D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Electronics and Electrical Engineering D-index 48 Citations 9,329 298 World Ranking 1903 National Ranking 110
Materials Science D-index 49 Citations 10,151 297 World Ranking 7263 National Ranking 310

Overview

What is he best known for?

The fields of study he is best known for:

  • Semiconductor
  • Transistor
  • Electrical engineering

Michael J. Uren mainly focuses on Optoelectronics, Transistor, Wide-bandgap semiconductor, Field-effect transistor and High-electron-mobility transistor. His research integrates issues of Thermal resistance, Gallium nitride, Raman spectroscopy and Leakage in his study of Optoelectronics. As a member of one scientific family, Michael J. Uren mostly works in the field of Transistor, focusing on Silicon and, on occasion, Electron temperature, Hall effect and Thermal Hall effect.

His Wide-bandgap semiconductor research is multidisciplinary, incorporating perspectives in Algan gan, Leakage test, Electronic engineering and Dispersion. His studies in Field-effect transistor integrate themes in fields like Electron mobility, Condensed matter physics, Semiconductor device, Noise and MOSFET. His High-electron-mobility transistor study incorporates themes from Substrate, Operating temperature, Acceptor and Analytical chemistry.

His most cited work include:

  • An experimental and theoretical study of the formation and microstructure of porous silicon (431 citations)
  • The 2018 GaN power electronics roadmap (355 citations)
  • Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy (286 citations)

What are the main themes of his work throughout his whole career to date?

His primary areas of investigation include Optoelectronics, Transistor, Wide-bandgap semiconductor, Gallium nitride and High-electron-mobility transistor. His Optoelectronics research integrates issues from Algan gan, Field-effect transistor and Voltage, Electrical engineering, Leakage. His research investigates the connection with Field-effect transistor and areas like Raman spectroscopy which intersect with concerns in Thermography.

Within one scientific family, Michael J. Uren focuses on topics pertaining to Silicon on insulator under Electrical engineering, and may sometimes address concerns connected to MOSFET. His work carried out in the field of Wide-bandgap semiconductor brings together such families of science as Passivation, Electroluminescence and Power semiconductor device. The concepts of his Gallium nitride study are interwoven with issues in Aluminium nitride, Radio frequency and Analytical chemistry.

He most often published in these fields:

  • Optoelectronics (66.56%)
  • Transistor (21.78%)
  • Wide-bandgap semiconductor (18.10%)

What were the highlights of his more recent work (between 2016-2021)?

  • Optoelectronics (66.56%)
  • Leakage (9.51%)
  • Transistor (21.78%)

In recent papers he was focusing on the following fields of study:

Michael J. Uren mostly deals with Optoelectronics, Leakage, Transistor, Gallium nitride and High-electron-mobility transistor. Michael J. Uren connects Optoelectronics with Temperature measurement in his research. His Leakage study also includes fields such as

  • Chemical vapor deposition together with Wide-bandgap semiconductor and Breakdown voltage,
  • Silicon nitride which is related to area like Electric potential,
  • Voltage that intertwine with fields like Nanotechnology.

Michael J. Uren focuses mostly in the field of Transistor, narrowing it down to topics relating to Nitride and, in certain cases, Biasing and High electron. His Gallium nitride study combines topics in areas such as Field-effect transistor, Capacitive sensing, Photonics and Heterojunction. His biological study spans a wide range of topics, including Capacitance, Buffer design and Current.

Between 2016 and 2021, his most popular works were:

  • The 2018 GaN power electronics roadmap (355 citations)
  • “Leaky Dielectric” Model for the Suppression of Dynamic $R_{\mathrm{ON}}$ in Carbon-Doped AlGaN/GaN HEMTs (75 citations)
  • Pulsed Large Signal RF Performance of Field-Plated Ga 2 O 3 MOSFETs (30 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Transistor
  • Electrical engineering

Michael J. Uren mainly investigates Optoelectronics, Leakage, Transistor, Gallium nitride and Temperature measurement. Michael J. Uren is studying Wide-bandgap semiconductor, which is a component of Optoelectronics. Michael J. Uren interconnects Acceptor and Breakdown voltage in the investigation of issues within Wide-bandgap semiconductor.

His work deals with themes such as Chemical vapor deposition, High-electron-mobility transistor, Field effect, Epitaxy and Reverse bias, which intersect with Leakage. The study incorporates disciplines such as Photonics and Power electronics in addition to Transistor. His Gallium nitride research includes themes of Electron mobility, Doping and Engineering physics.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

An experimental and theoretical study of the formation and microstructure of porous silicon

M.I.J. Beale;J.D. Benjamin;M.J. Uren;N.G. Chew.
Journal of Crystal Growth (1985)

768 Citations

The 2018 GaN power electronics roadmap

H Amano;Y Baines;Matteo Borga.
Journal of Physics D (2018)

710 Citations

Microstructure and formation mechanism of porous silicon

M. I. J. Beale;N. G. Chew;M. J. Uren;A. G. Cullis.
Applied Physics Letters (1985)

395 Citations

Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy

M. Kuball;J.M. Hayes;M.J. Uren;I. Martin.
IEEE Electron Device Letters (2002)

383 Citations

1/f and random telegraph noise in silicon metal‐oxide‐semiconductor field‐effect transistors

M. J. Uren;D. J. Day;M. J. Kirton.
Applied Physics Letters (1985)

381 Citations

Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices

A. Sarua;Hangfeng Ji;K.P. Hilton;D.J. Wallis.
IEEE Transactions on Electron Devices (2007)

303 Citations

Buffer Design to Minimize Current Collapse in GaN/AlGaN HFETs

M. J. Uren;J. Moreke;M. Kuball.
IEEE Transactions on Electron Devices (2012)

289 Citations

Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures

A. Sarua;Hangfeng Ji;M. Kuball;M.J. Uren.
IEEE Transactions on Electron Devices (2006)

289 Citations

Punch-through in short-channel AlGaN/GaN HFETs

M.J. Uren;K.J. Nash;R.S. Balmer;T. Martin.
IEEE Transactions on Electron Devices (2006)

262 Citations

Self-heating effects in SOI MOSFETs and their measurement by small signal conductance techniques

B.M. Tenbroek;M.S.L. Lee;W. Redman-White;J.T. Bunyan.
IEEE Transactions on Electron Devices (1996)

224 Citations

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