Kin Leong Pey

Kin Leong Pey publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Kin Leong Pey sits on this spectrum.

Kin Leong Pey D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Kin Leong Pey sits on this spectrum.

Best Publications

• Recommended Methods to Study Resistive Switching Devices

  Mario Lanza;H.-S. Philip Wong;Eric Pop;Daniele Ielmini

  641
  Citations

• Dielectric breakdown mechanisms in gate oxides

  Salvatore Lombardo;James H. Stathis;Barry P. Linder;Kin Leong Pey

  548
  Citations

• Carbon nanotube membranes with ultrahigh specific adsorption capacity for water desalination and purification

  Hui Ying Yang;Zhao Jun Han;Siu Fung Yu;Kin Leong Pey

  442
  Citations

• Dopant distribution in the recrystallization transient at the maximum melt depth induced by laser annealing

  K. K. Ong;K. L. Pey;P. S. Lee;A. T. S. Wee

  242
  Citations

• Standards for the Characterization of Endurance in Resistive Switching Devices.

  Mario Lanza;Rainer Waser;Rainer Waser;Daniele Ielmini;J. Joshua Yang

  231
  Citations

• A study of thermo-mechanical stress and its impact on through-silicon vias

  N Ranganathan;N Ranganathan;K Prasad;N Balasubramanian;K L Pey

  224
  Citations

• Effect of Copper TSV Annealing on Via Protrusion for TSV Wafer Fabrication

  A. Heryanto;A. Heryanto;W. N. Putra;W. N. Putra;Alastair David Trigg;S. Gao

  185
  Citations

• Excimer laser-annealed dopant segregated Schottky (ELA-DSS) Si nanowire gate-all-around (GAA) pFET with near zero effective Schottky barrier height (SBH)

  Y. K. Chin;K. L. Pey;N. Singh;G. Q. Lo

  151
  Citations

• New salicidation technology with Ni(Pt) alloy for MOSFETs

  P.S. Lee;K.L. Pey;D. Mangelinck;J. Ding

  137
  Citations

• The nature of dielectric breakdown

  Unknown

  129
  Citations

• Vertically arrayed Si nanowire/nanorod-based core-shell p-n junction solar cells

  X. Wang;K. L. Pey;C. H. Yip;E. A. Fitzgerald

  123
  Citations

• Two-dimensional analytical Mott-Gurney law for a trap-filled solid

  Unknown

  116
  Citations

• Percolation path and dielectric-breakdown-induced-epitaxy evolution during ultrathin gate dielectric breakdown transient

  Unknown

  115
  Citations

• Annealing of ultrashallow p+/n junction by 248 nm excimer laser and rapid thermal processing with different preamorphization depths

  Y. F. Chong;K. L. Pey;A. T. S. Wee;A. See

  108
  Citations

• Effect of current direction on the lifetime of different levels of Cu dual-damascene metallization

  C. L. Gan;C. V. Thompson;K. L. Pey;W. K. Choi

  100
  Citations

• Polarity-dependent dielectric breakdown-induced epitaxy (DBIE) in Si MOSFETs

  Unknown

  97
  Citations

• Salicide formation on narrow poly lines by pulling back of spacer

  Kin-Leong Pey;Soh-Yun Siah

  89
  Citations

• Intrinsic nanofilamentation in resistive switching

  Xing Wu;Dongkyu Cha;Michel Bosman;Nagarajan Raghavan

  84
  Citations

• Interfacial reactions of Ni on Si1−xGex (x=0.2, 0.3) at low temperature by rapid thermal annealing

  H. B. Zhao;Kin Leong Pey;W. K. Choi;Sujay Chattopadhyay

  80
  Citations

• A High-Yield $\hbox{HfO}_{x}$ -Based Unipolar Resistive RAM Employing Ni Electrode Compatible With Si-Diode Selector for Crossbar Integration

  X A Tran;H Y Yu;Y C Yeo;L Wu

  73
  Citations

• Designettes: An Approach to Multidisciplinary Engineering Design Education

  Cassandra Telenko;Kristin Wood;Kevin Otto;Mohan Rajesh Elara

  70
  Citations

• A Compact Model for Undoped Silicon-Nanowire MOSFETs With Schottky-Barrier Source/Drain

  Guojun Zhu;Xing Zhou;Teck Seng Lee;Lay Kee Ang

  64
  Citations

• Ultra-low sheet resistance metal/poly-SI gate for deep sub-micron CMOS application

  Chong Wee Lim;Kin Leong Pey;Soh Yun Siah;Eng Hwa Lim

  56
  Citations

• Evidence for compliance controlled oxygen vacancy and metal filament based resistive switching mechanisms in RRAM

  Nagarajan Raghavan;Kin Leong Pey;Wenhu Liu;Xing Wu

  45
  Citations

• Bilayer gate dielectric study by scanning tunneling microscopy

  Y. C. Ong;D. S. Ang;K. L. Pey;S. J. O’Shea

  37
  Citations

• Germanium coated vertically-aligned multiwall carbon nanotubes as lithium-ion battery anodes

  Rahmat Agung Susantyoko;Rahmat Agung Susantyoko;Xinghui Wang;Leimeng Sun;Kin Leong Pey

  33
  Citations

• Direct visualization and in-depth physical study of metal filament formation in percolated high-κ dielectrics

  X. Li;K. L. Pey;M. Bosman;W. H. Liu

  32
  Citations

• Activating source and drain junctions and extensions using a single laser anneal

  Yung Fu Chong;Kin Leong Pey;Alex See

  32
  Citations

• High performance unipolar AlO y /HfO x /Ni based RRAM compatible with Si diodes for 3D application

  X.A. Tran;B. Gao;J.F. Kang;L. Wu

  24
  Citations