World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
52
Citations
9873
World Ranking
2535
National Ranking
5

Materials Science

D-Index
54
Citations
10804
World Ranking
8885
National Ranking
24

A. Y. Polyakov publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where A. Y. Polyakov sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 357 publications — 68th percentile

68% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

A. Y. Polyakov D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where A. Y. Polyakov sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 52 D-Index — 64th percentile

64% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

A. Y. Polyakov is affiliated with the National University of Science and Technology in the Russian Federation. Their research primarily focuses on materials science, with particular attention to energy applications. The scientist has contributed to various subfields including materials chemistry, electronic, optical and magnetic materials, renewable energy and sustainability, electrical and electronic engineering, and condensed matter physics.

The major research topics addressed by A. Y. Polyakov cover a range of semiconductor and oxide materials. These topics include Ga2O3 and related materials, ZnO doping and properties, advanced photocatalysis techniques, semiconductor materials and devices, GaN-based semiconductor devices and materials, electronic and structural properties of oxides, and perovskite materials and applications.

Among the recent papers authored or coauthored by A. Y. Polyakov are:

  • "Review-Radiation Damage in Wide and Ultra-Wide Bandgap Semiconductors," 2021, ECS Journal of Solid State Science and Technology
  • "Deep level defect states in β-, α-, and ɛ-Ga2O3 crystals and films: Impact on device performance," 2022, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
  • "Editors' Choice-Electrical Properties and Deep Traps in α-Ga2O3:Sn Films Grown on Sapphire by Halide Vapor Phase Epitaxy," 2020, ECS Journal of Solid State Science and Technology

A. Y. Polyakov has worked frequently with coauthors including S. J. Pearton, A.A. Vasil'ev, Ivan Shchemerov, E. B. Yakimov, and А. I. Kochkova. These collaborations reflect close ties with researchers engaged in similar topics within semiconductor materials and device physics.

The scientist's research outputs have been published extensively in several journals, with notable numbers of publications in:

  • ECS Journal of Solid State Science and Technology
  • Journal of Applied Physics
  • Journal of Alloys and Compounds
  • Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
  • Journal of Physics D Applied Physics

Best Publications

  • Review—Ionizing Radiation Damage Effects on GaN Devices

    S. J. Pearton;F. Ren;Erin Patrick;M. E. Law

  • Gallium antimonide device related properties

    A.G. Milnes;A.Y. Polyakov

  • Electrical characteristics of Au and Ag Schottky contacts on n-ZnO

    A. Y. Polyakov;N. B. Smirnov;E. A. Kozhukhova;V. I. Vdovin

  • Radiation damage effects in Ga2O3 materials and devices

    Jihyun Kim;Stephen J. Pearton;Chaker Fares;Jiancheng Yang

  • Review of radiation damage in GaN-based materials and devices

    Stephen J. Pearton;Richard Deist;Fan Ren;Lu Liu

  • Deep traps in GaN-based structures as affecting the performance of GaN devices

    Alexander Y. Polyakov;In-Hwan Lee

  • Radiation effects in GaN materials and devices

    Alexander Y. Polyakov;S. J. Pearton;Patrick Frenzer;Fan Ren

  • Lifetime-limiting defects in n− 4H-SiC epilayers

    P. B. Klein;B. V. Shanabrook;S. W. Huh;A. Y. Polyakov

  • Microstructure and optical properties of epitaxial GaN on ZnO (0001) grown by reactive molecular beam epitaxy

    F. Hamdani;M. Yeadon;David J. Smith;H. Tang

  • Point defect induced degradation of electrical properties of Ga2O3 by 10 MeV proton damage

    A. Y. Polyakov;N. B. Smirnov;I. V. Shchemerov;E. B. Yakimov;E. B. Yakimov

  • Indium arsenide: a semiconductor for high speed and electro-optical devices

    A.G Milnes;A.Y Polyakov

  • Hole traps and persistent photocapacitance in proton irradiated β-Ga2O3 films doped with Si

    A. Y. Polyakov;N. B. Smirnov;I. V. Shchemerov;S. J. Pearton

  • Properties of Si donors and persistent photoconductivity in AlGaN

    A.Y. Polyakov;N.B. Smirnov;A.V. Govorkov;M.G. Mil'vidskii

  • Lateral AlxGa1-xN power rectifiers with 9.7 kV reverse breakdown voltage

    A. P. Zhang;J. W. Johnson;F. Ren;J. Han

  • Studies of the origin of the yellow luminescence band, the nature of nonradiative recombination and the origin of persistent photoconductivity in n-GaN films

    A.Y Polyakov;N.B Smirnov;A.S Usikov;A.V Govorkov

  • Electrical properties of bulk semi-insulating β-Ga2O3 (Fe)

    A. Y. Polyakov;N. B. Smirnov;I. V. Shchemerov;S. J. Pearton

  • On the origin of electrically active defects in AlGaN alloys grown by organometallic vapor phase epitaxy

    A. Y. Polyakov;M. Shin;J. A. Freitas;M. Skowronski

  • Deep centers and their spatial distribution in undoped GaN films grown by organometallic vapor phase epitaxy

    A. Y. Polyakov;N. B. Smirnov;A. V. Govorkov;M. Shin

  • Review—Radiation Damage in Wide and Ultra-Wide Bandgap Semiconductors

    S. J. Pearton;Assel Aitkaliyeva;Minghan Xian;Fan Ren

  • Proton implantation effects on electrical and recombination properties of undoped ZnO

    A. Y. Polyakov;N. B. Smirnov;A. V. Govorkov;E. A. Kozhukhova

  • Compensation and persistent photocapacitance in homoepitaxial Sn-doped β-Ga2O3

    A. Y. Polyakov;N. B. Smirnov;I. V. Shchemerov;D. Gogova

Frequent Co-Authors

Stephen J. Pearton
Stephen J. Pearton University of Florida
In-Hwan Lee
In-Hwan Lee Korea University
Fan Ren
Fan Ren University of Florida
Marek Skowronski
Marek Skowronski Carnegie Mellon University
Andrei Osinsky
Andrei Osinsky Corning (United States)
Ji Hyun Kim
Ji Hyun Kim Seoul National University
J. M. Zavada
J. M. Zavada New York University
R. G. Wilson
R. G. Wilson General Motors (United States)
C. R. Abernathy
C. R. Abernathy University of Florida
David P. Norton
David P. Norton University of Florida

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