Kin Leong Pey

Best Publications

• Recommended Methods to Study Resistive Switching Devices

  Mario Lanza;H.-S. Philip Wong;Eric Pop;Daniele Ielmini

  641
  Citations

• Dielectric breakdown mechanisms in gate oxides

  Salvatore Lombardo;James H. Stathis;Barry P. Linder;Kin Leong Pey

  548
  Citations

• Carbon nanotube membranes with ultrahigh specific adsorption capacity for water desalination and purification

  Hui Ying Yang;Zhao Jun Han;Siu Fung Yu;Kin Leong Pey

  442
  Citations

• Dopant distribution in the recrystallization transient at the maximum melt depth induced by laser annealing

  K. K. Ong;K. L. Pey;P. S. Lee;A. T. S. Wee

  242
  Citations

• Standards for the Characterization of Endurance in Resistive Switching Devices.

  Mario Lanza;Rainer Waser;Rainer Waser;Daniele Ielmini;J. Joshua Yang

  231
  Citations

• A study of thermo-mechanical stress and its impact on through-silicon vias

  N Ranganathan;N Ranganathan;K Prasad;N Balasubramanian;K L Pey

  224
  Citations

• Effect of Copper TSV Annealing on Via Protrusion for TSV Wafer Fabrication

  A. Heryanto;A. Heryanto;W. N. Putra;W. N. Putra;Alastair David Trigg;S. Gao

  185
  Citations

• Excimer laser-annealed dopant segregated Schottky (ELA-DSS) Si nanowire gate-all-around (GAA) pFET with near zero effective Schottky barrier height (SBH)

  Y. K. Chin;K. L. Pey;N. Singh;G. Q. Lo

  151
  Citations

• New salicidation technology with Ni(Pt) alloy for MOSFETs

  P.S. Lee;K.L. Pey;D. Mangelinck;J. Ding

  137
  Citations

• The nature of dielectric breakdown

  Unknown

  129
  Citations

• Vertically arrayed Si nanowire/nanorod-based core-shell p-n junction solar cells

  X. Wang;K. L. Pey;C. H. Yip;E. A. Fitzgerald

  123
  Citations

• Two-dimensional analytical Mott-Gurney law for a trap-filled solid

  Unknown

  116
  Citations

• Percolation path and dielectric-breakdown-induced-epitaxy evolution during ultrathin gate dielectric breakdown transient

  Unknown

  115
  Citations

• Annealing of ultrashallow p+/n junction by 248 nm excimer laser and rapid thermal processing with different preamorphization depths

  Y. F. Chong;K. L. Pey;A. T. S. Wee;A. See

  108
  Citations

• Effect of current direction on the lifetime of different levels of Cu dual-damascene metallization

  C. L. Gan;C. V. Thompson;K. L. Pey;W. K. Choi

  100
  Citations

• Polarity-dependent dielectric breakdown-induced epitaxy (DBIE) in Si MOSFETs

  Unknown

  97
  Citations

• Salicide formation on narrow poly lines by pulling back of spacer

  Kin-Leong Pey;Soh-Yun Siah

  89
  Citations

• Intrinsic nanofilamentation in resistive switching

  Xing Wu;Dongkyu Cha;Michel Bosman;Nagarajan Raghavan

  84
  Citations

• Interfacial reactions of Ni on Si1−xGex (x=0.2, 0.3) at low temperature by rapid thermal annealing

  H. B. Zhao;Kin Leong Pey;W. K. Choi;Sujay Chattopadhyay

  80
  Citations

• A High-Yield $\hbox{HfO}_{x}$ -Based Unipolar Resistive RAM Employing Ni Electrode Compatible With Si-Diode Selector for Crossbar Integration

  X A Tran;H Y Yu;Y C Yeo;L Wu

  73
  Citations

• Designettes: An Approach to Multidisciplinary Engineering Design Education

  Cassandra Telenko;Kristin Wood;Kevin Otto;Mohan Rajesh Elara

  70
  Citations

• A Compact Model for Undoped Silicon-Nanowire MOSFETs With Schottky-Barrier Source/Drain

  Guojun Zhu;Xing Zhou;Teck Seng Lee;Lay Kee Ang

  64
  Citations

• Ultra-low sheet resistance metal/poly-SI gate for deep sub-micron CMOS application

  Chong Wee Lim;Kin Leong Pey;Soh Yun Siah;Eng Hwa Lim

  56
  Citations

• Evidence for compliance controlled oxygen vacancy and metal filament based resistive switching mechanisms in RRAM

  Nagarajan Raghavan;Kin Leong Pey;Wenhu Liu;Xing Wu

  45
  Citations

• Bilayer gate dielectric study by scanning tunneling microscopy

  Y. C. Ong;D. S. Ang;K. L. Pey;S. J. O’Shea

  37
  Citations

• Germanium coated vertically-aligned multiwall carbon nanotubes as lithium-ion battery anodes

  Rahmat Agung Susantyoko;Rahmat Agung Susantyoko;Xinghui Wang;Leimeng Sun;Kin Leong Pey

  33
  Citations

• Direct visualization and in-depth physical study of metal filament formation in percolated high-κ dielectrics

  X. Li;K. L. Pey;M. Bosman;W. H. Liu

  32
  Citations

• Activating source and drain junctions and extensions using a single laser anneal

  Yung Fu Chong;Kin Leong Pey;Alex See

  32
  Citations

• High performance unipolar AlO y /HfO x /Ni based RRAM compatible with Si diodes for 3D application

  X.A. Tran;B. Gao;J.F. Kang;L. Wu

  24
  Citations