World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
60
Citations
14586
World Ranking
1624
National Ranking
656

Materials Science

D-Index
61
Citations
14856
World Ranking
6717
National Ranking
1694

Overview

Tso-Ping Ma is a researcher affiliated with Yale University in the United States. Their recent academic contributions are centered around the field of memory technology, particularly focusing on ferroelectric memory.

Their most recent publication is titled (Invited) Some Recent Progress in Ferroelectric Memory Technology, published in 2021 in the ECS Meeting Abstracts. This paper represents the available documented research contribution and reflects a focus on advances in ferroelectric memory devices.

Frequent co-authors include:

  • Hao Jiang

The primary publication venue for their documented work is:

  • ECS Meeting Abstracts

This indicates that their research is disseminated through conferences and symposia that emphasize electrochemical and solid-state science, which aligns with their technical focus on memory technologies.

Best Publications

  • Ionizing radiation effects in MOS devices and circuits

    T. P. Ma;Paul V. Dressendorfer

  • Black Phosphorus Mid-Infrared Photodetectors with High Gain

    Qiushi Guo;Andreas Pospischil;Maruf Bhuiyan;Hao Jiang

  • Why is nonvolatile ferroelectric memory field-effect transistor still elusive?

    T.P. Ma;Jin-Ping Han

  • Making silicon nitride film a viable gate dielectric

    T.P. Ma

  • Current transport in metal/hafnium oxide/silicon structure

    W.J. Zhu;Tso-Ping Ma;T. Tamagawa;J. Kim

  • Effect of Al inclusion in HfO 2 on the physical and electrical properties of the dielectrics

    W.J. Zhu;T. Tamagawa;M. Gibson;T. Furukawa

  • Ferroelectric field effect transistors for memory applications.

    Jason Hoffman;Xiao Pan;James W. Reiner;Fred J. Walker

  • Mobility measurement and degradation mechanisms of MOSFETs made with ultrathin high-k dielectrics

    Wenjuan Zhu;Jin-Ping Han;T.P. Ma

  • Direct tunneling gate leakage current in transistors with ultrathin silicon nitride gate dielectric

    Yee Chia Yeo;Qiang Lu;Wen Chin Lee;Wen Chin Lee;Tsu-Jae King

  • A Study of Endurance Issues in HfO 2 -Based Ferroelectric Field Effect Transistors: Charge Trapping and Trap Generation

    Nanbo Gong;Tso-Ping Ma

  • Tunneling leakage current in oxynitride: dependence on oxygen/nitrogen content

    Xin Guo;T.P. Ma

  • Why Is FE–HfO 2 More Suitable Than PZT or SBT for Scaled Nonvolatile 1-T Memory Cell? A Retention Perspective

    Nanbo Gong;Tso-Ping Ma

  • Polarity dependent gate tunneling currents in dual-gate CMOSFETs

    Ying Shi;T.P. Ma;S. Prasad;S. Dhanda

  • Charge trapping in ultrathin hafnium oxide

    W.J. Zhu;T.P. Ma;S. Zafar;T. Tamagawa

  • High‐quality transparent conductive indium oxide films prepared by thermal evaporation

    C. A. Pan;T. P. Ma

  • The impact of device scaling on the current fluctuations in MOSFET's

    Ming-Horn Tsai;Tso-Ping Ma

  • HfO/sub 2/ and HfAlO for CMOS: thermal stability and current transport

    W. Zhu;T.P. Ma;T. Tamagawa;Y. Di

  • Interface trap transformation in radiation or hot-electron damaged MOS structures

    T P Ma

  • High-quality oxide/nitride/oxide gate insulator for GaN MIS structures

    B. Gaffey;L.J. Guido;X.W. Wang;T.P. Ma

  • Direct lateral profiling of hot-carrier-induced oxide charge and interface traps in thin gate MOSFET's

    Chun Chen;Tso-Ping Ma

Frequent Co-Authors

Wenjuan Zhu
Wenjuan Zhu University of Illinois at Urbana-Champaign
Chenming Hu
Chenming Hu University of California, Berkeley
Tsu-Jae King
Tsu-Jae King University of California, Berkeley
Daniel M. Fleetwood
Daniel M. Fleetwood Vanderbilt University
Robert A. Reed
Robert A. Reed Vanderbilt University
Peide D. Ye
Peide D. Ye Purdue University West Lafayette
Stephen A. Campbell
Stephen A. Campbell University of Minnesota
Susanne Stemmer
Susanne Stemmer University of California, Santa Barbara
Wayne L. Gladfelter
Wayne L. Gladfelter University of Minnesota
Zhi Liu
Zhi Liu ShanghaiTech University

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