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D-Index & Metrics

Materials Science

D-Index
56
Citations
13314
World Ranking
8181
National Ranking
2016

Mathias Schubert publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Mathias Schubert sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 404 publications — 78th percentile

78% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Mathias Schubert D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Mathias Schubert sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 56 D-Index — 37th percentile

37% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Overview

Mathias Schubert is a researcher affiliated with the University of Nebraska-Lincoln in the United States. Their primary fields of study include Materials Science and Engineering, with significant contributions to subfields such as Materials Chemistry, Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Atomic and Molecular Physics and Optics, and Biomedical Engineering.

The research topics covered by Schubert encompass multiple specialized areas, including Ga2O3 and related materials, ZnO doping and properties, plasmonic and surface plasmon research, GaN-based semiconductor devices and materials, metamaterials and metasurfaces applications, photonic and optical devices, and perovskite materials and applications.

The researcher has a notable publication record with frequent appearances in several scientific venues. These venues include Applied Physics Letters, arXiv (Cornell University), Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, and Physical Review Applied.

Among the recent publications attributed to Schubert are the following:

  • A review of band structure and material properties of transparent conducting and semiconducting oxides: Ga2O3, Al2O3, In2O3, ZnO, SnO2, CdO, NiO, CuO, and Sc2O3 (2022), Applied Physics Reviews
  • Assessing the Release of Microplastics and Nanoplastics from Plastic Containers and Reusable Food Pouches: Implications for Human Health (2023), Environmental Science & Technology
  • Hyperbolic shear polaritons in low-symmetry crystals (2022), Nature
  • The 2022 magneto-optics roadmap (2022), Journal of Physics D Applied Physics
  • Broadband enhanced chirality with tunable response in hybrid plasmonic helical metamaterials (2021), arXiv (Cornell University)

Mathias Schubert has collaborated frequently with several coauthors, including Vanya Darakchieva, Ufuk Kılıç, Matthew Hilfiker, Megan Stokey, and Rafał Korlacki. These collaborations underline a network within various branches of materials science and engineering.

Best Publications

  • Infrared dielectric functions and phonon modes of high-quality ZnO films

    N. Ashkenov;B.N. Mbenkum;C. Bundesmann;V. Riede

  • Raman scattering in ZnO thin films doped with Fe, Sb, Al, Ga, and Li

    C. Bundesmann;N. Ashkenov;M. Schubert;D. Spemann

  • Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems.

    Mathias Schubert

  • Infrared dielectric anisotropy and phonon modes of sapphire

    M. Schubert;M. Schubert;T. E. Tiwald;C. M. Herzinger

  • A review of band structure and material properties of transparent conducting and semiconducting oxides: Ga2O3, Al2O3, In2O3, ZnO, SnO2, CdO, NiO, CuO, and Sc2O3

    Unknown

  • Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry

    A. Kasic;Mathias Schubert;S. Einfeldt;D. Hommel

  • Anisotropy, phonon modes, and free charge carrier parameters in monoclinic β-gallium oxide single crystals

    M. Schubert;M. Schubert;R. Korlacki;S. Knight;T. Hofmann;T. Hofmann

  • Effective electron mass and phonon modes in n-type hexagonal InN

    A. Kasic;A. Kasic;M. Schubert;M. Schubert;Y. Saito;Y. Nanishi

  • Dielectric functions (1 to 5 eV) of wurtzite MgXZn1 -XO (x≤0.29) thin films

    R. Schmidt;B. Rheinländer;M. Schubert;D. Spemann

  • Investigation of Bovine Serum Albumin (BSA) Attachment onto Self-Assembled Monolayers (SAMs) Using Combinatorial Quartz Crystal Microbalance with Dissipation (QCM-D) and Spectroscopic Ellipsometry (SE)

    Hanh T.M. Phan;Shannon L. Bartelt-Hunt;Keith B. Rodenhausen;Mathias Schubert

  • Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2

    Mathias Schubert;Bernd Rheinländer;John A. Woollam;Blaine Johs

  • Band-to-band transitions, selection rules, effective mass, and excitonic contributions in monoclinic β − Ga 2 O 3

    Alyssa Mock;Rafał Korlacki;Chad Briley;Vanya Darakchieva

  • Optical constants of GaxIn1−xP lattice matched to GaAs

    Mathias Schubert;V. Gottschalch;Craig M. Herzinger;Huade Yao

  • Infrared ellipsometry on semiconductor layer structures

    Mathias Schubert

  • Infrared switching electrochromic devices based on tungsten oxide

    E. B. Franke;E. B. Franke;C. L. Trimble;J. S. Hale;Mathias Schubert

  • Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons

    Mathias Schubert

  • Kramers-Kronig-consistent optical functions of anisotropic crystals: generalized spectroscopic ellipsometry on pentacene.

    M. Dressel;B. Gompf;D. Faltermeier;A. K. Tripathi

  • Metalorganic chemical vapor phase epitaxy of gallium-nitride on silicon

    A. Dadgar;A. Strittmatter;J. Bläsing;M. Poschenrieder

  • Anisotropic strain and phonon deformation potentials in GaN

    V. Darakchieva;T. Paskova;Mathias Schubert;H. Arwin

  • Generalized ellipsometry and complex optical systems

    Mathias Schubert;Mathias Schubert

  • Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs

    Mathias Schubert;Tino Hofmann;Craig M. Herzinger

  • Hyperbolic Shear Polaritons in Low-Symmetry Crystals

    Nikolai Passler;Xiang Ni;Guangwei Hu;Joseph Matson

Frequent Co-Authors

John A. Woollam
John A. Woollam University of Nebraska–Lincoln
Bo Monemar
Bo Monemar Linköping University
Marius Grundmann
Marius Grundmann Leipzig University
Michael Lorenz
Michael Lorenz Leipzig University
William J. Schaff
William J. Schaff Cornell University
Detlef Hommel
Detlef Hommel University of Wrocław
Hans Arwin
Hans Arwin Linköping University
Rositsa Yakimova
Rositsa Yakimova Linköping University
Per Persson
Per Persson Linköping University
Peter A. Dowben
Peter A. Dowben University of Nebraska–Lincoln

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