Optoelectronics, Transistor, Electrical engineering, MOSFET and Electronic engineering are his primary areas of study. His research integrates issues of Nanotechnology, Resistive random-access memory and Coulomb blockade in his study of Optoelectronics. His studies in Transistor integrate themes in fields like Dram, Quantum tunnelling, Dynamic random-access memory and Logic gate.
He has researched Electrical engineering in several fields, including Impact ionization and Semiconductor device. His MOSFET study incorporates themes from CMOS, Transconductance, Miniaturization and Amplifier. His Electronic engineering research includes elements of Radio frequency, Dielectric layer, Flash memory and Nanowire.
The scientist’s investigation covers issues in Optoelectronics, Transistor, Electrical engineering, Electronic engineering and MOSFET. The various areas that Byung-Gook Park examines in his Optoelectronics study include Nanotechnology and Voltage. Byung-Gook Park has included themes like Capacitance, Silicon on insulator and Nanowire in his Transistor study.
His Electrical engineering study often links to related topics such as Communication channel. The concepts of his Electronic engineering study are interwoven with issues in Flash memory and Charge trap flash. His study in MOSFET is interdisciplinary in nature, drawing from both Threshold voltage and Transconductance.
His scientific interests lie mostly in Optoelectronics, Transistor, Neuromorphic engineering, Artificial neural network and Logic gate. Byung-Gook Park is studying Quantum tunnelling, which is a component of Optoelectronics. His Transistor research includes themes of Dram, Node and Inverter.
His Neuromorphic engineering research integrates issues from Non-volatile memory, Memristor, Resistive switching and Topology. His Artificial neural network research includes elements of Electronic engineering and Inference. In Resistive random-access memory, Byung-Gook Park works on issues like Silicon, which are connected to Doping.
His primary scientific interests are in Optoelectronics, Neuromorphic engineering, Transistor, Logic gate and Memristor. Byung-Gook Park studies Quantum tunnelling which is a part of Optoelectronics. His Neuromorphic engineering research is multidisciplinary, incorporating perspectives in Computer hardware, Flash memory, Charge trap flash, MNIST database and Reliability.
His work on Tunnel field-effect transistor as part of general Transistor study is frequently linked to Fin, bridging the gap between disciplines. His Logic gate study integrates concerns from other disciplines, such as D channel, Gate dielectric, Long term plasticity and Plasticity. His Memristor study incorporates themes from Non-volatile memory, Substrate, Nitride and Boron nitride.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Tunneling Field-Effect Transistors (TFETs) With Subthreshold Swing (SS) Less Than 60 mV/dec
Woo Young Choi;Byung-Gook Park;Jong Duk Lee;Tsu-Jae King Liu.
IEEE Electron Device Letters (2007)
Tunneling Field-Effect Transistors (TFETs) With Subthreshold Swing (SS) Less Than 60 mV/dec
Woo Young Choi;Byung-Gook Park;Jong Duk Lee;Tsu-Jae King Liu.
IEEE Electron Device Letters (2007)
Three-Dimensional nand Flash Architecture Design Based on Single-Crystalline STacked ARray
Yoon Kim;Jang-Gn Yun;Se Hwan Park;Wandong Kim.
IEEE Transactions on Electron Devices (2012)
Three-Dimensional nand Flash Architecture Design Based on Single-Crystalline STacked ARray
Yoon Kim;Jang-Gn Yun;Se Hwan Park;Wandong Kim.
IEEE Transactions on Electron Devices (2012)
Demonstration of L-Shaped Tunnel Field-Effect Transistors
Sang Wan Kim;Jang Hyun Kim;Tsu-Jae King Liu;Woo Young Choi.
IEEE Transactions on Electron Devices (2016)
Demonstration of L-Shaped Tunnel Field-Effect Transistors
Sang Wan Kim;Jang Hyun Kim;Tsu-Jae King Liu;Woo Young Choi.
IEEE Transactions on Electron Devices (2016)
Single-Crystalline Si STacked ARray (STAR) NAND Flash Memory
Jang-Gn Yun;Garam Kim;Joung-Eob Lee;Yoon Kim.
IEEE Transactions on Electron Devices (2011)
Single-Crystalline Si STacked ARray (STAR) NAND Flash Memory
Jang-Gn Yun;Garam Kim;Joung-Eob Lee;Yoon Kim.
IEEE Transactions on Electron Devices (2011)
RF Performance and Small-Signal Parameter Extraction of Junctionless Silicon Nanowire MOSFETs
Seongjae Cho;Kyung Rok Kim;Byung-Gook Park;In Man Kang.
IEEE Transactions on Electron Devices (2011)
RF Performance and Small-Signal Parameter Extraction of Junctionless Silicon Nanowire MOSFETs
Seongjae Cho;Kyung Rok Kim;Byung-Gook Park;In Man Kang.
IEEE Transactions on Electron Devices (2011)
If you think any of the details on this page are incorrect, let us know.
We appreciate your kind effort to assist us to improve this page, it would be helpful providing us with as much detail as possible in the text box below:
Electronics and Telecommunications Research Institute
Seoul National University
Stanford University
Seoul National University
Samsung (South Korea)
Colorado State University
Stanford University
Kookmin University
Seoul National University
National Institute of Advanced Industrial Science and Technology
Pennsylvania State University
University of North Carolina at Chapel Hill
Czech Academy of Sciences
Karlsruhe Institute of Technology
Universidade Federal de Minas Gerais
University of North Carolina at Chapel Hill
National Institute for Basic Biology
Stockholm University
University of Bologna
University of Wisconsin–Madison
University of Pennsylvania
University of Waterloo
Swedish University of Agricultural Sciences
University of Konstanz
Rosalind Franklin University of Medicine and Science
University of Oxford