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D-Index & Metrics

Electronics and Electrical Engineering

D-Index
60
Citations
13067
World Ranking
1646
National Ranking
667

Chih-Tang Sah publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Chih-Tang Sah sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 267 publications — 49th percentile

49% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Chih-Tang Sah D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Chih-Tang Sah sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 60 D-Index — 77th percentile

77% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Chih-Tang Sah is a researcher affiliated with the University of Florida in the United States. Their academic career is associated with this institution, where they contribute to scientific research and scholarship.

There is no available detailed information on their recent publications, co-authors, or frequent publication venues. Similarly, data on book publications and detailed fields or subfields of study have not been provided.

Since data on main fields of study, main topics of work, and awards won are absent, the profile focuses on their established connection to their primary affiliation, indicating an ongoing role in academic and scientific inquiry at the university level.

Best Publications

  • Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics

    Unknown

  • Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconductor transistors☆

    H.C. Pao;C.T. Sah

  • Thermal and optical emission and capture rates and cross sections of electrons and holes at imperfection centers in semiconductors from photo and dark junction current and capacitance experiments

    C.T. Sah;L. Forbes;L.L. Rosier;A.F. Tasch

  • Characteristics of the metal-Oxide-semiconductor transistors

    C.T. Sah

  • Direct-current measurements of oxide and interface traps on oxidized silicon

    A. Neugroschel;Chih-Tang Sah;K.M. Han;M.S. Carroll

  • Frequency dependence of the reverse-biased capacitance of gold-doped silicon P + N step junctions

    C.T. Sah;V.G.K. Reddi

  • Electron-Hole Recombination Statistics in Semiconductors through Flaws with Many Charge Conditions

    Unknown

  • Theory of localized states in semiconductors. I. New results using an old method

    Sokrates T. Pantelides;C. T. Sah

  • Theory and experiments on surface 1/f noise

    Horng-Sen Fu;Chih-Tang Sah

  • The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistors

    C.T. Sah;H.C. Pao

  • Models and experiments on degradation of oxidized silicon

    C.T. Sah

  • Nanowatt logic using field-effect metal-oxide semiconductor triodes

    Unknown

  • Properties of 1.0-MeV-Electron-Irradiated Defect Centers in Silicon

    J. W. Walker;C. T. Sah

  • The equivalent circuit model in solid-state electronics—Part I: The single energy level defect centers

    Chih-Tang Sah

  • Effect of surface recombination and channel on P-N junction and transistor characteristics

    Unknown

  • Thermal emission and capture of electrons at sulfur centers in silicon

    L.L. Rosier;C.T. Sah

  • THERMAL EMISSION RATES OF CARRIERS AT GOLD CENTERS IN SILICON

    C. T. Sah;L. Forbes;L. I. Rosier;A. F. Tasch

  • Study of the atomic models of three donorlike defects in silicon metal‐oxide‐semiconductor structures from their gate material and process dependencies

    Chih Tang Sah;Jack Yuan Chen Sun;Joseph Jeng Tao Tzou

  • Theory and experiments of low-frequency generation-recombination noise in MOS transistors

    L.D. Yau;Chih-Tang Sah

  • The equivalent circuit model in solid-state electronics—III: Conduction and displacement currents

    C.T. Sah

  • Bulk and interface imperfections in semiconductors

    C.T. Sah

  • Gate tunneling currents in ultrathin oxide metal–oxide–silicon transistors

    Jin Cai;Chih-Tang Sah

  • Source to drain resistance beyond pinch-off in metal-oxide-semiconductor transistors (MOST)

    V.G.K. Reddi;C.T. Sah

  • Theory of Scattering of Electrons in a Nondegenerate-Semiconductor-Surface Inversion Layer by Surface-Oxide Charges

    T. H. Ning;C. T. Sah

Frequent Co-Authors

Toshikazu Nishida
Toshikazu Nishida University of Florida
Sokrates T. Pantelides
Sokrates T. Pantelides Vanderbilt University
Jerry G. Fossum
Jerry G. Fossum University of Florida

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