2026 Bruno K. Meyer: Materials Science Researcher – H-Index, Publications & Awards

Discipline name	D-Index	World Ranking	Current World Ranking	National Ranking	Current National Ranking	Publications	Citations
Materials Science	72	3973	3846	220	212	507	22675

Bruno K. Meyer publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Bruno K. Meyer sits on this spectrum.

50 publications 1,163+

This scientist: 507 publications — 87th percentile

87% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Bruno K. Meyer D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Bruno K. Meyer sits on this spectrum.

40 D-Index 165+

This scientist: 72 D-Index — 69th percentile

69% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Overview

Bruno K. Meyer is affiliated with the University of Giessen in Germany and has a research focus primarily in computer science, with a total of 52 publications within this field. Their work spans multiple subfields including software (15 publications), information systems (13 publications), artificial intelligence (11 publications), computer networks and communications (4 publications), and computational theory and mathematics (3 publications). The breadth of their research interests highlights a multidisciplinary approach to computer science.

Their scholarly contributions emphasize topics such as software engineering research and software testing and debugging techniques, each represented by 18 publications. Additional research topics include logic, programming, and type systems (10 publications), advanced software engineering methodologies (8 publications), software reliability and analysis research (8 publications), formal methods in verification (6 publications), and service-oriented architecture and web services (4 publications).

Bruno K. Meyer's recent publications cover a range of formal and practical software engineering themes. Notable papers include "The Role of Formalism in System Requirements" (2021) published in ACM Computing Surveys, "A failed proof can yield a useful test" (2023) featured in Software Testing Verification and Reliability, and "The Concept of Class Invariant in Object-oriented Programming" (2024) in Formal Aspects of Computing. Other recent works include "Seeding Contradiction: a Fast Method for Generating Full-Coverage Test Suites" (2024) and "Special Issue on New Paradigms of Software Production and Deployment" (2022), both published in SN Computer Science.

Bruno K. Meyer frequently collaborates with various researchers. The most regular co-authors are:

Jean-Michel Bruel
Sophie Ebersold
Manuel Oriol
Li Huang
Alexandr Naumchev

Their publications appear in several venues, with the majority being on arXiv (Cornell University) with 13 publications. Additional venues include Formal Aspects of Computing and SN Computer Science with 2 publications each, as well as ACM Computing Surveys and Software Testing Verification and Reliability with one publication each.

Regarding book publications, Bruno K. Meyer has contributed two titles published by Springer Science+Business Media: "Software Engineering Aspects of Continuous Development and New Paradigms of Software Production and Deployment" (2020) and "Frontiers in Software Engineering Education" (2023).

Best Publications

Bound exciton and donor–acceptor pair recombinations in ZnO

B. K. Meyer;H. Alves;D. M. Hofmann;W. Kriegseis

2002
Citations
Binary copper oxide semiconductors: From materials towards devices

B. K. Meyer;A. Polity;D. Reppin;M. Becker

816
Citations
Zinc oxide : from fundamental properties towards novel applications

C. F. Klingshirn;B. K. Meyer;Andreas Waag;Axel Hoffmann

637
Citations
Rapid‐thermal‐oxidized porous Si−The superior photoluminescent Si

V. Petrova‐Koch;T. Muschik;A. Kux;B. K. Meyer

608
Citations
Nitrogen-related local vibrational modes in ZnO:N

A. Kaschner;U. Haboeck;Martin Strassburg;Matthias Strassburg

568
Citations
Optical investigations of defects in Cd1-xZnxTe.

W. Stadler;D. M. Hofmann;H. C. Alt;T. Muschik

532
Citations
Behind the weak excitonic emission of ZnO quantum dots: ZnO/Zn(OH)2 core-shell structure

H. Zhou;H. Alves;D. M. Hofmann;W. Kriegseis

395
Citations
The Oxygen Vacancy as the Origin of a Green Emission in Undoped ZnO

F.H. Leiter;H.R. Alves;A. Hofstaetter;D.M. Hofmann

381
Citations
On p-type doping in GaN—acceptor binding energies

S. Fischer;C. Wetzel;E. E. Haller;B. K. Meyer

374
Citations
Tungsten and fluorine co-doping of VO2 films

W Burkhardt;T Christmann;S Franke;W Kriegseis

365
Citations
Structural properties and bandgap bowing of ZnO1−xSx thin films deposited by reactive sputtering

B. K. Meyer;A. Polity;B. Farangis;Y. He

345
Citations
Valence-band ordering and magneto-optic exciton fine structure in ZnO

Walter R. L. Lambrecht;Anna V. Rodina;Sukit Limpijumnong;Sukit Limpijumnong;B. Segall

337
Citations
PRESSURE INDUCED DEEP GAP STATE OF OXYGEN IN GAN

C. Wetzel;T. Suski;J.W. Ager Iii;E.R. Weber

317
Citations
Properties of the yellow luminescence in undoped GaN epitaxial layers

DM Hofmann;D Kovalev;G Steude;BK Meyer

314
Citations
W- and F-doped VO2 films studied by photoelectron spectrometry

W Burkhardt;T Christmann;B.K Meyer;W Niessner

301
Citations
Oxygen vacancies in ZnO

F. Leiter;H. Alves;D. Pfisterer;N.G. Romanov

289
Citations
Identification of the chlorine A center in CdTe.

D. M. Hofmann;P. Omling;H. G. Grimmeiss;B. K. Meyer

253
Citations
Dependence of the electrical and optical behaviour of ITO–silver–ITO multilayers on the silver properties

A. Klöppel;W. Kriegseis;B.K. Meyer;A. Scharmann

249
Citations
Exciton fine structure in undoped GaN epitaxial films.

D Volm;K Oettinger;T Streibl;D Kovalev

245
Citations
Modified compensation model of CdTe

M. Fiederle;C. Eiche;M. Salk;R. Schwarz

240
Citations
Negatively charged Si vacancy in 4H SiC: A comparison between theory and experiment

T. Wimbauer;B. K. Meyer;A. Hofstaetter;A. Scharmann

235
Citations
Bound excitons in ZnO: Structural defect complexes versus shallow impurity centers

M. R. Wagner;G. Callsen;J. S. Reparaz;J.-H. Schulze

220
Citations
Quantitative determination of hexagonal minority phase in cubic GaN using Raman spectroscopy

H. Siegle;L. Eckey;A. Hoffmann;C. Thomsen

212
Citations