Michael J. Uren mainly focuses on Optoelectronics, Transistor, Wide-bandgap semiconductor, Field-effect transistor and High-electron-mobility transistor. His research integrates issues of Thermal resistance, Gallium nitride, Raman spectroscopy and Leakage in his study of Optoelectronics. As a member of one scientific family, Michael J. Uren mostly works in the field of Transistor, focusing on Silicon and, on occasion, Electron temperature, Hall effect and Thermal Hall effect.
His Wide-bandgap semiconductor research is multidisciplinary, incorporating perspectives in Algan gan, Leakage test, Electronic engineering and Dispersion. His studies in Field-effect transistor integrate themes in fields like Electron mobility, Condensed matter physics, Semiconductor device, Noise and MOSFET. His High-electron-mobility transistor study incorporates themes from Substrate, Operating temperature, Acceptor and Analytical chemistry.
His primary areas of investigation include Optoelectronics, Transistor, Wide-bandgap semiconductor, Gallium nitride and High-electron-mobility transistor. His Optoelectronics research integrates issues from Algan gan, Field-effect transistor and Voltage, Electrical engineering, Leakage. His research investigates the connection with Field-effect transistor and areas like Raman spectroscopy which intersect with concerns in Thermography.
Within one scientific family, Michael J. Uren focuses on topics pertaining to Silicon on insulator under Electrical engineering, and may sometimes address concerns connected to MOSFET. His work carried out in the field of Wide-bandgap semiconductor brings together such families of science as Passivation, Electroluminescence and Power semiconductor device. The concepts of his Gallium nitride study are interwoven with issues in Aluminium nitride, Radio frequency and Analytical chemistry.
Michael J. Uren mostly deals with Optoelectronics, Leakage, Transistor, Gallium nitride and High-electron-mobility transistor. Michael J. Uren connects Optoelectronics with Temperature measurement in his research. His Leakage study also includes fields such as
Michael J. Uren focuses mostly in the field of Transistor, narrowing it down to topics relating to Nitride and, in certain cases, Biasing and High electron. His Gallium nitride study combines topics in areas such as Field-effect transistor, Capacitive sensing, Photonics and Heterojunction. His biological study spans a wide range of topics, including Capacitance, Buffer design and Current.
Michael J. Uren mainly investigates Optoelectronics, Leakage, Transistor, Gallium nitride and Temperature measurement. Michael J. Uren is studying Wide-bandgap semiconductor, which is a component of Optoelectronics. Michael J. Uren interconnects Acceptor and Breakdown voltage in the investigation of issues within Wide-bandgap semiconductor.
His work deals with themes such as Chemical vapor deposition, High-electron-mobility transistor, Field effect, Epitaxy and Reverse bias, which intersect with Leakage. The study incorporates disciplines such as Photonics and Power electronics in addition to Transistor. His Gallium nitride research includes themes of Electron mobility, Doping and Engineering physics.
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An experimental and theoretical study of the formation and microstructure of porous silicon
M.I.J. Beale;J.D. Benjamin;M.J. Uren;N.G. Chew.
Journal of Crystal Growth (1985)
The 2018 GaN power electronics roadmap
H Amano;Y Baines;Matteo Borga.
Journal of Physics D (2018)
Microstructure and formation mechanism of porous silicon
M. I. J. Beale;N. G. Chew;M. J. Uren;A. G. Cullis.
Applied Physics Letters (1985)
Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy
M. Kuball;J.M. Hayes;M.J. Uren;I. Martin.
IEEE Electron Device Letters (2002)
1/f and random telegraph noise in silicon metal‐oxide‐semiconductor field‐effect transistors
M. J. Uren;D. J. Day;M. J. Kirton.
Applied Physics Letters (1985)
Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices
A. Sarua;Hangfeng Ji;K.P. Hilton;D.J. Wallis.
IEEE Transactions on Electron Devices (2007)
Buffer Design to Minimize Current Collapse in GaN/AlGaN HFETs
M. J. Uren;J. Moreke;M. Kuball.
IEEE Transactions on Electron Devices (2012)
Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures
A. Sarua;Hangfeng Ji;M. Kuball;M.J. Uren.
IEEE Transactions on Electron Devices (2006)
Punch-through in short-channel AlGaN/GaN HFETs
M.J. Uren;K.J. Nash;R.S. Balmer;T. Martin.
IEEE Transactions on Electron Devices (2006)
Self-heating effects in SOI MOSFETs and their measurement by small signal conductance techniques
B.M. Tenbroek;M.S.L. Lee;W. Redman-White;J.T. Bunyan.
IEEE Transactions on Electron Devices (1996)
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