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Materials Science

D-Index
53
Citations
9907
World Ranking
9250
National Ranking
101

Overview

Hans Arwin is affiliated with Linköping University in Sweden and has contributed extensively to research in materials science and engineering, particularly within the domains of optical and electronic materials.

The primary research fields of focus include:

  • Materials Science
  • Engineering
  • Agricultural and Biological Sciences

Their work spans important subfields such as:

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Plant Science
  • Biomaterials
  • Biomedical Engineering

Research topics often addressed in their publications include:

  • Liquid Crystal Research Advancements
  • Advanced Cellulose Research Studies
  • Polysaccharides and Plant Cell Walls
  • Optical Polarization and Ellipsometry
  • Magneto-Optical Properties and Applications
  • Analytical Chemistry and Sensors
  • Electrochemical sensors and biosensors

Recent peer-reviewed publications authored or co-authored by Hans Arwin include:

  • Optical Chirality Determined from Mueller Matrices, 2021, Applied Sciences
  • Shear-Coated Linear Birefringent and Chiral Cellulose Nanocrystal Films Prepared from Non-Sonicated Suspensions with Different Storage Time, 2021, Nanomaterials
  • Effective absorption coefficient and effective thickness in attenuated total reflection spectroscopy, 2021, Optics Letters
  • Quantification of Optical Chirality in Cellulose Nanocrystal Films Prepared by Shear-Coating, 2021, Applied Sciences
  • Laminated Organic Photovoltaic Modules for Agrivoltaics and Beyond: An Outdoor Stability Study of All-Polymer and Polymer:Small Molecule Blends, 2022, Advanced Functional Materials

Hans Arwin frequently collaborates with several researchers, notable among them:

  • Kenneth Järrendahl
  • A. Mendoza-Galván
  • Olga Rubí Juárez-Rivera
  • Reina Araceli Mauricio-Sánchez
  • Roger Magnusson

Publications appear repeatedly in specific venues that align with their research focus, including:

  • Applied Sciences
  • Nanomaterials
  • Optics Letters
  • Advanced Functional Materials
  • Advanced Photonics Research

Best Publications

  • Infrared dielectric functions and phonon modes of high-quality ZnO films

    N. Ashkenov;B.N. Mbenkum;C. Bundesmann;V. Riede

  • Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates

    Gang Jin;Roger Jansson;Hans Arwin

  • Total internal reflection ellipsometry: principles and applications

    Hans Arwin;Michal Poksinski;Knut Johansen

  • Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry

    T.W.H. Oates;Herbert Wormeester;H. Arwin

  • Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations

    Knut Johansen;Hans Arwin;Ingemar Lundström;Bo Liedberg

  • A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering

    S. Guo;H. Arwin;S. N. Jacobsen;K. Järrendahl

  • Increased electromechanical coupling in w−ScxAl1−xN

    Gunilla Wingqvist;Ferenc Tasnádi;Agne Zukauskaite;Jens Birch

  • A Biosensor Concept Based on Imaging Ellipsometry for Visualization of Biomolecular Interactions

    Gang Jin;Pentti Tengvall;Ingemar Lundström;Hans Arwin

  • Optical properties of MgH2 measured in situ by ellipsometry and spectrophotometry

    J. Isidorsson;I.A.M.E. Giebels;H. Arwin;R.P. Griessen

  • Ellipsometry on thin organic layers of biological interest: characterization and applications

    Hans Arwin

  • Spectroscopic ellipsometry studies of the optical properties of doped poly(3,4-ethylenedioxythiophene): an anisotropic metal

    Leif A.A. Pettersson;Fredrik Carlsson;Olle Inganäs;Hans Arwin

  • Optical optimization of polyfluorene-fullerene blend photodiodes

    Nils-Krister Persson;Hans Arwin;Olle Inganas

  • Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry

    C. Wongmanerod;S. Zangooie;Hans Arwin

  • Electronic and optical properties of lead iodide

    R. Ahuja;H. Arwin;A. Ferreira da Silva;C. Persson

  • Unambiguous determination of thickness and dielectric function of thin films by spectroscopic ellipsometry

    Unknown

  • Spectroscopic ellipsometry and biology: recent developments and challenges

    H. Arwin

  • Spectroscopic Ellipsometry Characterisation and Estimation of the Hamaker Constant of Cellulose

    Lennart Bergström;Sara Stemme;Torbjörn Dahlfors;Hans Arwin

  • Protein monolayers monitored by internal reflection ellipsometry

    Michal Poksinski;Hans Arwin

  • Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition

    Iryna Valyukh;Sara Green;Hans Arwin;Gunnar A. Niklasson

  • Anisotropic strain and phonon deformation potentials in GaN

    V. Darakchieva;T. Paskova;Mathias Schubert;H. Arwin

  • Vapor sensitivity of thin porous silicon layers

    S. Zangooie;R. Bjorklund;H. Arwin

Frequent Co-Authors

Ingemar Lundström
Ingemar Lundström Linköping University
Pentti Tengvall
Pentti Tengvall University of Gothenburg
Olle Inganäs
Olle Inganäs Linköping University
Lars Hultman
Lars Hultman Linköping University
Jens Birch
Jens Birch Linköping University
Mathias Schubert
Mathias Schubert University of Nebraska–Lincoln
John A. Woollam
John A. Woollam University of Nebraska–Lincoln
Clas Persson
Clas Persson University of Oslo
Eleanor E. B. Campbell
Eleanor E. B. Campbell University of Edinburgh
Gunnar A. Niklasson
Gunnar A. Niklasson Uppsala University

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