World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
58
Citations
13782
World Ranking
2463
National Ranking
756

Research.com Recognitions

  • 2011 - IEEE Founders Medal For leadership in engineering research
  • 1996 - Semiconductor Industry Association University Researcher Award
  • 1989 - Fellow of the American Academy of Arts and Sciences
  • 1985 - Member of the National Academy of Sciences
  • 1974 - Member of the National Academy of Engineering Leadership as a teacher, author, and researcher in semiconductor electronics.

Overview

J. F. Gibbons is affiliated with Stanford University in the United States and has a research focus primarily within the field of Medicine. Their work spans multiple subfields including Infectious Diseases, Pollution, Small Animals, Pathology and Forensic Medicine, and Pediatrics, Perinatology and Child Health.

The scientist's research covers a range of topics, such as Infectious Disease Case Reports and Treatments, Pharmaceutical and Antibiotic Environmental Impacts, Animal Behavior and Welfare Studies, Biomedical Research and Pathophysiology, Pediatric Urology and Nephrology Studies, Insect and Pesticide Research, and Microbial infections and disease research.

J. F. Gibbons has contributed to several papers in recent years, including:

  • Quantification, description and international comparison of antimicrobial use on Irish pig farms, 2020, Porcine Health Management
  • Does the Use of Different Indicators to Benchmark Antimicrobial Use Affect Farm Ranking?, 2020, Frontiers in Veterinary Science
  • International Spread of Multidrug-Resistant Rhodococcus equi, 2022, Emerging infectious diseases
  • A Scoping Review of Non-Structural Airway Disease as a Cause of Poor Performance in Racehorses, 2023, Animals
  • International spread of emerging multidrug-resistant Rhodococcus equi, 2022, bioRxiv (Cold Spring Harbor Laboratory)

Frequent co-authors who have collaborated with J. F. Gibbons include:

  • Jorge Val-Calvo
  • Alan Creighton
  • Ursula Fogarty
  • Mariela Scortti
  • José A. Vázquez-Boland

Their published work has appeared in venues such as bioRxiv (Cold Spring Harbor Laboratory), Porcine Health Management, Emerging infectious diseases, Frontiers in Veterinary Science, and Animals.

J. F. Gibbons's career includes recognition through several awards:

  • IEEE Founders Medal (2011) for leadership in engineering research
  • Semiconductor Industry Association University Researcher Award (1996)
  • Fellow of the American Academy of Arts and Sciences (1989)
  • Member of the National Academy of Sciences (1985)
  • Member of the National Academy of Engineering (1974) for leadership as a teacher, author, and researcher in semiconductor electronics

Best Publications

  • Ion implantation in semiconductors—Part II: Damage production and annealing

    J.F. Gibbons

  • Preferential Growth of Semiconducting Single-Walled Carbon Nanotubes by a Plasma Enhanced CVD Method

    Yiming Li;David Mann;Marco Rolandi;Woong Kim

  • Comparative study of phonon‐limited mobility of two‐dimensional electrons in strained and unstrained Si metal–oxide–semiconductor field‐effect transistors

    Shin‐ichi Takagi;Judy L. Hoyt;Jeffrey J. Welser;James F. Gibbons

  • Electron mobility enhancement in strained-Si n-type metal-oxide-semiconductor field-effect transistors

    J. Welser;J.L. Hoyt;J.F. Gibbons

  • Switching properties of thin Nio films

    Unknown

  • Strain dependence of the performance enhancement in strained-Si n-MOSFETs

    J. Welser;J.L. Hoyt;S. Takagi;J.F. Gibbons

  • Temperature distributions produced in semiconductors by a scanning elliptical or circular cw laser beam

    Y. I. Nissim;A. Lietoila;R. B. Gold;J. F. Gibbons

  • Limited reaction processing: Silicon epitaxy

    J. F. Gibbons;C. M. Gronet;K. E. Williams

  • Ion implantation in semiconductors—Part I: Range distribution theory and experiments

    J.F. Gibbons

  • cw laser anneal of polycrystalline silicon: Crystalline structure, electrical properties

    A. Gat;L. Gerzberg;J. F. Gibbons;T. J. Magee

  • Si/Si/sub 1-x/Ge/sub x/ heterojunction bipolar transistors produced by limited reaction processing

    C.A. King;J.L. Hoyt;C.M. Gronet;J.F. Gibbons

  • Stoichiometric disturbances in ion implanted compound semiconductors

    Unknown

  • Physical and electrical properties of laser‐annealed ion‐implanted silicon

    A. Gat;J. F. Gibbons;T. J. Magee;J. Peng

  • Bandgap and transport properties of Si/sub 1-x/Ge/sub x/ by analysis of nearly ideal Si/Si/sub 1-x/Ge/sub x//Si heterojunction bipolar transistors

    C.A. King;J.L. Hoyt;J.F. Gibbons

  • The solid solubility and thermal behavior of metastable concentrations of As in Si

    A. Lietoila;J. F. Gibbons;T. W. Sigmon

  • Diffusion of silicon in gallium arsenide using rapid thermal processing: Experiment and model

    Unknown

  • One-gate-wide CMOS Inverter on laser-recrystallized polysilicon

    J.F. Gibbons;K.F. Lee

  • Thin film MOSFET's fabricated in laser-annealed polycrystalline silicon

    K. F. Lee;J. F. Gibbons;K. C. Saraswat;T. I. Kamins

  • A laser‐scanning apparatus for annealing of ion‐implantation damage in semiconductors

    A. Gat;J. F. Gibbons

  • Reduction in misfit dislocation density by the selective growth of Si1−xGex/Si in small areas

    D. B. Noble;J. L. Hoyt;C. A. King;J. F. Gibbons

  • Comparison of boron diffusion in Si and strained Si1-xGex epitaxial layers

    P. Kuo;J. L. Hoyt;J. F. Gibbons;J. E. Turner

  • Constant-capacitance DLTS measurement of defect-density profiles in semiconductors

    N. M. Johnson;D. J. Bartelink;R. B. Gold;J. F. Gibbons

  • Solid solubility of As in Si as determined by ion implantation and cw laser annealing

    A. Lietoila;J. F. Gibbons;T. J. Magee;J. Peng

  • Small-geometry, high-performance, Si-Si/sub 1-x/Ge/sub x/ heterojunction bipolar transistors

    T.I. Kamins;K. Nauka;J.B. Kruger;J.L. Hoyt

  • Substitutional carbon incorporation in epitaxial Si1−yCy layers grown by chemical vapor deposition

    T. O. Mitchell;J. L. Hoyt;J. F. Gibbons

  • Scanning‐electron‐beam annealing of arsenic‐implanted silicon

    J. L. Regolini;J. F. Gibbons;T. W. Sigmon;R. F. W. Pease

  • A monolithic integrated circuit fabricated in laser-annealed polysilicon

    T.I. Kamins;K.F. Lee;J.F. Gibbons;K.C. Saraswat

Frequent Co-Authors

Theodore I. Kamins
Theodore I. Kamins Stanford University
James C. Sturm
James C. Sturm Princeton University
Roger Fabian W. Pease
Roger Fabian W. Pease Stanford University
Krishna C. Saraswat
Krishna C. Saraswat Stanford University
Shinichi Takagi
Shinichi Takagi University of Tokyo
Martin M. Fejer
Martin M. Fejer Stanford University
Robert Hull
Robert Hull Rensselaer Polytechnic Institute
William D. Nix
William D. Nix Stanford University
James D. Plummer
James D. Plummer Stanford University

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