Hans Arwin mainly focuses on Ellipsometry, Thin film, Analytical chemistry, Optics and Dielectric. His Ellipsometry research is multidisciplinary, incorporating perspectives in Adsorption, Protein adsorption, Permittivity, Biosensor and Optoelectronics. Hans Arwin combines subjects such as Characterization, Microstructure, Polymer chemistry and Electrochromism with his study of Thin film.
His Analytical chemistry study combines topics in areas such as In situ, Silicon, Amorphous solid, Carbon film and Surface roughness. His Optics study which covers Surface plasmon resonance that intersects with Total internal reflection and Surface plasmon. His Dielectric research is multidisciplinary, relying on both Raman scattering, Plasmon, Infrared spectroscopy and Metamaterial.
Ellipsometry, Optics, Analytical chemistry, Thin film and Optoelectronics are his primary areas of study. Ellipsometry is a subfield of Nanotechnology that Hans Arwin studies. His Analytical chemistry research integrates issues from Spectroscopic ellipsometry, Photon energy, Infrared and Silicon.
His studies deal with areas such as Characterization and Dielectric function as well as Spectroscopic ellipsometry. The Thin film study combines topics in areas such as Condensed matter physics and Dielectric. His biological study spans a wide range of topics, including Inorganic chemistry, Monolayer, Human serum albumin and Chemical engineering.
His primary scientific interests are in Optics, Ellipsometry, Mueller calculus, Polarization and Analytical chemistry. His Optics study frequently involves adjacent topics like Nanostructure. The study incorporates disciplines such as Oxide, Adsorption, Composite material, Total internal reflection and Sputter deposition in addition to Ellipsometry.
His Mueller calculus study incorporates themes from Polarizer, Cetonia aurata, Degree of polarization, Liquid crystal and Cuticle. Hans Arwin has included themes like Carbon, Amorphous carbon, Protein adsorption and Thin film, Spectroscopic ellipsometry in his Analytical chemistry study. His study looks at the relationship between Thin film and fields such as Optoelectronics, as well as how they intersect with chemical problems.
His primary areas of investigation include Optics, Thin film, Mueller calculus, Ellipsometry and Analytical chemistry. Hans Arwin focuses mostly in the field of Optics, narrowing it down to topics relating to Optoelectronics and, in certain cases, Reflectivity and Diffraction efficiency. His research in Thin film intersects with topics in Composite material, Substrate, Phase and Polymer chemistry.
His work deals with themes such as Cetonia aurata, Molecular physics, Cuticle and Birefringence, which intersect with Mueller calculus. His Ellipsometry research includes themes of Nanocellulose, Nanostructure, Electrical resistivity and conductivity, Crystallite and Infrared spectroscopy. Hans Arwin interconnects Deposition, Amorphous carbon, Amorphous solid, Spectroscopic ellipsometry and Dielectric function in the investigation of issues within Analytical chemistry.
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Infrared dielectric functions and phonon modes of high-quality ZnO films
N. Ashkenov;B.N. Mbenkum;C. Bundesmann;V. Riede.
Journal of Applied Physics (2003)
A Biosensor Concept Based on Imaging Ellipsometry for Visualization of Biomolecular Interactions
Gang Jin;Pentti Tengvall;Ingemar Lundström;Hans Arwin.
Analytical Biochemistry (1995)
Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates
Gang Jin;Roger Jansson;Hans Arwin.
Review of Scientific Instruments (1996)
Total internal reflection ellipsometry: principles and applications
Hans Arwin;Michal Poksinski;Knut Johansen.
Applied Optics (2004)
Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
T.W.H. Oates;Herbert Wormeester;H. Arwin.
Progress in Surface Science (2011)
Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations
Knut Johansen;Hans Arwin;Ingemar Lundström;Bo Liedberg.
Review of Scientific Instruments (2000)
Optical properties of MgH2 measured in situ by ellipsometry and spectrophotometry
J. Isidorsson;I.A.M.E. Giebels;H. Arwin;R.P. Griessen.
Physical Review B (2003)
A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering
S. Guo;H. Arwin;S. N. Jacobsen;K. Järrendahl.
Journal of Applied Physics (1995)
Ellipsometry on thin organic layers of biological interest: characterization and applications
Hans Arwin.
Thin Solid Films (2000)
Spectroscopic ellipsometry studies of the optical properties of doped poly(3,4-ethylenedioxythiophene): an anisotropic metal
Leif A.A. Pettersson;Fredrik Carlsson;Olle Inganäs;Hans Arwin.
Thin Solid Films (1998)
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