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Materials Science

D-Index
62
Citations
14064
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6462
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Research.com Recognitions

  • 2013 - Fellow of American Physical Society (APS) Citation For advancing the understanding of the optical properties and structures of thin film materials and devices, for innovations in realtime spectroscopic ellipsometry, and for leadership of research collaborations of industrial, government, and university laboratories

Overview

Robert W. Collins is affiliated with the University of Toledo in the United States. Their research primarily intersects the fields of Engineering and Materials Science, with a focus on subfields including Materials Chemistry and Electrical and Electronic Engineering.

The scientist's work encompasses several main topics, notably:

  • Chalcogenide Semiconductor Thin Films
  • Quantum Dots Synthesis And Properties
  • Copper-based nanomaterials and applications
  • ZnO doping and properties
  • Acute Myeloid Leukemia Research
  • Phase-change materials and chalcogenides
  • Perovskite Materials and Applications

Robert W. Collins has contributed to multiple recent publications spanning various areas related to thin film materials and photovoltaics. Notable papers include:

  • "Enabling bifacial thin film devices by developing a back surface field using CuxAlOy", 2021, published in Nano Energy
  • "Zinc Oxide Nanoparticles-Solution-Based Synthesis and Characterizations", 2023, published in Nanomaterials
  • "Optical properties of thin film Sb2Se3 and identification of its electronic losses in photovoltaic devices", 2021, published in Solar Energy
  • "Impact of lifetime on the levelized cost of electricity from perovskite single junction and tandem solar cells", 2022, published in Sustainable Energy & Fuels
  • "Reduced Recombination and Improved Performance of CdSe/CdTe Solar Cells due to Cu Migration Induced by Light Soaking", 2022, published in ACS Applied Materials & Interfaces

Frequent coauthors in their research collaborations have included:

  • Nikolas J. Podraza
  • Prakash Koirala
  • Michael J. Heben
  • Adam B. Phillips
  • Balaji Ramanujam

Their publications appear in various scholarly venues, including:

  • Materials
  • 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC)
  • Clinical Lymphoma Myeloma & Leukemia
  • Solar Energy Materials and Solar Cells
  • arXiv (Cornell University)

Robert W. Collins has also contributed to book publications, particularly with the publisher World Scientific, which includes multiple editions of "The World Scientific Reference of Amorphous Materials" published in 2020.

In recognition of their work, they received the award of Fellow of the American Physical Society in 2013, with the citation highlighting advances in understanding optical properties and structures of thin film materials and devices, innovations in realtime spectroscopic ellipsometry, and leadership in collaborative research efforts involving industrial, government, and university laboratories.

Best Publications

  • Analytical model for the optical functions of amorphous semiconductors from the near-infrared to ultraviolet: Applications in thin film photovoltaics

    A. S. Ferlauto;G. M. Ferreira;Joshua M. Pearce;C. R. Wronski

  • Optical band gap of BiFeO3 grown by molecular-beam epitaxy

    J. F. Ihlefeld;J. F. Ihlefeld;N. J. Podraza;Z. K. Liu;R. C. Rai

  • Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry

    R.W. Collins;A.S. Ferlauto;G.M. Ferreira;Chi Chen

  • Pulsed laser deposition of diamond‐like carbon films

    David L. Pappas;Katherine L. Saenger;John Bruley;William Krakow

  • Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films

    H. Fujiwara;Joohyun Koh;P. I. Rovira;R. W. Collins

  • Intrinsic stress in diamond films prepared by microwave plasma CVD

    H. Windischmann;Glenn F. Epps;Yue Cong;R. W. Collins

  • Linear and nonlinear optical properties of BiFeO3

    Amit Kumar;Ram C. Rai;Nikolas J. Podraza;Sava Denev

  • Optimization of hydrogenated amorphous silicon p–i–n solar cells with two-step i layers guided by real-time spectroscopic ellipsometry

    Joohyun Koh;Yeeheng Lee;H. Fujiwara;C. R. Wronski

  • Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth

    Joungchel Lee;P. I. Rovira;Ilsin An;R. W. Collins

  • EVOLUTIONARY PHASE DIAGRAMS FOR PLASMA-ENHANCED CHEMICAL VAPOR DEPOSITION OF SILICON THIN FILMS FROM HYDROGEN-DILUTED SILANE

    Joohyun Koh;A. S. Ferlauto;P. I. Rovira;C. R. Wronski

  • Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films

    R. W. Collins;Joohyun Koh

  • Chemical Effects of Methyl and Methyl Ester Groups on the Nucleation and Growth of Vapor-Deposited Aluminum Films

    A. Hooper;G. L. Fisher;K. Konstadinidis;D. Jung

  • The temperature dependence of photoluminescence in a-Si: H alloys

    R.W. Collins;M.A. Paesler;William Paul

  • Annealing-free efficient vacuum-deposited planar perovskite solar cells with evaporated fullerenes as electron-selective layers

    Dewei Zhao;Dewei Zhao;Weijun Ke;Corey R. Grice;Alexander J. Cimaroli

  • Correlation of real time spectroellipsometry and atomic force microscopy measurements of surface roughness on amorphous semiconductor thin films

    Joohyun Koh;Yiwei Lu;C. R. Wronski;Yalei Kuang

  • Oxygenated CdS Buffer Layers Enabling High Open-Circuit Voltages in Earth-Abundant Cu2BaSnS4 Thin-Film Solar Cells

    Jie Ge;Prakash Koirala;Corey R. Grice;Paul J. Roland

  • Evolution of the optical functions of thin-film aluminum: A real-time spectroscopic ellipsometry study

    Hien V. Nguyen;Ilsin An;R. W. Collins

  • Optical Properties of Solids

    Robert W. Collins;K. Vedam

  • Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films.

    D. Abou-Ras;R. Caballero;C.-H. Fischer;C.A. Kaufmann

  • In situ ellipsometry of thin‐film deposition: Implications for amorphous and microcrystalline Si growth

    Unknown

  • Advances in multichannel spectroscopic ellipsometry

    R.W Collins;Ilsin An;H Fujiwara;Joungchel Lee

  • Advances in plasma-enhanced chemical vapor deposition of silicon films at low temperatures

    R.W. Collins;A.S. Ferlauto

  • Spectroscopic Ellipsometry for Photovoltaics

    Hiroyuki Fujiwara;Robert W. Collins

Frequent Co-Authors

Joshua M. Pearce
Joshua M. Pearce University of Western Ontario
Russell Messier
Russell Messier Pennsylvania State University
Angus Rockett
Angus Rockett Colorado School of Mines
Juan Antonio Zapien
Juan Antonio Zapien City University of Hong Kong
Michael J. Heben
Michael J. Heben University of Toledo
Yanfa Yan
Yanfa Yan University of Toledo
Randy J. Ellingson
Randy J. Ellingson University of Toledo
Mowafak Al-Jassim
Mowafak Al-Jassim National Renewable Energy Laboratory
Kim M. Jones
Kim M. Jones National Renewable Energy Laboratory
Elizabeth C. Dickey
Elizabeth C. Dickey Carnegie Mellon University

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