John A. Woollam

Research.com Recognitions

• 2014 - Fellow, National Academy of Inventors
• 1985 - Fellow of American Physical Society (APS) Citation For significant contributions to experimental condensed matter physics, especially electronic properties of graphite, its intercalation compounds, and amorphous carbon, and superconductivity of intercalated layered chalcogenides and ternary Chevrel compounds

Overview

Best Publications

• Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films

  R. O. Dillon;John A. Woollam;V. Katkanant

  1555
  Citations

• Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

  C. M. Herzinger;B. Johs;W. A. McGahan;John A. Woollam

  1438
  Citations

• Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2

  Mathias Schubert;Bernd Rheinländer;John A. Woollam;Blaine Johs

  214
  Citations

• Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry

  Thomas E. Tiwald;John A. Woollam;Stefan Zollner;Jim Christiansen

  194
  Citations

• Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles

  Thomas E. Tiwald;Daniel W. Thompson;John A. Woollam;Wayne Paulson

  166
  Citations

• Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films

  William A. McGahan;Blaine Johs;John A. Woollam

  164
  Citations

• Giant photoresistivity and optically controlled switching in self-assembled nanowires

  N. Kouklin;L. Menon;A. Z. Wong;Daniel W. Thompson

  163
  Citations

• InP optical constants between 0.75 and 5.0 eV determined by variable‐angle spectroscopic ellipsometry

  C. M. Herzinger;Paul G. Snyder;B. Johs;John A. Woollam

  161
  Citations

• Optical constants of GaxIn1−xP lattice matched to GaAs

  Mathias Schubert;V. Gottschalch;Craig M. Herzinger;Huade Yao

  160
  Citations

• Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures

  Paul G. Snyder;Martin C. Rost;George H. Bu‐Abbud;John A. Woollam

  157
  Citations

• Optical properties of bulk and thin-film SrTiO3 on Si and Pt

  Stefan Zollner;Alexander A Demkov;R. Liu;P. L. Fejes

  150
  Citations

• Infrared switching electrochromic devices based on tungsten oxide

  E. B. Franke;E. B. Franke;C. L. Trimble;J. S. Hale;Mathias Schubert

  149
  Citations

• Modeling AlxGa1−xAs optical constants as functions of composition

  Paul G. Snyder;John A. Woollam;Samuel A. Alterovitz;Blaine D. Johs

  143
  Citations

• Temperature dependence of optical properties of GaAs

  Huade Yao;Paul G. Snyder;John A. Woollam

  135
  Citations

• Positive Curvature of the H c 2 -versus- T c Boundaries in Layered Superconductors

  John A. Woollam;Robert B. Somoano;Paul O'Connor

  133
  Citations

• Superconducting critical fields of alkali and alkaline-earth intercalates of MoS2

  John A. Woollam;Robert B. Somoano

  131
  Citations

• Variable wavelength, variable angle ellipsometry including a sensitivities correlation test

  G.H. Bu-Abbud;N.M. Bashara;John A. Woollam

  131
  Citations

• Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis

  C. M. Herzinger;H. Yao;Paul G. Snyder;F. G. Celii

  121
  Citations

• Prospects for IR emissivity control using electrochromic structures

  Jeffrey S. Hale;John A. Woollam

  121
  Citations

• Visible and infrared optical constants of electrochromic materials for emissivity modulation applications

  Jeffrey S. Hale;Michael DeVries;Brad Dworak;John A. Woollam

  115
  Citations

• High-Pressure and Low-Temperature Physics

  Ching-wu Chu;John A. Woollam

  94
  Citations