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Materials Science

D-Index
114
Citations
72457
World Ranking
591
National Ranking
210

Research.com Recognitions

  • 2017 - Monie A. Ferst Award, Sigma Xi
  • 2011 - Heyn Commemorative Medal
  • 2011 - Fellow of the Materials Research Society
  • 2007 - Von Hippel Award, Materials Research Society
  • 2003 - Member of the National Academy of Sciences
  • 2002 - Fellow of the American Academy of Arts and Sciences
  • 2001 - Nadai Medal, The American Society of Mechanical Engineers (ASME)
  • 1993 - Acta Materialia Gold Medal
  • 1987 - Member of the National Academy of Engineering For outstanding research on experimental and theoretical aspects of high temperature creep and creep-rupture behavior of solids.

Overview

William D. Nix is affiliated with Stanford University in the United States and conducts research primarily in the fields of Materials Science and Engineering. Their work spans several subfields, including Materials Chemistry, Mechanics of Materials, Atomic and Molecular Physics and Optics, as well as Biomedical Engineering.

The main topics of Nix's research cover microstructure and mechanical properties, nonlocal and gradient elasticity in micro/nano structures, metal and thin film mechanics, surface and thin film phenomena, and advanced materials characterization techniques.

Among their recent publications are:

  • Intrinsic size dependent plasticity in BCC micro-pillars under uniaxial tension and pure torsion, 2020, Extreme Mechanics Letters
  • Theory of Dislocations, Third Edition, 2021, Journal of Applied Mechanics

Frequent collaborators in their research include Ill Ryu, Jamie D. Gravell, Wei Cai, and Huajian Gao.

Their papers have been published in venues such as Extreme Mechanics Letters and the Journal of Applied Mechanics.

Throughout their career, William D. Nix has received multiple awards, including:

  • Monie A. Ferst Award, Sigma Xi (2017)
  • Heyn Commemorative Medal (2011)
  • Fellow of the Materials Research Society (2011)
  • Von Hippel Award, Materials Research Society (2007)
  • Member of the National Academy of Sciences (2003)
  • Fellow of the American Academy of Arts and Sciences (2002)
  • Nadai Medal, The American Society of Mechanical Engineers (2001)
  • Acta Materialia Gold Medal (1993)
  • Member of the National Academy of Engineering (1987) for outstanding research on experimental and theoretical aspects of high temperature creep and creep-rupture behavior of solids

Best Publications

  • Indentation size effects in crystalline materials: A law for strain gradient plasticity

    William D. Nix;Huajian Gao

  • A method for interpreting the data from depth-sensing indentation instruments

    M. F. Doerner;W. D. Nix

  • Mechanical properties of thin films

    William D. Nix

  • Sample dimensions influence strength and crystal plasticity.

    Michael D. Uchic;Dennis M. Dimiduk;Jeffrey N. Florando;William D. Nix

  • Mechanism-based strain gradient plasticity— I. Theory

    H. Gao;Y. Huang;W. D. Nix;J. W. Hutchinson

  • What is the Young's Modulus of Silicon?

    M.A. Hopcroft;W.D. Nix;T.W. Kenny

  • Effects of the substrate on the determination of thin film mechanical properties by nanoindentation

    Ranjana Saha;William D. Nix

  • Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients

    Julia R. Greer;Warren C. Oliver;William D. Nix

  • 25th anniversary article: Understanding the lithiation of silicon and other alloying anodes for lithium-ion batteries

    Matthew T. McDowell;Seok Woo Lee;William D. Nix;Yi Cui;Yi Cui

  • Interconnected Silicon Hollow Nanospheres for Lithium-Ion Battery Anodes with Long Cycle Life

    Yan Yao;Matthew T. McDowell;Ill Ryu;Hui Wu

  • Nanoscale gold pillars strengthened through dislocation starvation

    Julia R. Greer;William D. Nix

  • Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments

    K. W. McElhaney;J. J. Vlassak;W. D. Nix

  • In Situ TEM of Two-Phase Lithiation of Amorphous Silicon Nanospheres

    Matthew T. McDowell;Seok Woo Lee;Justin T. Harris;Brian A. Korgel

  • A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films

    J.J. Vlassak;W.D. Nix

  • Crystallite coalescence: A mechanism for intrinsic tensile stresses in thin films

    W. D. Nix;B. M. Clemens

  • Stresses and deformation processes in thin films on substrates

    Mary F. Doerner;William D. Nix

  • Mechanism-based strain gradient plasticity—II. Analysis

    Y. Huang;H. Gao;W.D. Nix;J.W. Hutchinson

  • Measurement and Interpretation of stress in aluminum-based metallization as a function of thermal history

    P.A. Flinn;D.S. Gardner;W.D. Nix

  • Elastic and plastic properties of thin films on substrates : nanoindentation techniques

    William D. Nix

  • Studying the kinetics of crystalline silicon nanoparticle lithiation with in situ transmission electron microscopy.

    Matthew T. McDowell;Ill Ryu;Seok Woo Lee;Chongmin Wang

  • Analysis of elastic and plastic deformation associated with indentation testing of thin films on substrates

    A.K. Bhattacharya;W.D. Nix

Frequent Co-Authors

Bruce M. Clemens
Bruce M. Clemens Stanford University
Huajian Gao
Huajian Gao Tsinghua University
Yi Cui
Yi Cui Stanford University
Seok Woo Lee
Seok Woo Lee University of Connecticut
Joost J. Vlassak
Joost J. Vlassak Harvard University
Yonggang Huang
Yonggang Huang Northwestern University
Eduard Arzt
Eduard Arzt University of California, San Diego
David M. Barnett
David M. Barnett Stanford University
Oliver Kraft
Oliver Kraft Karlsruhe Institute of Technology
Nobumichi Tamura
Nobumichi Tamura Lawrence Berkeley National Laboratory

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