World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
40
Citations
6393
World Ranking
4512
National Ranking
1596

Sufi Zafar publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Sufi Zafar sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 130 publications — 9th percentile

9% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Sufi Zafar D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Sufi Zafar sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 40 D-Index — 36th percentile

36% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Sufi Zafar is affiliated with IBM in the United States and has contributed to research primarily in the field of Medicine. Their research spans multiple subfields including Neurology, Pulmonary and Respiratory Medicine, Molecular Biology, Biomedical Engineering, and Bioengineering.

The scientist has published papers in various peer-reviewed venues. Frequent publication venues include:

  • ACS Nano
  • Discover Sustainability
  • Neurology India
  • Drugs in Context
  • IEEE electron devices reviews.

Sufi Zafar's key research topics cover areas such as:

  • Respiratory Support and Mechanisms
  • Advanced biosensing and bioanalysis techniques
  • Biosensors and Analytical Detection
  • Analytical Chemistry and Sensors
  • Urban Transport and Accessibility
  • Environmental Education and Sustainability
  • Neurological disorders and treatments

Frequent collaborators include Alok Kumar, Sajjad Alam, Shagun Agrawal, Nilesh Kumar, and S. Goel.

Significant papers authored or co-authored by Sufi Zafar involve:

  • "Local Environment Affects the Activity of Enzymes on a 3D Molecular Scaffold," 2020, ACS Nano
  • "Interleaved Stimulation for Freezing of Gait in Advanced Parkinson's Disease," 2021, Neurology India
  • "Comparison of current and proposed travel modes for students considering travelling and sustainable indicators," 2024, Discover Sustainability
  • "Pharmacovigilance monitoring and treatment adherence in patients on antihypertensive drugs at a tertiary care centre," 2024, Drugs in Context
  • "Editorial Introduction to the IEEE Electron Devices Reviews," 2025, IEEE electron devices reviews.

Best Publications

  • The negative bias temperature instability in MOS devices: A review

    James H. Stathis;Sufi Zafar

  • Ultrathin high-K gate stacks for advanced CMOS devices

    E.P. Gusev;D.A. Buchanan;E. Cartier;A. Kumar

  • Charge trapping related threshold voltage instabilities in high permittivity gate dielectric stacks

    Sufi Zafar;Alessandro Callegari;Evgeni Gusev;Massimo V. Fischetti

  • Threshold voltage instabilities in high-/spl kappa/ gate dielectric stacks

    S. Zafar;A. Kumar;E. Gusev;E. Cartier

  • A Comparative Study of NBTI and PBTI (Charge Trapping) in SiO2/HfO2 Stacks with FUSI, TiN, Re Gates

    S. Zafar;Y.H. Kim;V. Narayanan;C. Cabral

  • Deposition of hafnium oxide and/or zirconium oxide and fabrication of passivated electronic structures

    Cyril Cabral;Alessandro C. Callegari;Michael A. Gribelyuk;Paul C. Jamison

  • Charge trapping in ultrathin hafnium oxide

    W.J. Zhu;T.P. Ma;S. Zafar;T. Tamagawa

  • The electronic conduction mechanism in barium strontium titanate thin films

    Sufi Zafar;Robert E. Jones;Bo Jiang;Bruce White

  • Memory device that includes passivated nanoclusters and method for manufacture

    Ramachandran Muralidhar;Chitra K. Subramanian;Sucharita Madhukar;Bruce E. White

  • Oxygen vacancy mobility determined from current measurements in thin Ba0.5Sr0.5TiO3 films

    Sufi Zafar;Robert E. Jones;Bo Jiang;Bruce White

  • Statistical mechanics based model for negative bias temperature instability induced degradation

    Sufi Zafar

  • A manufacturable dual channel (Si and SiGe) high-k metal gate CMOS technology with multiple oxides for high performance and low power applications

    S. Krishnan;U. Kwon;N. Moumen;M.W. Stoker

  • Threshold Voltage Instabilities in High- Gate Dielectric Stacks

    Sufi Zafar;Arvind Kumar;Evgeni Gusev;E. Cartier

  • Charge trapping in high k gate dielectric stacks

    S. Zafar;A. Callegari;E. Gusev;M.V. Fischetti

  • High-performance high-κ/metal gates for 45nm CMOS and beyond with gate-first processing

    M. Chudzik;B. Doris;R. Mo;J. Sleight

  • Band-Edge High-Performance High-k/Metal Gate n-MOSFETs Using Cap Layers Containing Group IIA and IIIB Elements with Gate-First Processing for 45 nm and Beyond

    V. Narayanan;V.K. Paruchuri;N.A. Bojarczuk;B.P. Linder

  • Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability

    Aditya Bansal;Rahul M. Rao;Jae-Joon Kim;Sufi Zafar

  • (Ba,Sr)TiO3 thin films with conducting perovskite electrodes for dynamic random access memory applications

    B. Nagaraj;T. Sawhney;S. Perusse;S. Aggarwal

  • Measurement of oxygen diffusion in nanometer scale HfO2 gate dielectric films

    Sufi Zafar;Hemanth Jagannathan;Lisa F. Edge;Devendra Gupta

  • Threshold voltage control in NiSi-gated MOSFETs through silicidation induced impurity segregation (SIIS)

    J. Kedzierski;D. Boyd;P. Ronsheim;S. Zafar

  • Investigation of bulk and interfacial properties of Ba0.5Sr0.5TiO3 thin film capacitors

    Sufi Zafar;Robert E. Jones;Peir Chu;Bruce White

Frequent Co-Authors

Vijay Narayanan
Vijay Narayanan IBM (United States)
Evgeni Gusev
Evgeni Gusev Qualcomm (United States)
Tak H. Ning
Tak H. Ning IBM (United States)
Vamsi K. Paruchuri
Vamsi K. Paruchuri IBM (United States)
James H. Stathis
James H. Stathis IBM (United States)
Cyril Cabral
Cyril Cabral IBM (United States)
Eduard A. Cartier
Eduard A. Cartier IBM (United States)
Martin M. Frank
Martin M. Frank IBM (United States)
Bruce B. Doris
Bruce B. Doris IBM (United States)
Meikei Ieong
Meikei Ieong Simbury Limited

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