The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Jonathan J. Wierer sits on this spectrum.
This scientist: 128 publications — 18th percentile
18% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 804 publications or more.
The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Jonathan J. Wierer sits on this spectrum.
This scientist: 34 D-Index — 7th percentile
7% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 107 D-Index or more.
Jonathan J. Wierer is affiliated with North Carolina State University in the United States. Their research primarily focuses on semiconductor materials and devices, with a strong emphasis on GaN-based technologies and related materials.
Their body of work spans several main fields of study, including Physics and Astronomy, Materials Science, and Engineering. Within these areas, the subfields they contribute to include Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Materials Chemistry, Electrical and Electronic Engineering, and Atomic and Molecular Physics and Optics.
Wierer's research encompasses a variety of topics, notably:
The scientist's recent papers demonstrate active contributions in journals focused on semiconductor and materials research. Selected recent publications include:
Frequent co-authors in Wierer's collaborative network include:
Their work is regularly published in significant journals such as the Journal of Crystal Growth, Journal of Applied Physics, IEEE Journal of Quantum Electronics, IEEE Transactions on Electron Devices, and Applied Physics Letters.
Jonathan J. Wierer;Aurelien David;Mischa M. Megens
J. J. Wierer;D. A. Steigerwald;M. R. Krames;J. J. O’Shea
Jonathan J. Wierer;Jeffrey Y. Tsao;Dmitry S. Sizov
J. J. Wierer;M. R. Krames;J. E. Epler;N. F. Gardner
Jeffrey Y. Tsao;Mary H. Crawford;Michael E. Coltrin;Arthur J. Fischer
F.M. Steranka;J. Bhat;D. Collins;L. Cook
A.Y. Kim;W. Götz;D.A. Steigerwald;J.J. Wierer
N. F. Gardner;J. C. Kim;J. J. Wierer;Y. C. Shen
Alexander Neumann;Jonathan Wierer;Wendy L. Davis;Yoshihiro Ohno
Tae Il Kim;Yei Hwan Jung;Jizhou Song;Daegon Kim
Jonathan J. Wierer;Michael R. Krames;John E. Epler
Nathan F. Gardner;Jonathan J. Wierer;Gerd O. Mueller;Michael R. Krames
Y. C. Shen;J. J. Wierer;M. R. Krames;M. J. Ludowise
Jonathan J. Wierer;Nelson Tansu
Jeramy R. Dickerson;Andrew A. Allerman;Benjamin N. Bryant;Arthur J. Fischer
Jonathan J Wierer;Qiming Li;Daniel D Koleske;Stephen R Lee
James R. Riley;Sonal Padalkar;Qiming Li;Ping Lu
J. J. Wierer;A. J. Fischer;D. D. Koleske
Andrew M. Armstrong;Benjamin N. Bryant;Mary H. Crawford;Daniel D. Koleske
M. R. Krames;J. Bhat;D. Collins;N. F. Gardner
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