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Materials Science

D-Index
45
Citations
7657
World Ranking
11745
National Ranking
2739

Overview

Eric K. Lin is affiliated with the National Institute of Standards and Technology in the United States. Their research primarily focuses on computer science and engineering, with specific attention to artificial intelligence, electrical and electronic engineering, computer vision and pattern recognition, transportation, and biomedical engineering.

The scientist's work covers several main topics, including:

  • Privacy-Preserving Technologies in Data
  • Human Mobility and Location-Based Analysis
  • Advancements in Photolithography Techniques
  • Advanced Surface Polishing Techniques
  • Optical Coatings and Gratings
  • Advancements in Battery Materials
  • MXene and MAX Phase Materials

Frequent co-authors collaborating with Eric K. Lin include:

  • Vaikkunth Mugunthan
  • Christian Lau
  • Wen-Li Wu
  • R. Joseph Kline
  • Ronald L. Jones

Their publications appear mainly in the following venues:

  • arXiv (Cornell University)
  • Journal of Micro/Nanopatterning Materials and Metrology
  • Extreme Mechanics Letters

Representative recent papers by Eric K. Lin include:

  • "Phi-3 Technical Report: A Highly Capable Language Model Locally on Your Phone", 2024, arXiv (Cornell University)
  • "Review of the key milestones in the development of critical dimension small angle x-ray scattering at National Institute of Standards and Technology", 2023, Journal of Micro/Nanopatterning Materials and Metrology
  • "Size- and temperature-dependent mechanical properties of metallic lithium", 2023, Extreme Mechanics Letters
  • "Does fine-tuning GPT-3 with the OpenAI API leak personally-identifiable information?", 2023, arXiv (Cornell University)
  • "oneDNN Graph Compiler: A Hybrid Approach for High-Performance Deep Learning Compilation", 2023, arXiv (Cornell University)

Best Publications

  • Critical Role of Side-Chain Attachment Density on the Order and Device Performance of Polythiophenes

    R. Joseph Kline;Dean M. Delongchamp;Daniel A. Fischer;Eric K. Lin

  • High Carrier Mobility Polythiophene Thin Films: Structure Determination by Experiment and Theory†

    Dean M. DeLongchamp;Regis J. Kline;Eric K. Lin;Daniel A. Fischer

  • Effect of Film Thickness on the Validity of the Sauerbrey Equation for Hydrated Polyelectrolyte Films

    Bryan D. Vogt;Eric K. Lin;Wen Ii Wu;Christopher C. White

  • Variations in semiconducting polymer microstructure and hole mobility with spin-coating speed

    Dean M. Delongchamp;Brandon M. Vogel;Youngsuk Jung;Marc C. Gurau

  • Measuring Molecular Order in Poly(3-alkylthiophene) Thin Films with Polarizing Spectroscopies

    Marc C. Gurau;Dean M. Delongchamp;Brandon M. Vogel;Eric K. Lin

  • Reduced Polymer Mobility near the Polymer/Solid Interface as Measured by Neutron Reflectivity

    Eric K. Lin;Rainer Kolb;Sushil K. Satija;Wen-li Wu

  • Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scattering

    Wen-li Wu;William E. Wallace;Eric K. Lin;Gary W. Lynn

  • Controlling the orientation of terraced nanoscale "ribbons" of a poly(thiophene) semiconductor.

    Dean M. DeLongchamp;R. Joseph Kline;Youngsuk Jung;David S. Germack

  • Nanoporous Ultralow Dielectric Constant Organosilicates Templated by Triblock Copolymers

    Shu Yang;Peter A. Mirau;Chien-Shing Pai;Omkaram Nalamasu

  • Significant dependence of morphology and charge carrier mobility on substrate surface chemistry in high performance polythiophene semiconductor films

    R. Joseph Kline;Dean M. DeLongchamp;Daniel A. Fischer;Eric K. Lin

  • Semicrystalline Diblock Copolymer Platelets in Dilute Solution

    Eric K. Lin;Alice P. Gast

  • Moisture absorption and absorption kinetics in polyelectrolyte films: influence of film thickness.

    Bryan D. Vogt;Christopher L. Soles;Hae Jeong Lee;Eric K. Lin

  • Polymer Interdiffusion near an Attractive Solid Substrate

    Eric K. Lin;Wen-Li Wu;Sushil K. Satija

  • The Effect of Interfacial Roughness on the Thin Film Morphology and Charge Transport of High‐Performance Polythiophenes

    Youngsuk Jung;R. Joseph Kline;Daniel A. Fischer;Eric K. Lin

  • Molecular Basis of Mesophase Ordering in a Thiophene-Based Copolymer

    Dean M. DeLongchamp;R. Joseph Kline;Youngsuk Jung;Eric K. Lin

  • Moisture absorption into ultrathin hydrophilic polymer films on different substrate surfaces

    Bryan D. Vogt;Christopher L. Soles;Hae Jeong Lee;Eric K. Lin

  • Molecular Templating of Nanoporous Ultralow Dielectric Constant (≈1.5) Organosilicates by Tailoring the Microphase Separation of Triblock Copolymers

    Shu Yang;Peter A. Mirau;Chien-Shing Pai;Omkaram Nalamasu

  • Direct measurement of the reaction front in chemically amplified photoresists.

    Eric K. Lin;Christopher L. Soles;Dario L. Goldfarb;Brian C. Trinque

  • Small Angle X-Ray Scattering for Sub-100 nm Pattern Characterization

    Ronald L. Jones;Tengjiao Hu;Eric K. Lin;Wen-Li Wu

  • Structure Evolution in a Polyurea Segmented Block Copolymer Because of Mechanical Deformation

    J. A. Pathak;J. N. Twigg;K. E. Nugent;D. L. Ho

  • Chain conformation in ultrathin polymer films

    Ronald L. Jones;Christopher L. Soles;Francis W. Starr;Eric K. Lin

Frequent Co-Authors

Wen-li Wu
Wen-li Wu National Institute of Standards and Technology
Christopher L. Soles
Christopher L. Soles National Institute of Standards and Technology
Bryan D. Vogt
Bryan D. Vogt Pennsylvania State University
Dean M. DeLongchamp
Dean M. DeLongchamp National Institute of Standards and Technology
Daniel A. Fischer
Daniel A. Fischer National Institute of Standards and Technology
Sushil K. Satija
Sushil K. Satija National Institute of Standards and Technology
Jian Ping Gong
Jian Ping Gong Hokkaido University
Iain McCulloch
Iain McCulloch University of Oxford
Alamgir Karim
Alamgir Karim University of Houston
Lee J. Richter
Lee J. Richter National Institute of Standards and Technology

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