Chih-Tang Sah

Overview

Best Publications

• Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics

  Unknown

  2106
  Citations

• Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconductor transistors☆

  H.C. Pao;C.T. Sah

  841
  Citations

• Thermal and optical emission and capture rates and cross sections of electrons and holes at imperfection centers in semiconductors from photo and dark junction current and capacitance experiments

  C.T. Sah;L. Forbes;L.L. Rosier;A.F. Tasch

  604
  Citations

• Characteristics of the metal-Oxide-semiconductor transistors

  C.T. Sah

  374
  Citations

• Direct-current measurements of oxide and interface traps on oxidized silicon

  A. Neugroschel;Chih-Tang Sah;K.M. Han;M.S. Carroll

  242
  Citations

• Frequency dependence of the reverse-biased capacitance of gold-doped silicon P + N step junctions

  C.T. Sah;V.G.K. Reddi

  223
  Citations

• Electron-Hole Recombination Statistics in Semiconductors through Flaws with Many Charge Conditions

  Unknown

  223
  Citations

• Theory of localized states in semiconductors. I. New results using an old method

  Sokrates T. Pantelides;C. T. Sah

  199
  Citations

• Theory and experiments on surface 1/f noise

  Horng-Sen Fu;Chih-Tang Sah

  194
  Citations

• The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistors

  C.T. Sah;H.C. Pao

  191
  Citations

• Models and experiments on degradation of oxidized silicon

  C.T. Sah

  184
  Citations

• Nanowatt logic using field-effect metal-oxide semiconductor triodes

  Unknown

  180
  Citations

• Properties of 1.0-MeV-Electron-Irradiated Defect Centers in Silicon

  J. W. Walker;C. T. Sah

  165
  Citations

• The equivalent circuit model in solid-state electronics—Part I: The single energy level defect centers

  Chih-Tang Sah

  160
  Citations

• Effect of surface recombination and channel on P-N junction and transistor characteristics

  Unknown

  150
  Citations

• Thermal emission and capture of electrons at sulfur centers in silicon

  L.L. Rosier;C.T. Sah

  147
  Citations

• THERMAL EMISSION RATES OF CARRIERS AT GOLD CENTERS IN SILICON

  C. T. Sah;L. Forbes;L. I. Rosier;A. F. Tasch

  145
  Citations

• Study of the atomic models of three donorlike defects in silicon metal‐oxide‐semiconductor structures from their gate material and process dependencies

  Chih Tang Sah;Jack Yuan Chen Sun;Joseph Jeng Tao Tzou

  140
  Citations

• Theory and experiments of low-frequency generation-recombination noise in MOS transistors

  L.D. Yau;Chih-Tang Sah

  135
  Citations

• The equivalent circuit model in solid-state electronics—III: Conduction and displacement currents

  C.T. Sah

  130
  Citations

• Bulk and interface imperfections in semiconductors

  C.T. Sah

  122
  Citations

• Gate tunneling currents in ultrathin oxide metal–oxide–silicon transistors

  Jin Cai;Chih-Tang Sah

  119
  Citations

• Source to drain resistance beyond pinch-off in metal-oxide-semiconductor transistors (MOST)

  V.G.K. Reddi;C.T. Sah

  112
  Citations

• Theory of Scattering of Electrons in a Nondegenerate-Semiconductor-Surface Inversion Layer by Surface-Oxide Charges

  T. H. Ning;C. T. Sah

  107
  Citations