World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
59
Citations
13750
World Ranking
1742
National Ranking
39

Materials Science

D-Index
61
Citations
14603
World Ranking
6723
National Ranking
68

Jean-Pierre Raskin publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Jean-Pierre Raskin sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 1,013 publications — 98th percentile

98% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Jean-Pierre Raskin D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Jean-Pierre Raskin sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 59 D-Index — 75th percentile

75% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2014 - IEEE Fellow For contributions to the characterization of silicon-on-insulator RF MOSFETs and MEMS devices

Overview

Jean-Pierre Raskin is affiliated with the Université Catholique de Louvain in Belgium. Their primary research focus lies within the field of engineering, with specific expertise in electrical and electronic engineering, materials chemistry, biomedical engineering, atomic and molecular physics, optics, and mechanical engineering.

Their extensive publication record spans several main topics including semiconductor materials and devices, advancements in semiconductor devices and circuit design, radio frequency integrated circuit design, integrated circuits and semiconductor failure analysis, semiconductor materials and interfaces, nanowire synthesis and applications, and graphene research and applications.

Frequently published in recognized academic venues, Jean-Pierre Raskin has contributed to Solid-State Electronics, SSRN Electronic Journal, IEEE Transactions on Electron Devices, IEEE Journal of the Electron Devices Society, and Acta Materialia.

Notable recent publications include:

  • "A Review on Functionalized Graphene Sensors for Detection of Ammonia," 2021, Sensors
  • "Porous silicon membranes and their applications: Recent advances," 2020, Sensors and Actuators A Physical
  • "Fundamental limitations in transferred CVD graphene caused by Cu catalyst surface morphology," 2020, Carbon
  • "Novel class of nanostructured metallic glass films with superior and tunable mechanical properties," 2021, Acta Materialia
  • "The Environmental Footprint of IC Production: Review, Analysis, and Lessons From Historical Trends," 2022, IEEE Transactions on Semiconductor Manufacturing

Jean-Pierre Raskin has collaborated frequently with several researchers, including Martin Rack, Denis Flandre, Thomas Pardoen, Valeriya Kilchytska, and Lucas Nyssens.

The scientist received the IEEE Fellow award in 2014 for contributions to the characterization of silicon-on-insulator RF MOSFETs and MEMS devices.

Best Publications

  • Substrate crosstalk reduction using SOI technology

    J.-P. Raskin;A. Viviani;D. Flandre;J.-P. Colinge

  • Raman and XPS characterization of vanadium oxide thin films with temperature

    Ferran Ureña-Begara;Aurelian Crunteanu;Jean-Pierre Raskin

  • Influence of device engineering on the analog and RF performances of SOI MOSFETs

    V. Kilchytska;A. Neve;L. Vancaillie;D. Levacq

  • New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity

    D. Lederer;J.-P. Raskin

  • Low Temperature Implementation of Dopant-Segregated Band-edge Metallic S/D junctions in Thin-Body SOI p-MOSFETs

    G. Larrieu;E. Dubois;R. Valentin;N. Breil

  • Fabrication method of so1 semiconductor devices

    Denis Fladre;Amaury De Mevergnies;Jean-Pierre Raskins

  • Substrate loss mechanisms for microstrip and CPW transmission lines on lossy silicon wafers

    Dimitri Lederer;Jean-Pierre Raskin

  • Identification of RF Harmonic Distortion on Si Substrates and its Reduction Using a Trap-Rich Layer

    Daniel C. Kerr;Joseph M. Gering;Thomas G. McKay;Michael S. Carroll

  • Low-temperature wafer bonding: a study of void formation and influence on bonding strength

    Xuan Xiong Zhang;J.-P. Raskin

  • A 94-GHz aperture-coupled micromachined microstrip antenna

    G.P. Gauthier;J.-P. Raskin;L.P.B. Katehi;G.M. Rebeiz

  • Inter- and intragranular plasticity mechanisms in ultrafine-grained Al thin films: An in situ TEM study

    F. Mompiou;M. Legros;A. Boé;Michaël Coulombier

  • Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling

    J.-P. Raskin;R. Gillon;Jian Chen;D. Vanhoenacker-Janvier

  • Effective resistivity of fully-processed SOI substrates

    Dimitri Lederer;Jean-Pierre Raskin

  • Semiconductor-On-Insulator Materials for Nanoelectronics Applications

    Alexei Nazarov;J.-P. Colinge;Francis Balestra;Jean-Pierre Raskin

  • Comparison of TiSi2 , CoSi2, and NiSi for Thin‐Film Silicon‐on‐Insulator Applications

    J. Chen;J.‐P. Colinge;D. Flandre;R. Gillon

  • Micromachined thin-film sensors for SOI-CMOS co-integration

    Jean Laconte;Denis Flandre;Jean-Pierre Raskin

  • Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization

    J.-P. Raskin;Tsung Ming Chung;V. Kilchytska;D. Lederer

  • New On-Chip Nanomechanical Testing Laboratory - Applications to Aluminum and Polysilicon Thin Films

    S. Gravier;M. Coulombier;A. Safi;N. Andre

  • What are the limiting parameters of deep-submicron MOSFETs for high frequency applications?

    G. Dambrine;C. Raynaud;D. Lederer;M. Dehan

  • Raman scattering study of the phonon dispersion in twisted bilayer graphene

    Jessica Campos-Delgado;Luiz G. Cançado;Carlos A. Achete;Ado Jorio

  • FinFET analogue characterization from DC to 110 GHz

    Dimitri Lederer;Valeriya Kilchytska;Tamara Rudenko;Nadine Collaert

Frequent Co-Authors

Denis Flandre
Denis Flandre Université Catholique de Louvain
Thomas Pardoen
Thomas Pardoen Université Catholique de Louvain
Isabelle Huynen
Isabelle Huynen Université Catholique de Louvain
Jean-Pierre Colinge
Jean-Pierre Colinge University of California, Davis
Dominique Schryvers
Dominique Schryvers University of Antwerp
Benjamin Iniguez
Benjamin Iniguez Rovira i Virgili University
Bernard Nysten
Bernard Nysten Université Catholique de Louvain

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