His primary scientific interests are in Optoelectronics, High-electron-mobility transistor, Transistor, Heterojunction and Doping. His Optoelectronics research is multidisciplinary, relying on both Fermi gas, Barrier layer, Layer, Molecular beam epitaxy and Buffer. His High-electron-mobility transistor research incorporates elements of Transconductance, Power density and Linearity.
His Transistor research includes themes of Boost converter, Power electronics and High voltage. The various areas that Sten Heikman examines in his Heterojunction study include Wide-bandgap semiconductor and Electron mobility. His Doping research is multidisciplinary, incorporating elements of Metalorganic vapour phase epitaxy, Chemical vapor deposition, Electron density and Analytical chemistry.
His primary areas of investigation include Optoelectronics, High-electron-mobility transistor, Transistor, Wide-bandgap semiconductor and Gallium nitride. His Optoelectronics study incorporates themes from Layer and Power density. The High-electron-mobility transistor study combines topics in areas such as RF power amplifier, Monolithic microwave integrated circuit, Transconductance and Contact resistance.
He has included themes like Ohmic contact, Breakdown voltage, Passivation and Linearity in his Transistor study. His work carried out in the field of Wide-bandgap semiconductor brings together such families of science as Algan gan, Noise, Silicon carbide and Leakage. His work deals with themes such as Aluminium nitride, Sheet resistance and Radio frequency, which intersect with Gallium nitride.
Sten Heikman mostly deals with Optoelectronics, Light-emitting diode, Layer, Optics and Chip. His studies link Barrier layer with Optoelectronics. Sten Heikman combines subjects such as Doping and Dielectric with his study of Light-emitting diode.
Sten Heikman studied Layer and Coating that intersect with Wafer, Light emitter, Light emission, Substrate and Absorption. The study incorporates disciplines such as High voltage, Voltage and Current in addition to Chip. His study in Trench is interdisciplinary in nature, drawing from both Transistor and Electron mobility.
Sten Heikman spends much of his time researching Optoelectronics, Layer, Chip, Light-emitting diode and Planar. Sten Heikman is involved in the study of Optoelectronics that focuses on Wavelength in particular. His studies deal with areas such as Light extraction in LEDs, Light source, Blanket and Total internal reflection as well as Wavelength.
His research integrates issues of Barrier layer, Trench and Buffer in his study of Electronic engineering. His biological study focuses on High voltage. He performs integrative study on Normally off and Semiconductor device.
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AlGaN/AlN/GaN high-power microwave HEMT
L. Shen;S. Heikman;B. Moran;R. Coffie.
IEEE Electron Device Letters (2001)
AlGaN/AlN/GaN high-power microwave HEMT
L. Shen;S. Heikman;B. Moran;R. Coffie.
IEEE Electron Device Letters (2001)
AlGaN/GaN high electron mobility transistors with InGaN back-barriers
T. Palacios;A. Chakraborty;S. Heikman;S. Keller.
IEEE Electron Device Letters (2006)
AlGaN/GaN high electron mobility transistors with InGaN back-barriers
T. Palacios;A. Chakraborty;S. Heikman;S. Keller.
IEEE Electron Device Letters (2006)
Growth of Fe doped semi-insulating GaN by metalorganic chemical vapor deposition
Sten Heikman;Stacia Keller;Steven P. DenBaars;Umesh K. Mishra.
Applied Physics Letters (2002)
Growth of Fe doped semi-insulating GaN by metalorganic chemical vapor deposition
Sten Heikman;Stacia Keller;Steven P. DenBaars;Umesh K. Mishra.
Applied Physics Letters (2002)
High breakdown voltage AlGaN-GaN HEMTs achieved by multiple field plates
Huili Xing;Y. Dora;A. Chini;S. Heikman.
IEEE Electron Device Letters (2004)
NORMALLY-OFF TYPE SEMICONDUCTOR DEVICE AND MANUFACTURE METHOD OF THE SAME
Sten Heikman;Wu Yifeng.
(2014)
NORMALLY-OFF TYPE SEMICONDUCTOR DEVICE AND MANUFACTURE METHOD OF THE SAME
Sten Heikman;Wu Yifeng.
(2014)
High breakdown voltage AlGaN-GaN HEMTs achieved by multiple field plates
Huili Xing;Y. Dora;A. Chini;S. Heikman.
IEEE Electron Device Letters (2004)
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