M.-A. Nicolet

M.-A. Nicolet publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where M.-A. Nicolet sits on this spectrum.

M.-A. Nicolet D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where M.-A. Nicolet sits on this spectrum.

Research.com Recognitions

• 1972 - Member of the National Academy of Sciences
• 1962 - Fellow of American Geophysical Union (AGU)

Overview

Best Publications

• Diffusion barriers in thin films

  M.-A. Nicolet

  1006
  Citations

• Formation and Characterization of Transition-Metal Silicides

  Marc-A. Nicolet;S.S. Lau

  445
  Citations

• When is thermodynamics relevant to ion-induced atomic rearrangements in metals?

  W. L. Johnson;Y. T. Cheng;M. Van Rossum;M. A. Nicolet

  438
  Citations

• Principles and applications of ion beam techniques for the analysis of solids and thin films

  W.K. Chu;J.W. Mayer;M-A. Nicolet;T.M. Buck

  420
  Citations

• Reaction of thin metal films with SiO2 substrates

  R. Pretorius;J. M. Harris;M. A. Nicolet

  413
  Citations

• Tantalum‐based diffusion barriers in Si/Cu VLSI metallizations

  E. Kolawa;J. S. Chen;J. S. Reid;P. J. Pokela

  323
  Citations

• Structural difference rule for amorphous alloy formation by ion mixing

  Bai‐Xin Liu;W. L. Johnson;M‐A. Nicolet;S. S. Lau

  280
  Citations

• Evaluation of amorphous (Mo, Ta, W)SiN diffusion barriers for 〈Si〉|Cu metallizations

  J.S. Reid;E. Kolawa;R.P. Ruiz;M.-A. Nicolet

  265
  Citations

• Influence of the nature of the Si substrate on nickel silicide formed from thin Ni films

  J.O. Olowolafe;M.-A. Nicolet;J.W. Mayer

  255
  Citations

• LOW‐TEMPERATURE MIGRATION OF SILICON IN THIN LAYERS OF GOLD AND PLATINUM

  A. Hiraki;M. A. Nicolet;J. W. Mayer

  246
  Citations

• Leitfähige Barriereschicht aus einer Legierung von Edelmetall und Isolator als Elektroden für Material mit hohen dielektrischen Konstanten

  Scott R Summerfelt;Jason Reid;Marc Nicolet;Elzbieta Kolawa

  220
  Citations

• Influence of chemical driving forces in ion mixing of metallic bilayers

  Y. T. Cheng;M. Van Rossum;M. A. Nicolet;W. L. Johnson

  204
  Citations

• Kinetics of TiSi2 formation by thin Ti films on Si

  L. S. Hung;J. Gyulai;J. W. Mayer;S. S. Lau

  194
  Citations

• An improved forward I-V method for nonideal Schottky diodes with high series resistance

  C.-D. Lien;F.C.T. So;M.-A. Nicolet

  190
  Citations

• Properties of reactively sputter-deposited TaN thin films

  Xin Sun;Elzbieta Kolawa;Jen Sue Chen;Jason S. Reid

  185
  Citations

• Amorphization of Hf-Ni films by solid-state reaction

  M. van Rossum;M. A. Nicolet;W. L. Johnson

  179
  Citations

• Low-Temperature Ion Beam Mixing in Metals

  S. J. Kim;M. A. Nicolet;Robert S Averback;Robert S Averback;D. Peak

  164
  Citations

• Reactively sputtered Ti-Si-N films I. Physical properties

  X. Sun;J. S. Reid;E. Kolawa;M.-A. Nicolet

  162
  Citations

• Compensating impurity effect on epitaxial regrowth rate of amorphized Si

  I. Suni;G. Göltz;M. G. Grimaldi;M. A. Nicolet

  159
  Citations

• Iron silicide thin film formation at low temperatures

  S.S. Lau;J.S.-Y. Feng;J.O. Olowolafe;M.-A. Nicolet

  153
  Citations

• 2 – Backscattering Spectrometry

  G. Foti;J.W. Mayer;E. Rimini;S.U. Campisano

  28
  Citations