D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Materials Science D-index 44 Citations 6,996 187 World Ranking 7252 National Ranking 85

Overview

What is he best known for?

The fields of study he is best known for:

  • Optics
  • Organic chemistry
  • Refractive index

Hans Arwin mainly focuses on Ellipsometry, Thin film, Analytical chemistry, Optics and Dielectric. His Ellipsometry research is multidisciplinary, incorporating perspectives in Adsorption, Protein adsorption, Permittivity, Biosensor and Optoelectronics. Hans Arwin combines subjects such as Characterization, Microstructure, Polymer chemistry and Electrochromism with his study of Thin film.

His Analytical chemistry study combines topics in areas such as In situ, Silicon, Amorphous solid, Carbon film and Surface roughness. His Optics study which covers Surface plasmon resonance that intersects with Total internal reflection and Surface plasmon. His Dielectric research is multidisciplinary, relying on both Raman scattering, Plasmon, Infrared spectroscopy and Metamaterial.

His most cited work include:

  • Infrared dielectric functions and phonon modes of high-quality ZnO films (508 citations)
  • A Biosensor Concept Based on Imaging Ellipsometry for Visualization of Biomolecular Interactions (186 citations)
  • Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates (168 citations)

What are the main themes of his work throughout his whole career to date?

Ellipsometry, Optics, Analytical chemistry, Thin film and Optoelectronics are his primary areas of study. Ellipsometry is a subfield of Nanotechnology that Hans Arwin studies. His Analytical chemistry research integrates issues from Spectroscopic ellipsometry, Photon energy, Infrared and Silicon.

His studies deal with areas such as Characterization and Dielectric function as well as Spectroscopic ellipsometry. The Thin film study combines topics in areas such as Condensed matter physics and Dielectric. His biological study spans a wide range of topics, including Inorganic chemistry, Monolayer, Human serum albumin and Chemical engineering.

He most often published in these fields:

  • Ellipsometry (45.07%)
  • Optics (36.18%)
  • Analytical chemistry (33.55%)

What were the highlights of his more recent work (between 2010-2021)?

  • Optics (36.18%)
  • Ellipsometry (45.07%)
  • Mueller calculus (10.86%)

In recent papers he was focusing on the following fields of study:

His primary scientific interests are in Optics, Ellipsometry, Mueller calculus, Polarization and Analytical chemistry. His Optics study frequently involves adjacent topics like Nanostructure. The study incorporates disciplines such as Oxide, Adsorption, Composite material, Total internal reflection and Sputter deposition in addition to Ellipsometry.

His Mueller calculus study incorporates themes from Polarizer, Cetonia aurata, Degree of polarization, Liquid crystal and Cuticle. Hans Arwin has included themes like Carbon, Amorphous carbon, Protein adsorption and Thin film, Spectroscopic ellipsometry in his Analytical chemistry study. His study looks at the relationship between Thin film and fields such as Optoelectronics, as well as how they intersect with chemical problems.

Between 2010 and 2021, his most popular works were:

  • Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry (144 citations)
  • Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson (64 citations)
  • Phase behaviour of liquid-crystalline polymer/fullerene organic photovoltaic blends: thermal stability and miscibility (57 citations)

In his most recent research, the most cited papers focused on:

  • Optics
  • Organic chemistry
  • Semiconductor

His primary areas of investigation include Optics, Thin film, Mueller calculus, Ellipsometry and Analytical chemistry. Hans Arwin focuses mostly in the field of Optics, narrowing it down to topics relating to Optoelectronics and, in certain cases, Reflectivity and Diffraction efficiency. His research in Thin film intersects with topics in Composite material, Substrate, Phase and Polymer chemistry.

His work deals with themes such as Cetonia aurata, Molecular physics, Cuticle and Birefringence, which intersect with Mueller calculus. His Ellipsometry research includes themes of Nanocellulose, Nanostructure, Electrical resistivity and conductivity, Crystallite and Infrared spectroscopy. Hans Arwin interconnects Deposition, Amorphous carbon, Amorphous solid, Spectroscopic ellipsometry and Dielectric function in the investigation of issues within Analytical chemistry.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Infrared dielectric functions and phonon modes of high-quality ZnO films

N. Ashkenov;B.N. Mbenkum;C. Bundesmann;V. Riede.
Journal of Applied Physics (2003)

691 Citations

A Biosensor Concept Based on Imaging Ellipsometry for Visualization of Biomolecular Interactions

Gang Jin;Pentti Tengvall;Ingemar Lundström;Hans Arwin.
Analytical Biochemistry (1995)

274 Citations

Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates

Gang Jin;Roger Jansson;Hans Arwin.
Review of Scientific Instruments (1996)

254 Citations

Total internal reflection ellipsometry: principles and applications

Hans Arwin;Michal Poksinski;Knut Johansen.
Applied Optics (2004)

235 Citations

Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry

T.W.H. Oates;Herbert Wormeester;H. Arwin.
Progress in Surface Science (2011)

213 Citations

Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations

Knut Johansen;Hans Arwin;Ingemar Lundström;Bo Liedberg.
Review of Scientific Instruments (2000)

211 Citations

Optical properties of MgH2 measured in situ by ellipsometry and spectrophotometry

J. Isidorsson;I.A.M.E. Giebels;H. Arwin;R.P. Griessen.
Physical Review B (2003)

190 Citations

A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering

S. Guo;H. Arwin;S. N. Jacobsen;K. Järrendahl.
Journal of Applied Physics (1995)

180 Citations

Ellipsometry on thin organic layers of biological interest: characterization and applications

Hans Arwin.
Thin Solid Films (2000)

172 Citations

Spectroscopic ellipsometry studies of the optical properties of doped poly(3,4-ethylenedioxythiophene): an anisotropic metal

Leif A.A. Pettersson;Fredrik Carlsson;Olle Inganäs;Hans Arwin.
Thin Solid Films (1998)

170 Citations

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