World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
41
Citations
7540
World Ranking
4268
National Ranking
1524

Marvin H. White publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Marvin H. White sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 245 publications — 43rd percentile

43% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Marvin H. White D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Marvin H. White sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 41 D-Index — 39th percentile

39% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2001 - Member of the National Academy of Engineering For contributions to solid-state imagers and for advances in silicon devices and technology.

Overview

What is he best known for?

The fields of study he is best known for:

  • Quantum mechanics
  • Electrical engineering
  • Semiconductor

Marvin H. White mostly deals with Electrical engineering, Optoelectronics, Non-volatile memory, Voltage and Transistor. His work in the fields of Electrical engineering, such as Threshold voltage, CMOS and Integrated circuit, overlaps with other areas such as Silicon carbide. He has researched Optoelectronics in several fields, including Field-effect transistor, Electronic engineering, Nitride and MOSFET.

His studies in Electronic engineering integrate themes in fields like Characterization, Doping and Omega. The study incorporates disciplines such as Field-programmable gate array, System of measurement and Data retention in addition to Non-volatile memory. His study explores the link between Voltage and topics such as Semiconductor that cross with problems in Low voltage, Electrode, Capacitor and Capacitance.

His most cited work include:

  • On the go with SONOS (445 citations)
  • Characterization of surface channel CCD image arrays at low light levels (282 citations)
  • Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFET's (231 citations)

What are the main themes of his work throughout his whole career to date?

Marvin H. White spends much of his time researching Optoelectronics, Electrical engineering, Transistor, Electronic engineering and Non-volatile memory. His Optoelectronics research incorporates themes from Semiconductor memory, Nitride and MOSFET. Electrical engineering and Quantum tunnelling are frequently intertwined in his study.

The Transistor study combines topics in areas such as Capacitance and Integrated circuit. Marvin H. White focuses mostly in the field of Electronic engineering, narrowing it down to topics relating to Filter and, in certain cases, Digital signal processor. His research integrates issues of Field-programmable gate array, Silicon nitride, Silicon and Semiconductor in his study of Non-volatile memory.

He most often published in these fields:

  • Optoelectronics (54.19%)
  • Electrical engineering (43.58%)
  • Transistor (24.02%)

What were the highlights of his more recent work (between 2004-2009)?

  • Optoelectronics (54.19%)
  • Electrical engineering (43.58%)
  • High-κ dielectric (8.38%)

In recent papers he was focusing on the following fields of study:

Marvin H. White focuses on Optoelectronics, Electrical engineering, High-κ dielectric, Non-volatile memory and Semiconductor memory. His Optoelectronics research includes themes of Voltage, Capacitor, Gate dielectric and Electrode. His work in Electrical engineering addresses subjects such as Nitride, which are connected to disciplines such as Quantum tunnelling and Charge.

His biological study spans a wide range of topics, including Transistor and Silicon nitride. His Transistor research incorporates themes from Semiconductor and EEPROM. His work in Semiconductor memory covers topics such as Low voltage which are related to areas like Semiconductor device and Integrated circuit.

Between 2004 and 2009, his most popular works were:

  • An analytical retention model for SONOS nonvolatile memory devices in the excess electron state (123 citations)
  • Quantum mechanical modeling of MOSFET gate leakage for high-k gate dielectrics (38 citations)
  • A low voltage SANOS nonvolatile semiconductor memory (NVSM) device (21 citations)

In his most recent research, the most cited papers focused on:

  • Quantum mechanics
  • Semiconductor
  • Electrical engineering

His primary areas of investigation include Electrical engineering, Optoelectronics, Non-volatile memory, High-κ dielectric and Semiconductor memory. His study in Electrical engineering focuses on CMOS and Charge trap flash. His study in Optoelectronics is interdisciplinary in nature, drawing from both Organic solar cell and Photovoltaic system.

His Non-volatile memory research is multidisciplinary, incorporating perspectives in Silicon nitride and Quantum tunnelling. His Silicon nitride study incorporates themes from Tunnel effect, Electron, Gate dielectric and Nitride. As a part of the same scientific family, Marvin H. White mostly works in the field of Semiconductor memory, focusing on Low voltage and, on occasion, Transistor and Capacitor.

Best Publications

  • On the go with SONOS

    M.H. White;D.A. Adams;J. Bu

  • Characterization of surface channel CCD image arrays at low light levels

    M.H. White;D.R. Lampe;F.C. Blaha;I.A. Mack

  • Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFET's

    Hon-Sum Wong;Marvin H. White;Thomas J. Krutsick;Richard V. Booth

  • Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures

    Yang (Larr) Yang;Marvin H. White

  • Characterization of thin-oxide MNOS memory transistors

    M.H. White;J.R. Cricchi

  • Design considerations in scaled SONOS nonvolatile memory devices

    Jiankang Bu;Marvin H White

  • Theory and application of charge pumping for the characterization of Si-SiO/sub 2/ interface and near-interface oxide traps

    R.E. Paulsen;M.H. White

  • A low voltage SONOS nonvolatile semiconductor memory technology

    M.H. White;Yang Yang;Ansha Purwar;M.L. French

  • 1.1 kV 4H-SiC power UMOSFETs

    A.K. Agarwal;J.B. Casady;L.B. Rowland;W.F. Valek

  • An analytical retention model for SONOS nonvolatile memory devices in the excess electron state

    Yu Wang;Marvin H. White

  • Charge transport and storage of low programming voltage SONOS/MONOS memory devices

    Frank R. Libsch;Marvin H. White

  • Non-volatile random access memory cell constructed of silicon carbide

    Anant K. Agarwal;Richard R. Siergiej;Charles D. Brandt;Marvin H. White

  • Observation of near-interface oxide traps with the charge-pumping technique

    R.E. Paulsen;R.R. Siergiej;M.L. French;M.H. White

  • A CMOS-integrated 'ISFET-operational amplifier' chemical sensor employing differential sensing

    H.-S. Wong;M.H. White

  • Time delay and integration detectors using charge transfer devices

    David H McCann;Marvin H. White;Alfred P. Turly;Robert A. Frosch

  • Electrical characterization of ONO triple dielectric in SONOS nonvolatile memory devices

    Jiankang Bu;Marvin H White

  • A critical look at the performance advantages and limitations of 4H-SiC power UMOSFET structures

    A.K. Agarwal;R.R. Siergiej;S. Seshadri;M.H. White

  • Retention reliability enhanced SONOS NVSM with scaled programming voltage

    Jiankang Bu;M.H. White

  • Characterization of SONOS oxynitride nonvolatile semiconductor memory devices

    Stephen J. Wrazien;Yijie Zhao;Joel D. Krayer;Marvin H. White

  • CCD focal plane processor for moving target imaging

    Donald Ross Lampe;Marvin Hart White

  • Microminiature ganged threshold accelerometers compatible with integrated circuit technology

    W.D. Frobenius;S.A. Zeitman;M.H. White;D.D. O'Sullivan

Frequent Co-Authors

Anant K. Agarwal
Anant K. Agarwal The Ohio State University
Paul M. Solomon
Paul M. Solomon IBM (United States)
Eduard A. Cartier
Eduard A. Cartier IBM (United States)
Kathryn W. Guarini
Kathryn W. Guarini IBM (United States)

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