World's Best Scientists 2026 revealed!

D-Index & Metrics

Materials Science

D-Index
44
Citations
7463
World Ranking
12048
National Ranking
2788

Terry Alford publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Terry Alford sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 346 publications — 69th percentile

69% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Terry Alford D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Terry Alford sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 44 D-Index — 7th percentile

7% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Best Publications

  • Improved conductivity and mechanism of carrier transport in zinc oxide with embedded silver layer

    H. Han;N. D. Theodore;Terry Alford

  • Experimental methods in chemical engineering: X-ray diffraction spectroscopy—XRD

    Hayat Khan;Aditya S. Yerramilli;Adrien D'Oliveira;Terry L. Alford

  • Effect of Ag thickness on electrical transport and optical properties of indium tin oxide–Ag–indium tin oxide multilayers

    A. Indluru;Terry Alford

  • Band gap shift in the indium-tin-oxide films on polyethylene napthalate after thermal annealing in air

    H. Han;J. W. Mayer;Terry Alford

  • Enhanced adhesion of copper to dielectrics via titanium and chromium additions and sacrificial reactions

    S. W. Russell;S. A. Rafalski;S. A. Rafalski;R. L. Spreitzer;R. L. Spreitzer;J. Li;J. Li

  • Metallic conductivity and the role of copper in ZnO/Cu/ZnO thin films for flexible electronics

    K. Sivaramakrishnan;Terry Alford

  • Hydroxyapatite powders and thin films prepared by a sol-gel technique

    C. M. Lopatin;Vincent Pizziconi;Terry Alford;T. Laursen

  • High quality transparent TiO2/Ag/TiO2 composite electrode films deposited on flexible substrate at room temperature by sputtering

    Aritra Dhar;Terry Alford

  • Optimization of Nb2O5/Ag/Nb2O5 multilayers as transparent composite electrode on flexible substrate with high figure of merit

    Aritra Dhar;Terry Alford

  • Characterization of the physical and electrical properties of Indium tin oxide on polyethylene napthalate

    H. Han;Daniel Adams;Daniel Adams;J. W. Mayer;Terry Alford

  • Fundamentals of Nanoscale Film Analysis

    Terry L. Alford;Leonard C. Feldman;James W. Mayer

  • Chemical and Structural Evolution of Sol-Gel-Derived Hydroxyapatite Thin Films under Rapid Thermal Processing

    Stephen W. Russell;Karen A. Luptak;Carlos Tres A. Suchicital;Terry L. Alford

  • Encapsulation of Ag films on SiO2 by Ti reactions using Ag–Ti alloy/bilayer structures and an NH3 ambient

    Terry Alford;Daniel Adams;T. Laursen;B. Manfred Ullrich

  • Agglomeration and percolation conductivity

    Karl Sieradzki;K. Bailey;Terry Alford

  • Influence of Cu diffusion conditions on the switching of Cu-SiO2-based resistive memory devices

    S.C. Puthen Thermadam;S. K. Bhagat;T. L. Alford;Y. Sakaguchi

  • Improvement of the thermal stability of silver metallization

    H. C. Kim;Terry Alford

  • Dopant activation in ion implanted silicon by microwave annealing

    Terry Alford;D. C. Thompson;J. W. Mayer;N. David Theodore

  • Reactive ion etch of patterned and blanket silver thin films in Cl2/O2 and O2 glow discharges

    Phucanh Nguyen;Yuxiao Zeng;T. L. Alford

  • Advanced silver-based metallization patterning for ULSI applications

    Terry Alford;Phucanh Nguyen;Yuxiao Zeng;J. W. Mayer

  • A methodology for rapid detection of Salmonella typhimurium using label-free electrochemical impedance spectroscopy.

    Vivek Nandakumar;Jeffrey T. La Belle;Justin Reed;Miti Shah

  • Thermal and photodiffusion of Ag in S-rich Ge-S amorphous films

    M. Mitkova;Michael Kozicki;H. C. Kim;Terry Alford

Frequent Co-Authors

James W. Mayer
James W. Mayer Arizona State University
S. S. Lau
S. S. Lau University of California, San Diego
Michael N. Kozicki
Michael N. Kozicki Arizona State University
Michael Nastasi
Michael Nastasi Texas A&M University
Lokesh Joshi
Lokesh Joshi University of Galway
Paul K. Chu
Paul K. Chu City University of Hong Kong
Hugh J. Barnaby
Hugh J. Barnaby Arizona State University
David J. Smith
David J. Smith Arizona State University
Jose Menendez
Jose Menendez Arizona State University
Thomas F. Kuech
Thomas F. Kuech University of Wisconsin–Madison

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