World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
50
Citations
8028
World Ranking
2855
National Ranking
1075

John S. Suehle publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where John S. Suehle sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 250 publications — 45th percentile

45% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

John S. Suehle D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where John S. Suehle sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 50 D-Index — 60th percentile

60% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

John S. Suehle is affiliated with the National Institute of Standards and Technology in the United States. Their research contributions span multiple areas within engineering and physics, with a focus on topics related to nanostructures and electronic transport phenomena.

Their main fields of study include:

  • Engineering
  • Physics and Astronomy

Within these fields, Suehle has specialized in subfields such as:

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

The key topics they have worked on cover:

  • Molecular Junctions and Nanostructures
  • Quantum and Electron Transport Phenomena
  • Organic Electronics and Photovoltaics

John S. Suehle has coauthored publications with several researchers including:

  • Hyuk-Jae Jang
  • Oleg A. Kirillov
  • Curt A. Richter

Their research has been published in scientific venues such as:

  • The Journal of Physical Chemistry C

A recent paper authored by Suehle is titled Direct Electrical Measurements of Energy Bands in Organic Semiconductors by Device-Based Ballistic Carrier Emission Spectroscopy, published in 2020 in The Journal of Physical Chemistry C.

This publication addresses measurements in organic semiconductors, aligning with the scientist's focus on organic electronics and electron transport.

Best Publications

  • Tin oxide gas sensor fabricated using CMOS micro-hotplates and in-situ processing

    J.S. Suehle;R.E. Cavicchi;M. Gaitan;S. Semancik

  • Microhotplate Platforms for Chemical Sensor Research

    Stephen Semancik;Richard E. Cavicchi;M C. Wheeler;J E. Tiffany

  • A Flexible Solution-Processed Memristor

    N. Gergel-Hackett;B. Hamadani;B. Dunlap;J. Suehle

  • Electrical conduction and dielectric breakdown in aluminum oxide insulators on silicon

    J. Kolodzey;E.A. Chowdhury;T.N. Adam;Guohua Qui

  • Reliability Issues of SiC MOSFETs: A Technology for High-Temperature Environments

    Liangchun C Yu;G T Dunne;K S Matocha;Kin P Cheung

  • Disease detection and management via single nanopore-based sensors.

    Joseph E. Reiner;Arvind K. Balijepalli;Joseph W. Robertson;Jason P. Campbell

  • A monolithic CMOS microhotplate-based gas sensor system

    M.Y. Afridi;J.S. Suehle;M.E. Zaghloul;D.W. Berning

  • Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures

    S.C. Witczak;R.D. Schrimpf;D.M. Fleetwood;K.F. Galloway

  • Optimized temperature-pulse sequences for the enhancement of chemically specific response patterns from micro-hotplate gas sensors

    Richard E. Cavicchi;John S. Suehle;Kenneth G. Kreider;Michael Gaitan

  • Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast $I$ – $V$ Techniques

    M. Gurfinkel;H.D. Xiong;K.P. Cheung;J.S. Suehle

  • Ultrathin gate oxide reliability: physical models, statistics, and characterization

    Unknown

  • Fast temperature programmed sensing for micro-hotplate gas sensors

    R.E. Cavicchi;J.S. Suehle;K.G. Kreider;M. Gaitan

  • Application of microsubstrates for materials processing

    Richard Cavicchi;Stephen Semancik;John S. Suehle;Michael Gaitan

  • An Experimental Comparison of Measurement Techniques to Extract Si-SiO2 Interface Trap Density

    Steven C. Witczak;John S. Suehle;Michael Gaitan

  • Band alignment issues related to HfO2∕SiO2∕p-Si gate stacks

    S. Sayan;T. Emge;E. Garfunkel;Xinyuan Zhao

  • Gain degradation of lateral and substrate pnp bipolar junction transistors

    S.C. Witczak;R.D. Schrimpf;K.F. Galloway;D.M. Fleetwood

  • Limitations of conductance to the measurement of the interface state density of MOS capacitors with tunneling gate dielectrics

    E.M. Vogel;W.K. Henson;C.A. Richter;J.S. Suehle

  • Temperature-controlled, micromachined arrays for chemical sensor fabrication and operation

    Stephen Semancik;Richard E. Cavicchi;Michael Gaitan;John S. Suehle

  • Field and temperature acceleration of time-dependent dielectric breakdown in intrinsic thin SiO/sub 2/

    J.S. Suehle;P. Chaparala;C. Messick;W.M. Miller

  • Hybrid postprocessing etching for CMOS-compatible MEMS

    N.H. Tea;V. Milanovic;C.A. Zincke;J.S. Suehle

  • Random telegraph noise in highly scaled nMOSFETs

    J.P. Campbell;J. Qin;K.P. Cheung;L.C. Yu

Frequent Co-Authors

Curt A. Richter
Curt A. Richter National Institute of Standards and Technology
Eric M. Vogel
Eric M. Vogel Georgia Institute of Technology
Michael Gaitan
Michael Gaitan National Institute of Standards and Technology
David J. Gundlach
David J. Gundlach National Institute of Standards and Technology
Neil Goldsman
Neil Goldsman University of Maryland, College Park
Mona E. Zaghloul
Mona E. Zaghloul George Washington University
Gennadi Bersuker
Gennadi Bersuker The Aerospace Corporation
Ichiro Takeuchi
Ichiro Takeuchi University of Maryland, College Park
Peide D. Ye
Peide D. Ye Purdue University West Lafayette
John F. Conley
John F. Conley Oregon State University

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