name

D-Index

World Ranking

Current World Ranking

National Ranking

Current National Ranking

Publications

Citations

Materials Science

8510

8220

2096

1943

224

13089

Overview

Eric Chason is affiliated with Brown University in the United States and has contributed extensively to the fields of Engineering and Materials Science. Their research primarily focuses on Electrical and Electronic Engineering, Mechanics of Materials, Electronic, Optical and Magnetic Materials, Materials Chemistry, and Aerospace Engineering.

Their work covers several specialized topics including Metal and Thin Film Mechanics, Copper Interconnects and Reliability, Semiconductor Materials and Devices, Electronic Packaging and Soldering Technologies, High-Temperature Coating Behaviors, Diamond and Carbon-based Materials Research, and 3D IC and TSV technologies.

Eric Chason has published multiple papers in a range of scientific venues. Frequent publication venues include:

Surface and Coatings Technology
SSRN Electronic Journal
Journal of Applied Physics
Journal of Electronic Materials
Scripta Materialia

Among their recent papers are:

Whisker growth under a controlled driving force: Pressure induced whisker nucleation and growth, 2020, Scripta Materialia
The microstructural and stress evolution in sputter deposited Ni thin films, 2021, Surface and Coatings Technology
A unified kinetic model for stress relaxation and recovery during and after growth interruptions in polycrystalline thin films, 2020, Acta Materialia
Understanding residual stress in thin films: Analyzing wafer curvature measurements for Ag, Cu, Ni, Fe, Ti, and Cr with a kinetic model, 2021, Journal of Applied Physics
Measurements and modeling of residual stress in sputtered TiN and ZrN: Dependence on growth rate and pressure, 2020, Surface and Coatings Technology

Eric Chason collaborates frequently with other researchers, with notable coauthors including:

Tong Su
Zhaoxia Rao
Piyush Jagtap
Gregory B. Thompson
Diederik Depla

Best Publications

Review Article: Stress in thin films and coatings: Current status, challenges, and prospects

Grégory Abadias;Eric Chason;Jozef Keckes;Marco Sebastiani

854
Citations
Making waves: Kinetic processes controlling surface evolution during low energy ion sputtering

Wai Lun Chan;Eric Chason

594
Citations
Origin of compressive residual stress in polycrystalline thin films.

E. Chason;B. W. Sheldon;L. B. Freund;J. A. Floro

581
Citations
Roughening instability and evolution of the Ge(001) surface during ion sputtering.

E Chason;TM Mayer;BK Kellerman;DT McIlroy

444
Citations
The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer–Weber thin films

J.A. Floro;S.J. Hearne;J.A. Hunter;P.G. Kotula

439
Citations
Spontaneous Pattern Formation on Ion Bombarded Si(001)

Jonah Erlebacher;Michael J. Aziz;Eric Chason;Michael B. Sinclair

408
Citations
Extensions of the Stoney formula for substrate curvature to configurations with thin substrates or large deformations

L. B. Freund;J. A. Floro;E. Chason

404
Citations
Roughening instability and ion‐induced viscous relaxation of SiO2 surfaces

T. M. Mayer;E. Chason;A. J. Howard

382
Citations
Physical Origins of Intrinsic Stresses in Volmer–Weber Thin Films

Jerrold A. Floro;Eric Chason;Robert C. Cammarata;David J. Srolovitz

374
Citations
Ion beams in silicon processing and characterization

E. Chason;S. T. Picraux;J. M. Poate;J. O. Borland

368
Citations
Thin film and surface characterization by specular X-ray reflectivity

E. Chason;T. M. Mayer

338
Citations
Stress evolution during metalorganic chemical vapor deposition of GaN

S. Hearne;E. Chason;J. Han;J. A. Floro

319
Citations
Model for stress generated upon contact of neighboring islands on the surface of a substrate

L. B. Freund;Eric Chason

261
Citations
Stress and Defect Control in GaN Using Low Temperature Interlayers

Hiroshi Amano;Motoaki Iwaya;Takayuki Kashima;Maki Katsuragawa

239
Citations
Tutorial: Understanding residual stress in polycrystalline thin films through real-time measurements and physical models

Eric Chason;Pradeep R. Guduru

232
Citations
SiGe Island Shape Transitions Induced by Elastic Repulsion

J. A. Floro;G. A. Lucadamo;E. Chason;L. B. Freund

217
Citations
Evolution of coherent islands in Si 1 − x Ge x / Si ( 001 )

J. A. Floro;E. Chason;L. B. Freund;R. D. Twesten

215
Citations
SiGe Coherent Islanding and Stress Relaxation in the High Mobility Regime

J. A. Floro;E. Chason;R. D. Twesten;R. Q. Hwang

198
Citations
A kinetic analysis of residual stress evolution in polycrystalline thin films

Eric Chason

196
Citations
Real-time stress evolution during Si 1-x Ge x heteroepitaxy: dislocations, islanding, and segregation

J. A. Floro;E. Chason;S. R. Lee;R. D. Twesten

192
Citations