World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
57
Citations
15979
World Ranking
2592
National Ranking
787

Best Publications

  • Step and flash imprint lithography: a new approach to high-resolution patterning

    Matthew Colburn;Stephen C. Johnson;Michael D. Stewart;S. Damle

  • Block Copolymer Lithography

    Christopher M. Bates;Michael J. Maher;Dustin W. Janes;Christopher J. Ellison

  • Introduction to microlithography

    L. F. Thompson;C. G. Willson;M. J. Bowden

  • Step and flash imprint lithography

    Carlton Grant Willson;Matthew Earl Colburn

  • Imprint Lithography Template Having a Feature Size Under 250 nm

    Todd C. Bailey;Byung-Jin Choi;Matthew E. Colburn;Sidlgata V. Sreenivasan

  • Step and flash imprint lithography: Template surface treatment and defect analysis

    T. Bailey;B. J. Choi;M. Colburn;M. Meissl

  • Polarity-switching top coats enable orientation of sub-10-nm block copolymer domains.

    Christopher M. Bates;Takehiro Seshimo;Michael J. Maher;William J. Durand

  • Novel second‐order nonlinear optical polymers via chemical cross‐linking‐induced vitrification under electric field

    Manfred Eich;Bernd Reck;Do Y. Yoon;C. Grant Willson

  • Apparatus for imprint lithography using an electric field

    Sidlgata V. Sreenivasan;Roger T. Bonnecaze;Carlton Grant Willson

  • Airborne chemical contamination of a chemically amplified resist

    Scott A. MacDonald;Nicholas J. Clecak;H. R. Wendt;C. Grant Willson

  • Patterning curved surfaces: Template generation by ion beam proximity lithography and relief transfer by step and flash imprint lithography

    P. Ruchhoeft;M. Colburn;B. Choi;H. Nounu

  • Step & flash imprint lithography

    Douglas J. Resnick;S.V. Sreenivasan;C. Grant Willson

  • Nanoimprint Lithography Materials Development for Semiconductor Device Fabrication

    Elizabeth A. Costner;Michael W. Lin;Wei-Lun Jen;C. Grant Willson

  • Imprint lithography for integrated circuit fabrication

    D. J. Resnick;W. J. Dauksher;D. Mancini;K. J. Nordquist

  • Step and flash imprint lithography for sub-100-nm patterning

    Matthew Colburn;Annette Grot;Marie N. Amistoso;Byung Jin Choi

  • Design of high‐χ block copolymers for lithography

    William J. Durand;Gregory Blachut;Michael J. Maher;Stephen Sirard

  • The Mechanism of Phenolic Polymer Dissolution: A New Perspective

    Pavlos C. Tsiartas;Lewis W. Flanagin;Clifford L. Henderson;William D. Hinsberg

  • High resolution templates for step and flash imprint lithography

    D. J. Resnick;W. J. Dauksher;D. Mancini;K. J. Nordquist

  • Directed Self-Assembly and Pattern Transfer of Five Nanometer Block Copolymer Lamellae

    Austin P. Lane;XiaoMin Yang;Michael J. Maher;Gregory Blachut

  • Step and flash imprint lithography: Defect analysis

    T. Bailey;B. Smith;B. J. Choi;M. Colburn

  • Interfacial Design for Block Copolymer Thin Films

    Michael J. Maher;Christopher M. Bates;Gregory Blachut;Stephen Sirard

  • Step and Flash Imprint Lithography: An Efficient Nanoscale Printing Technology

    T.C. Bailey;S.C. Johnson;S.V. Sreenivasan;J.G. Ekerdt

  • Method and system for imprint lithography using an electric field

    Sidlgata Sreenivasan;Roger Bonnecaze;Carlton Willson

  • Second‐order nonlinear optical properties and relaxation characteristics of poled linear epoxy polymers with tolane chromophores

    D. Jungbauer;I. Teraoka;D. Y. Yoon;B. Reck

  • Template fabrication schemes for step and flash imprint lithography

    T.C. Bailey;D.J. Resnick;D. Mancini;K.J. Nordquist

  • Preparation of oriented multilayers of poly(silanes) by the Langmuir-Blodgett technique

    F. W. Embs;G. Wegner;D. Neher;D. Neher;P. Albouy

  • Apparatus for fabricating nanoscale patterns in light curable compositions using an electric field

    Carlton Grant Willson;Sidlgata V. Sreenivasan;Roger T. Bonnecaze

  • Vinyl ethers in ultraviolet curable formulations for step and flash imprint lithography

    E. K. Kim;N. A. Stacey;B. J. Smith;M. D. Dickey

  • Imprint lithography templates having alignment marks

    Todd C Bailey;Stephen C Johnson;Matthew E Colburn;Byung-Jin Choi

  • Study of ion and vacuum ultraviolet-induced effects on styrene- and ester-based polymers exposed to argon plasma

    R. L. Bruce;S. Engelmann;T. Lin;T. Kwon

  • Hydrogen silsesquioxane for direct electron-beam patterning of step and flash imprint lithography templates

    D. P. Mancini;K. A. Gehoski;E. Ainley;K. J. Nordquist

  • Method and system for fabricating nanoscale patterns in light curable compositions using an electric field

    Carlton Willson;Sidlgata Sreenivasan;Roger Bonnecaze

Frequent Co-Authors

Sidlgata V. Sreenivasan
Sidlgata V. Sreenivasan The University of Texas at Austin
Matthew E. Colburn
Matthew E. Colburn Facebook (United States)
John G. Ekerdt
John G. Ekerdt The University of Texas at Austin
Roger T. Bonnecaze
Roger T. Bonnecaze The University of Texas at Austin
Christopher J. Ellison
Christopher J. Ellison University of Minnesota
Michael D. Dickey
Michael D. Dickey North Carolina State University
Henry Rapoport
Henry Rapoport University of California, Berkeley
A. Alec Talin
A. Alec Talin Sandia National Laboratories
Dieter Neher
Dieter Neher University of Potsdam
Christopher W. Bielawski
Christopher W. Bielawski Ulsan National Institute of Science and Technology

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